دورية أكاديمية

Emerging MoS2 Wafer-Scale Technique for Integrated Circuits

التفاصيل البيبلوغرافية
العنوان: Emerging MoS2 Wafer-Scale Technique for Integrated Circuits
المؤلفون: Zimeng Ye, Chao Tan, Xiaolei Huang, Yi Ouyang, Lei Yang, Zegao Wang, Mingdong Dong
المصدر: Nano-Micro Letters, Vol 15, Iss 1, Pp 1-42 (2023)
بيانات النشر: SpringerOpen, 2023.
سنة النشر: 2023
المجموعة: LCC:Technology
مصطلحات موضوعية: Wafer-scale growth, Molybdenum disulfide, Gas deposition, Integrated circuits, Technology
الوصف: Highlights This review summarized the state of the art of MoS2 from their controllable growth and potential application in integrated circuit. The influence of promoter, substrate, pressure, catalyst and precursor on the nucleation and growth are discussed. The current challenges and future perspectives of wafer-scale MoS2 are outlined from the materials and device applications.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2311-6706
2150-5551
العلاقة: https://doaj.org/toc/2311-6706Test; https://doaj.org/toc/2150-5551Test
DOI: 10.1007/s40820-022-01010-4
الوصول الحر: https://doaj.org/article/738a6c6b3b0f4c8e979230da2496e996Test
رقم الانضمام: edsdoj.738a6c6b3b0f4c8e979230da2496e996
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:23116706
21505551
DOI:10.1007/s40820-022-01010-4