دورية أكاديمية
Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy
| العنوان: | Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy |
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| المؤلفون: | Zhaomin Peng, Dehai Zhang, Shuqi Ge, Jin Meng |
| المصدر: | Applied Sciences, Vol 13, Iss 6, p 3400 (2023) |
| بيانات النشر: | MDPI AG |
| سنة النشر: | 2023 |
| المجموعة: | Directory of Open Access Journals: DOAJ Articles |
| مصطلحات موضوعية: | terahertz technology, scattering-scanning near-field optical microscopy, finite element model, near-field interactions, edge effect, antenna effect, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999 |
| الوصف: | Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical issues has become a popular topic in THz s-SNOM research. In this study, a finite element model (FEM) is proposed to quantify the near-field interactions, and to investigate the edge effect and antenna effect in THz s-SNOM. Our results indicate that the proposed model can give us a better understanding of the near-field interactions and direct the parameter design of the probe for THz s-SNOM. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| تدمد: | 2076-3417 |
| العلاقة: | https://www.mdpi.com/2076-3417/13/6/3400Test; https://doaj.org/toc/2076-3417Test; https://doaj.org/article/c404d587ba334847ac002f8381e1bd3aTest |
| DOI: | 10.3390/app13063400 |
| الإتاحة: | https://doi.org/10.3390/app13063400Test https://doaj.org/article/c404d587ba334847ac002f8381e1bd3aTest |
| رقم الانضمام: | edsbas.B809D296 |
| قاعدة البيانات: | BASE |
Full Text Finder | تدمد: | 20763417 |
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| DOI: | 10.3390/app13063400 |