التفاصيل البيبلوغرافية
العنوان: |
Examination of evidence for resonances at high excitation energy in the 7 α disassembly of Si 28 |
المؤلفون: |
Cao, X. G., Kim, E. J., Schmidt, K., Hagel, K., Barbui, M., Gauthier, J., Wuenschel, S., Giuliani, G., Rodriguez, M. R. D., Kowalski, S., Zheng, H., Huang, M., Bonasera, A., Wada, R., Blando, N., Zhang, G. Q., Wong, C. Y., Staszczak, A., Ren, Z. X., Wang, Y. K., Zhang, S. Q., Meng, J., Natowitz, J. B. |
المساهمون: |
U.S. Department of Energy, Oak Ridge National Laboratory, Welch Foundation, Chinese Academy of Sciences, National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences, Office of Science |
المصدر: |
Physical Review C ; volume 99, issue 1 ; ISSN 2469-9985 2469-9993 |
بيانات النشر: |
American Physical Society (APS) |
سنة النشر: |
2019 |
نوع الوثيقة: |
article in journal/newspaper |
اللغة: |
English |
DOI: |
10.1103/physrevc.99.014606 |
DOI: |
10.1103/PhysRevC.99.014606 |
DOI: |
10.1103/PhysRevC.99.014606/fulltext |
الإتاحة: |
https://doi.org/10.1103/physrevc.99.014606Test |
حقوق: |
https://link.aps.org/licenses/aps-default-licenseTest ; https://link.aps.org/licenses/aps-default-accepted-manuscript-licenseTest |
رقم الانضمام: |
edsbas.9E576063 |
قاعدة البيانات: |
BASE |