مؤتمر
Tests of Single Photon Counting at Sub-Nanosecond Precision for Next Generation RICH Detectors
| العنوان: | Tests of Single Photon Counting at Sub-Nanosecond Precision for Next Generation RICH Detectors |
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| المؤلفون: | Calvi, M, Carniti, P, Cassina, L, Gotti, C, Matteuzzi, C, Pessina, G |
| المساهمون: | Calvi, M, Carniti, P, Cassina, L, Gotti, C, Matteuzzi, C, Pessina, G |
| بيانات النشر: | Institute of Electrical and Electronics Engineers Inc. |
| سنة النشر: | 2018 |
| المجموعة: | Università degli Studi di Milano-Bicocca: BOA (Bicocca Open Archive) |
| مصطلحات موضوعية: | Photonic, RICH detector, Silicon photomultiplier, High luminosity |
| الوصف: | The paper presents the characterization of a Hamamatsu S13360-1350CS silicon photomultiplier (50 μm cell pitch, 1.3 × 1.3 mm 2 total area) in single photon counting regime, in view of possible applications in next generation ring imaging Cherenkov detectors. Dark count rate and time resolution were measured as a function of bias voltage and temperature. Crosstalk, afterpulse and photon detection efficiency were characterized. The device, cooled below -10°C and operated at a moderate 2 V overvoltage, offers excellent single photon counting performance with a time resolution of about 130 ps RMS |
| نوع الوثيقة: | conference object |
| اللغة: | English |
| العلاقة: | info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-2282-7; info:eu-repo/semantics/altIdentifier/wos/WOS:000455836200168; ispartofbook:2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings; 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 OCT 21-28; firstpage:1; lastpage:3; numberofpages:3; serie:IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD; http://hdl.handle.net/10281/242884Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85058462968; http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8508871Test |
| DOI: | 10.1109/NSSMIC.2017.8532759 |
| الإتاحة: | https://doi.org/10.1109/NSSMIC.2017.8532759Test http://hdl.handle.net/10281/242884Test http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8508871Test |
| رقم الانضمام: | edsbas.9B3C4216 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/NSSMIC.2017.8532759 |
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