التفاصيل البيبلوغرافية
| العنوان: |
Temperature and stoichiometry effect on microstructural and ferroelectric properties of Pb(Zr1-xTix)O3 thin films prepared by chemical soulution deposition |
| المؤلفون: |
Foschini, C. R., Li, J. F., Suchicital, C. T A, Viehland, D., Stojanovic, B. D., Varela, José Arana |
| المساهمون: |
Universidade Estadual Paulista (UNESP) |
| سنة النشر: |
2004 |
| المجموعة: |
Universidade Estadual Paulista São Paulo: Repositório Institucional UNESP |
| مصطلحات موضوعية: |
Amplitude modulation, Annealing, Atomic force microscopy, Characterization, Composition, Ferroelectricity, Lead compounds, Microstructure, Organic solvents, Polyethylene glycols, Silica, Stoichiometry, Annealing temperatures, Dense microstructures, Electromechanical response, Thin films |
| الوصف: |
Lead zirconate titanate (PZT) solutions were prepared using a polymeric precursor method, Zr n-propoxide and Ti i-propoxide were used as starting materials with ethylene glycol and water as solvents. The PZT solution was spin-coated on Pt/Ti/SiO2/Si substrates, baked on a hot plate, and finally heat-treated in a tube furnace between 400 and 800°C. The surface morphology and grain size of the films were characterized by atomic force microscopy (AFM), using a tapping mode with amplitude modulation. The films, thermal annealed at temperatures higher than 500°C, exhibited a dense microstructure, without noticeable cracks or voids. Electrical properties were investigated as a function of composition and annealing temperature. |
| نوع الوثيقة: |
conference object |
| وصف الملف: |
245-251 |
| اللغة: |
English |
| العلاقة: |
Ceramic Transactions; Ceramic Transactions, v. 150, p. 245-251.; http://hdl.handle.net/11449/67737Test; 2-s2.0-2142816540; 1922357184842767; orcid:0000-0003-1300-4978 |
| الإتاحة: |
http://hdl.handle.net/11449/67737Test |
| حقوق: |
openAccess |
| رقم الانضمام: |
edsbas.8FAB9729 |
| قاعدة البيانات: |
BASE |
