مؤتمر
Radiation Hardness Qualification of the Amplifier/Discriminator ASICs Production for the Upgrade of the LHCb RICH Detector Front-end Electronics
| العنوان: | Radiation Hardness Qualification of the Amplifier/Discriminator ASICs Production for the Upgrade of the LHCb RICH Detector Front-end Electronics |
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| المؤلفون: | ANDREOTTI, MASSIMO, Baszczyk, M, Bolognesi, M, Calabrese, R, Carniti, P, Cassina, L, Ramusino, AC, Dorosz, P, Fiorini, M, Giachero, A, Gotti, C, Kucewicz, W, Luppi, E, Maino, M, Malaguti, R, Minzoni, L, Neri, I, Pappalardo, LL, Pessina, G, Tomassetti, L |
| المساهمون: | Andreotti, M, Baszczyk, M, Bolognesi, M, Calabrese, R, Carniti, P, Cassina, L, Ramusino, A, Dorosz, P, Fiorini, M, Giachero, A, Gotti, C, Kucewicz, W, Luppi, E, Maino, M, Malaguti, R, Minzoni, L, Neri, I, Pappalardo, L, Pessina, G, Tomassetti, L |
| بيانات النشر: | Institute of Electrical and Electronics Engineers Inc. |
| سنة النشر: | 2018 |
| المجموعة: | Università degli Studi di Milano-Bicocca: BOA (Bicocca Open Archive) |
| مصطلحات موضوعية: | ASIC, SIngle photon detection, Radiation hardne, RICH detector |
| الوصف: | Thirty-three-thousand CLARO8 ASICs were produced in 0.35μm CMOS technology and will be installed in the upgraded LHCb detector at CERN. Radiation hardness has been extensively characterized and compared to prototype production. |
| نوع الوثيقة: | conference object |
| اللغة: | English |
| العلاقة: | info:eu-repo/semantics/altIdentifier/isbn/978-153868263-0; info:eu-repo/semantics/altIdentifier/wos/WOS:000784360000018; ispartofbook:2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018; 2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018 - 16 July 2018 through 20 July 2018; firstpage:105; lastpage:108; numberofpages:4; http://hdl.handle.net/10281/242890Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85060914217; http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8581398Test |
| DOI: | 10.1109/NSREC.2018.8584280 |
| الإتاحة: | https://doi.org/10.1109/NSREC.2018.8584280Test http://hdl.handle.net/10281/242890Test http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8581398Test |
| رقم الانضمام: | edsbas.854AB74E |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/NSREC.2018.8584280 |
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