دورية أكاديمية

Emittance measurements of the Sub-Picosecond Accelerator electron beam using beam position monitors

التفاصيل البيبلوغرافية
العنوان: Emittance measurements of the Sub-Picosecond Accelerator electron beam using beam position monitors
المؤلفون: Russell, Steven J.
المصدر: Review of Scientific Instruments ; volume 70, issue 2, page 1362-1366 ; ISSN 0034-6748 1089-7623
بيانات النشر: AIP Publishing
سنة النشر: 1999
مصطلحات موضوعية: Instrumentation
الوصف: In general, the spatial distributions of electron beams from photoinjectors are unknown and are not well approximated by a Gaussian. Therefore, when measuring the emittance, it is important to make no assumptions about the beam’s spatial distribution. A diagnostic that fulfills this requirement uses beam position monitors to measure the second moment of the electron beam’s image charge. This information, coupled with the beam line’s transfer matrix, can be used as an unambiguous measure of the root mean square emittance that is independent of the beam’s spatial distribution. Presented here are the results of the first implementation of this measurement technique on the Sub-Picosecond Accelerator facility at Los Alamos National Laboratory.
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1063/1.1149598
الإتاحة: https://doi.org/10.1063/1.1149598Test
https://pubs.aip.org/aip/rsi/article-pdf/70/2/1362/19237754/1362_1_online.pdfTest
رقم الانضمام: edsbas.7D32DB7
قاعدة البيانات: BASE