دورية أكاديمية
Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
| العنوان: | Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography |
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| المؤلفون: | Wierzchowski, W., Wieteska, K., Klinger, D., Sobierajski, R., Pelka, J.B., Żymierska, D., Balcer, T., Chalupský, J., Gaudin, J., Hájková, V., Burian, T., Gleeson, A.J., Juha, L., Sinn, H., Sobota, D., Tiedtke, K., Toleikis, S., Tschentscher, T., Vyšín, L., Wabnitz, H., Paulmann, C. |
| المصدر: | Radiation Physics and Chemistry ; volume 93, page 99-103 ; ISSN 0969-806X |
| بيانات النشر: | Elsevier BV |
| سنة النشر: | 2013 |
| المجموعة: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| مصطلحات موضوعية: | Radiation |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1016/j.radphyschem.2013.04.025 |
| الإتاحة: | https://doi.org/10.1016/j.radphyschem.2013.04.025Test https://api.elsevier.com/content/article/PII:S0969806X13002508?httpAccept=text/xmlTest https://api.elsevier.com/content/article/PII:S0969806X13002508?httpAccept=text/plainTest |
| رقم الانضمام: | edsbas.6ED2D3B6 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1016/j.radphyschem.2013.04.025 |
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