مؤتمر
65 nm Technology for HEP: Status and Perspective
| العنوان: | 65 nm Technology for HEP: Status and Perspective |
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| المؤلفون: | Mattiazzo, S., Gaioni, L., Manghisoni, M., Re, V., Traversi, G. |
| المساهمون: | Barbero, M. B., Fougeron, D., Gensolen, F., Godiot, S., Mmenouni, M., Pangaud, P., Rozanov, A., Wang, A., Bomben, M., Calderini, G., Crescioli, F., Genat, J-F., Le Dortz, O., Marchiori, G., Dzahini, D., Rarbi, F. E., Gaglione, R., Gonella, L., Themperek, T., Huegging, F., Karagounis, M., Kishishita, T., Krueger, H., Rymaszewski, P., Wermes, N., Ciciriello, F., Corsi, F., Licciulli, F., Marzocca, C., De Robertis, G., Loddo, F., Tamma, C., Andreazza, A., Liberali, V., Shojaii, S., Stabile, A., Bagatin, M., Bisello, D., Mattiazzo, Serena, Ding, L., Gerardin, S., Giubilato, P., Neviani, A., Paccagnella, A., Vogrig, D., Wyss, N., Bacchetta, N., De Canio, F., Gaioni, Luigi, Nodari, B., Manghisoni, Massimo, Re, Valerio, Traversi, Gianluca, Comotti, D., Ratti, L., Vacchi, C., Beccherle, R., Bellazini, R., Magazzu, G., Minuti, M., Morsani, F., Palla, F., Fanucci, L., Rizzi, A., Saponara, S., Androsov, K., Bilei, G. M., Menichelli, M., Conti, E., Marconi, S., Passeri, D., Placidi, P., Della Casa, G., Demaria, N., Mazza, G., Rivetti, A., Da Rocha Rolo, M. D., Monteil, E., Pacher, L., Gajanana, D., Gromov, V., Hessey, N., Kluit, R., Zivkovic, V., Havranek, M., Janoska, Z., Marcisovsky, M., Neue, G., Tomasek, L., Kafka, V., Sicho, P., Vrba, V., Vila, I., Aguirre, M. A., Muñoz, P., Palomo, F. R., Abbaneo, D., Christiansen, J., Dannheim, D., Dobos, D. |
| بيانات النشر: | Scuola Internazionale Superiore di Studi Avanzati IT Trieste |
| سنة النشر: | 2015 |
| المجموعة: | Aisberg - Archivio istituzionale dell'Università di Bergamo |
| مصطلحات موضوعية: | Settore ING-INF/01 - Elettronica |
| الوصف: | The development of new experiments such as CLIC and the the foreseen Phase 2 pixel upgrades of ATLAS and CMS have very challenging requirements for the design of hybrid pixel readout chips, both in terms of performances and reliability. To face these challenges, the use of a more downscaled CMOS technology compared to previous projects is necessary. The CERN RD53 collaboration is undertaking a R&D programme to evaluate the use of a commercial 65 nm technology and to develop tools and frameworks which will help to design future pixel detectors. This paper gives a short overview of the RD53 collaboration activities and describes some examples of recent developments. |
| نوع الوثيقة: | conference object |
| وصف الملف: | remote |
| اللغة: | English |
| العلاقة: | ispartofbook:Vertex2014 - The 23rd International Workshop on Vertex Detectors, 15-19 September 2014, Macha Lake, The Czech Republic; Vertex2014 - The 23rd International Workshop on Vertex Detectors, Macha Lake, Czech Republic, 15-19 September 2014; volume:227; firstpage:1; lastpage:10; journal:POS PROCEEDINGS OF SCIENCE; http://hdl.handle.net/10446/84100Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84999274214 |
| DOI: | 10.22323/1.227.0043 |
| الإتاحة: | https://doi.org/10.22323/1.227.0043Test http://hdl.handle.net/10446/84100Test |
| حقوق: | info:eu-repo/semantics/openAccess |
| رقم الانضمام: | edsbas.69AE52CA |
| قاعدة البيانات: | BASE |
| DOI: | 10.22323/1.227.0043 |
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