دورية أكاديمية
Scanning tunneling microscope-based thermochemical hole burning on a series of charge transfer complexes
| العنوان: | Scanning tunneling microscope-based thermochemical hole burning on a series of charge transfer complexes |
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| المؤلفون: | Yu, XC, Peng, HL, Ran, CB, Sun, L, Zhang, R, Liu, ZF |
| المساهمون: | Yu, XC (reprint author), Peking Univ, Coll Chem & Mol Engn, CNST, Beijing 100871, Peoples R China., Peking Univ, Coll Chem & Mol Engn, CNST, Beijing 100871, Peoples R China. |
| المصدر: | SCI ; EI |
| بيانات النشر: | 应用物理学快报 |
| سنة النشر: | 2005 |
| المجموعة: | Peking University Institutional Repository (PKU IR) / 北京大学机构知识库 |
| مصطلحات موضوعية: | METAL-INSULATOR-TRANSITION, DENSITY DATA-STORAGE, SINGLE-MOLECULE, DESORPTION, TCNQ, TIP |
| الوصف: | A thermochemical hole burning effect was observed on a series of 7, 7, 8, 8-tetracyanoquinodimethane charge transfer complexes when applying a suitable voltage pulse using scanning tunneling microscope, which is attributed to the localized thermochemical decomposition of the complex induced by the current heating effect. The decomposition reaction evolves the low boiling point decomposition components of the charge transfer complex, leaving a nanometer-sized hole on the crystal surface. This effect demonstrates the possibility of creating a ultrahigh density thermochemical hole burning memory, in which information bit is recorded as a hole. (C) 2005 American Institute of Physics. ; Physics, Applied ; SCI(E) ; EI ; 27 ; ARTICLE ; 13 ; 1-3 ; 86 |
| نوع الوثيقة: | journal/newspaper |
| اللغة: | English |
| تدمد: | 0003-6951 |
| العلاقة: | APPLIED PHYSICS LETTERS.2005,86,(13).; 993503; http://hdl.handle.net/20.500.11897/253998Test; WOS:000232060200019 |
| DOI: | 10.1063/1.1883315 |
| الإتاحة: | https://doi.org/20.500.11897/253998Test https://doi.org/10.1063/1.1883315Test https://hdl.handle.net/20.500.11897/253998Test |
| رقم الانضمام: | edsbas.30B58B9C |
| قاعدة البيانات: | BASE |
| تدمد: | 00036951 |
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| DOI: | 10.1063/1.1883315 |