التفاصيل البيبلوغرافية
العنوان: |
High-Throughput Electrical Characterization of Nanomaterials from Room to Cryogenic Temperatures |
المؤلفون: |
Smith, Luke W., Batey, Jack O., Alexander-Webber, Jack A., Fan, Ye, Hsieh, Yu-Chiang, Fung, Shin-Jr, Jevtics, Dimitars, Robertson, Joshua, Guilhabert, Benoit J. E., Strain, Michael J., Dawson, Martin D., Hurtado, Antonio, Griffiths, Jonathan P., Beere, Harvey E., Jagadish, Chennupati, Burton, Oliver J., Hofmann, Stephan, Chen, Tse-Ming, Ritchie, David A., Kelly, Michael, Joyce, Hannah J., Smith, Charles G. |
المساهمون: |
Research Councils UK, Royal Society, European Commission, Department of Education and Training, Australian National Fabrication Facility, Royal Commission for the Exhibition of 1851, Ministry of Science and Technology, Taiwan |
المصدر: |
ACS Nano ; volume 14, issue 11, page 15293-15305 ; ISSN 1936-0851 1936-086X |
بيانات النشر: |
American Chemical Society (ACS) |
سنة النشر: |
2020 |
نوع الوثيقة: |
article in journal/newspaper |
اللغة: |
English |
DOI: |
10.1021/acsnano.0c05622 |
الإتاحة: |
https://doi.org/10.1021/acsnano.0c05622Test |
حقوق: |
http://pubs.acs.org/page/policy/authorchoice_ccby_termsofuse.htmlTest |
رقم الانضمام: |
edsbas.27A3F6BA |
قاعدة البيانات: |
BASE |