التفاصيل البيبلوغرافية
العنوان: |
Digital pixel test structures implemented in a 65 nm CMOS process |
المؤلفون: |
Aglieri Rinella, Gianluca, Andronic, Anton, Antonelli, Matias, Aresti, Mauro, Baccomi, Roberto, Becht, Pascal, Beole, Stefania, Braach, Justus, Buckland, Matthew Daniel, Buschmann, Eric, Camerini, Paolo, Carnesecchi, Francesca, Cecconi, Leonardo, Charbon, Edoardo, Contin, Giacomo, Dannheim, Dominik, de Melo, Joao, Deng, Wenjing, di Mauro, Antonello, Hasenbichler, Jan, Hillemanns, Hartmut, Hong, Geun Hee, Isakov, Artem, Junique, Antoine, Kluge, Alex, Kotliarov, Artem, Křížek, Filip, Lautner, Lukas, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Masciocchi, Silvia, Menzel, Marius Wilm, Munker, Magdalena, Piro, Francesco, Rachevski, Alexandre, Rebane, Karoliina, Reidt, Felix, Russo, Roberto, Sanna, Isabella, Sarritzu, Valerio, Senyukov, Serhiy, Snoeys, Walter, Sonneveld, Jory, Šuljić, Miljenko, Svihra, Peter, Tiltmann, Nicolas, Usai, Gianluca, Van Beelen, Jacob Bastiaan, Vassilev, Mirella Dimitrova |
المصدر: |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 1056, page 168589 ; ISSN 0168-9002 |
بيانات النشر: |
Elsevier BV |
سنة النشر: |
2023 |
المجموعة: |
ScienceDirect (Elsevier - Open Access Articles via Crossref) |
نوع الوثيقة: |
article in journal/newspaper |
اللغة: |
English |
DOI: |
10.1016/j.nima.2023.168589 |
الإتاحة: |
https://doi.org/10.1016/j.nima.2023.168589Test https://api.elsevier.com/content/article/PII:S016890022300579X?httpAccept=text/xmlTest https://api.elsevier.com/content/article/PII:S016890022300579X?httpAccept=text/plainTest |
حقوق: |
https://www.elsevier.com/tdm/userlicense/1.0Test/ ; http://creativecommons.org/licenses/by/4.0Test/ |
رقم الانضمام: |
edsbas.19DACC9B |
قاعدة البيانات: |
BASE |