دورية أكاديمية

Digital pixel test structures implemented in a 65 nm CMOS process

التفاصيل البيبلوغرافية
العنوان: Digital pixel test structures implemented in a 65 nm CMOS process
المؤلفون: Aglieri Rinella, Gianluca, Andronic, Anton, Antonelli, Matias, Aresti, Mauro, Baccomi, Roberto, Becht, Pascal, Beole, Stefania, Braach, Justus, Buckland, Matthew Daniel, Buschmann, Eric, Camerini, Paolo, Carnesecchi, Francesca, Cecconi, Leonardo, Charbon, Edoardo, Contin, Giacomo, Dannheim, Dominik, de Melo, Joao, Deng, Wenjing, di Mauro, Antonello, Hasenbichler, Jan, Hillemanns, Hartmut, Hong, Geun Hee, Isakov, Artem, Junique, Antoine, Kluge, Alex, Kotliarov, Artem, Křížek, Filip, Lautner, Lukas, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Masciocchi, Silvia, Menzel, Marius Wilm, Munker, Magdalena, Piro, Francesco, Rachevski, Alexandre, Rebane, Karoliina, Reidt, Felix, Russo, Roberto, Sanna, Isabella, Sarritzu, Valerio, Senyukov, Serhiy, Snoeys, Walter, Sonneveld, Jory, Šuljić, Miljenko, Svihra, Peter, Tiltmann, Nicolas, Usai, Gianluca, Van Beelen, Jacob Bastiaan, Vassilev, Mirella Dimitrova
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 1056, page 168589 ; ISSN 0168-9002
بيانات النشر: Elsevier BV
سنة النشر: 2023
المجموعة: ScienceDirect (Elsevier - Open Access Articles via Crossref)
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1016/j.nima.2023.168589
الإتاحة: https://doi.org/10.1016/j.nima.2023.168589Test
https://api.elsevier.com/content/article/PII:S016890022300579X?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S016890022300579X?httpAccept=text/plainTest
حقوق: https://www.elsevier.com/tdm/userlicense/1.0Test/ ; http://creativecommons.org/licenses/by/4.0Test/
رقم الانضمام: edsbas.19DACC9B
قاعدة البيانات: BASE