دورية أكاديمية

Competition between V2O3 phases deposited by one-step reactive sputtering process on polycrystalline conducting electrode

التفاصيل البيبلوغرافية
العنوان: Competition between V2O3 phases deposited by one-step reactive sputtering process on polycrystalline conducting electrode
المؤلفون: Rupp, J.A.J., Janod, E., Besland, M.-P., Corraze, B., Kindsmüller, A., Querre, M., Tranchant, J., Cario, L., Dittmann, R., Waser, R., Wouters, D.J.
المساهمون: Rheinisch-Westfälische Technische Hochschule Aachen (RWTH), JARA-FIT, Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), Res Ctr Julich GmbH
المصدر: ISSN: 0040-6090 ; Thin Solid Films ; https://hal.archives-ouvertes.fr/hal-02793716Test ; Thin Solid Films, Elsevier, 2020, 705, pp.138063. ⟨10.1016/j.tsf.2020.138063⟩.
بيانات النشر: HAL CCSD
Elsevier
سنة النشر: 2020
المجموعة: Archive ouverte HAL (Hyper Article en Ligne, CCSD - Centre pour la Communication Scientifique Directe)
مصطلحات موضوعية: Vanadium Oxide, Vanadium Sesquioxide, V 2 O 3, Reactive Sputtering, Bixbyite, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
الوصف: International audience ; This comprehensive work investigates a technologically appealing synthesis of V 2 O 3 oxide thin films for electronic applications by the use of direct reactive sputtering with a heavily diluted gas mixture on a conducting platinum electrode. Morphological characterization was performed by Scanning Electron Microscopy, Atomic Force Microscopy , X-Ray Diffraction and X-Ray Reflectometry. Vanadium valence states were investigated by X-Ray Photoelectron Spectroscopy and crystalline phases were checked by X-Ray Grazing Incidence measurements. Low temperature electrical transport characteristics were determined by 2-point probe measurements. Only amorphous V 2 O 3 was found to exist in a mixed-valence phase in the 2 investigated parameter range. Deposition temperatures between 400 °C and 550 °C enable formation of mixtures between crystallographic phases of corundum-and bixbyite-type V 2 O polymorphs. Depending on temperature and sputtering power, morphology and stoichiometry can be tuned to generate four distinct type of electrical transport characteristics. Most promising electrical properties of corundum V 2 O 3 with a resistance ratio of up to four orders of magnitude (during the low temperature insulator-to-metal transition) have been obtained for a moderate sputtering power of 50 W (on a 1" target) at a deposition temperature of 600 °C. Reactive sputtering thus enables direct control of structural and electrical parameters for polycrystalline V 2 O 3 thin film phases on a conducting substrate.
نوع الوثيقة: article in journal/newspaper
اللغة: English
العلاقة: hal-02793716; https://hal.archives-ouvertes.fr/hal-02793716Test; https://hal.archives-ouvertes.fr/hal-02793716/documentTest; https://hal.archives-ouvertes.fr/hal-02793716/file/BESLAND-Thin%20Solid%20Films_2020_705_138063.pdfTest
DOI: 10.1016/j.tsf.2020.138063
الإتاحة: https://doi.org/10.1016/j.tsf.2020.138063Test
https://hal.archives-ouvertes.fr/hal-02793716Test
https://hal.archives-ouvertes.fr/hal-02793716/documentTest
https://hal.archives-ouvertes.fr/hal-02793716/file/BESLAND-Thin%20Solid%20Films_2020_705_138063.pdfTest
حقوق: info:eu-repo/semantics/OpenAccess
رقم الانضمام: edsbas.1402D2F4
قاعدة البيانات: BASE