دورية أكاديمية

Transient ablation topography of a thin chromium film after ultrashort pulsed laser irradiation in the spallation and phase explosion regime

التفاصيل البيبلوغرافية
العنوان: Transient ablation topography of a thin chromium film after ultrashort pulsed laser irradiation in the spallation and phase explosion regime
المؤلفون: Pflug, T., Cejpek, P., Olbrich, M., Wüstefeld, C., Ernstberger, M., Motylenko, M., Rafaja, D., Horn, A.
المساهمون: Deutsche Forschungsgemeinschaft
المصدر: Optics & Laser Technology ; volume 172, page 110540 ; ISSN 0030-3992
بيانات النشر: Elsevier BV
سنة النشر: 2024
المجموعة: ScienceDirect (Elsevier - Open Access Articles via Crossref)
مصطلحات موضوعية: Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1016/j.optlastec.2023.110540
الإتاحة: https://doi.org/10.1016/j.optlastec.2023.110540Test
https://api.elsevier.com/content/article/PII:S0030399223014330?httpAccept=text/xmlTest
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حقوق: https://www.elsevier.com/tdm/userlicense/1.0Test/ ; https://doi.org/10.15223/policy-017Test ; https://doi.org/10.15223/policy-037Test ; https://doi.org/10.15223/policy-012Test ; https://doi.org/10.15223/policy-029Test ; https://doi.org/10.15223/policy-004Test
رقم الانضمام: edsbas.12BB4F26
قاعدة البيانات: BASE