A set of thin film Mn$_x$Si$_{1-x}$ alloy samples with different manganese concentration x = 0.44 - 0.63 grown by the pulsed laser deposition (PLD) method onto the Al$_2$O$_3$(0001) substrate was investigated in the temperature range 4 - 300 K using ferromagnetic resonance (FMR) measurements in the wide range of frequencies (f = 7 - 60 GHz) and magnetic fields (H = 0 - 30 kOe). For samples with x = 0.52 - 0.55, FMR data show clear evidence of ferromagnetism with high Curie temperatures T$_\text{C}$ ~ 300 K. These samples demonstrate complex and unusual character of magnetic anisotropy described in the frame of phenomenological model as a combination of the essential second order easy plane anisotropy contribution and the additional forth order uniaxial anisotropy contribution with easy direction normal to the film plane. We explain the obtained results by a polycrystalline (mosaic) structure of the films caused by the film-substrate lattice mismatch. The existence of extra strains at the crystallite boundaries leads to an essential inhomogeneous magnetic anisotropy in the film plane.
