Design and Analysis of Accelerated Tests for Mission-Critical Reliability

التفاصيل البيبلوغرافية
العنوان: Design and Analysis of Accelerated Tests for Mission-Critical Reliability
المؤلفون: Yu Ding
المصدر: Technometrics. 47:240-240
بيانات النشر: Informa UK Limited, 2005.
سنة النشر: 2005
مصطلحات موضوعية: Statistics and Probability, Computer science, Applied Mathematics, Modeling and Simulation, Mission critical, Reliability (statistics), Reliability engineering
الوصف: (2005). Design and Analysis of Accelerated Tests for Mission-Critical Reliability. Technometrics: Vol. 47, No. 2, pp. 240-240.
تدمد: 1537-2723
0040-1706
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::016b337edf5de6f94b02878dc2699bc6Test
https://doi.org/10.1198/tech.2005.s268Test
رقم الانضمام: edsair.doi...........016b337edf5de6f94b02878dc2699bc6
قاعدة البيانات: OpenAIRE