Design and Analysis of Accelerated Tests for Mission-Critical Reliability
العنوان: | Design and Analysis of Accelerated Tests for Mission-Critical Reliability |
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المؤلفون: | Yu Ding |
المصدر: | Technometrics. 47:240-240 |
بيانات النشر: | Informa UK Limited, 2005. |
سنة النشر: | 2005 |
مصطلحات موضوعية: | Statistics and Probability, Computer science, Applied Mathematics, Modeling and Simulation, Mission critical, Reliability (statistics), Reliability engineering |
الوصف: | (2005). Design and Analysis of Accelerated Tests for Mission-Critical Reliability. Technometrics: Vol. 47, No. 2, pp. 240-240. |
تدمد: | 1537-2723 0040-1706 |
الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_________::016b337edf5de6f94b02878dc2699bc6Test https://doi.org/10.1198/tech.2005.s268Test |
رقم الانضمام: | edsair.doi...........016b337edf5de6f94b02878dc2699bc6 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 15372723 00401706 |
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