دورية أكاديمية
Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT.
العنوان: | Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT. |
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المؤلفون: | Agrawal, Khushabu S., Patil, Vilas S., Eun-Chel Cho, Junsin Yiz |
المصدر: | ECS Journal of Solid State Science & Technology; 2020, Vol. 9 Issue 10, p1-7, 7p |
قاعدة البيانات: | Complementary Index |
تدمد: | 21628769 |
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DOI: | 10.1149/2162-8777/abc6f0 |