التفاصيل البيبلوغرافية
| العنوان: |
Structural, vibrational, and dielectric properties of a Ba0.5Sr0.5TiO3 thin film: Temperature and electric field dependence from Raman spectroscopy, x-ray diffraction, and microwave measurements. |
| المؤلفون: |
Bouyanfif, H.1, Suherman, P. M.1, Jackson, T. J.1, El Marssi, M.2, Hriljac, J.3 |
| المصدر: |
Journal of Applied Physics. Jun2008, Vol. 103 Issue 11, p114101. 7p. 7 Graphs. |
| مصطلحات موضوعية: |
*BARIUM compounds, *THIN films, *RAMAN spectroscopy, *LOW temperatures, *HIGH temperatures, *PROPERTIES of matter |
| مستخلص: |
We present a Raman spectroscopy study of the phase transition occurring in a Ba0.5Sr0.5TiO3 thin film deposited by ablation laser on a MgO substrate. This Raman investigation is compared to x-ray diffraction studies of the temperature dependence of the structure and of the dielectric properties at microwave frequencies. These different probes evidence a diffuse phase transition in the range of 243–283 K from the low temperature ferroelectric-tetragonal phase to the high temperature paraelectric cubic phase. Stabilization of the tetragonal phase in the thin film down to 83 K was observed instead of the expected transition to an orthorhombic phase below 190 K. This stabilization may be attributed to the tensile stress induced by the substrate. A careful analysis of the frequency dependence of the dielectric response suggested that the observed tunability and dielectric loss were determined by extrinsic effects such as charged defects and/or depletion layers. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
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