دورية أكاديمية
Ocean Optics, Inc. Introduces a Spectroscopic Ellipsometer for Thin Film Measurement.
| العنوان: | Ocean Optics, Inc. Introduces a Spectroscopic Ellipsometer for Thin Film Measurement. |
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| المصدر: | Journal of Chemical Education. Mar2007, Vol. 83 Issue 3, p422-422. 1/2p. 1 Black and White Photograph. |
| مصطلحات موضوعية: | *SCIENTIFIC apparatus & instruments |
| الشركة/الكيان: | OCEAN Optics Inc. 603010513 |
| مستخلص: | The article evaluates the spectroscopic ellipsometer for thin measurement developed by Ocean Optics Inc. |
| قاعدة البيانات: | Academic Search Index |
| تدمد: | 00219584 |
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