المؤلفون: Motta, Alessia, Seguini, Gabriele, Wiemer, Claudia, Perego, Michele

المصدر: ACS Appl Mater Interfaces ; ISSN:1944-8252

مصطلحات موضوعية: Al2O3, PMMA, TMA, mass uptake, sequential infiltration synthesis (SIS), spectroscopic ellipsometry (SE), vapor phase infiltration (VPI)

العلاقة: https://doi.org/10.1021/acsami.4c06887Test; https://pubmed.ncbi.nlm.nih.gov/38941159Test

الإتاحة: https://doi.org/10.1021/acsami.4c06887Test
https://pubmed.ncbi.nlm.nih.gov/38941159Test

المؤلفون: Feng, Zhe Chuan, Liu, Jiamin, Xie, Deng, Nafisa, Manika Tun, Zhang, Chuanwei, Wan, Lingyu, Jiang, Beibei, Lin, Hao-Hsiung, Qiu, Zhi-Ren, Lu, Weijie, Klein, Benjamin, Ferguson, Ian T, Liu, Shiyuan

المصدر: Materials (Basel) ; ISSN:1996-1944 ; Volume:17 ; Issue:12

مصطلحات موضوعية: Nomarski microscopy (NM), Raman scattering, Urbach’s binding energy, gallium nitride (GaN), high-resolution X-ray diffraction (HR-XRD), molecular beam epitaxy (MBE), near-edge X-ray absorption fine structure (NEXAFS), photoluminescence (PL), spectroscopic ellipsometry (SE), synchrotron radiation (SR)

العلاقة: https://doi.org/10.3390/ma17122921Test; https://pubmed.ncbi.nlm.nih.gov/38930290Test; https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11205289Test/

الإتاحة: https://doi.org/10.3390/ma17122921Test
https://pubmed.ncbi.nlm.nih.gov/38930290Test
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11205289Test/

المؤلفون: Wanpei Yu, Changcai Cui, Huihui Li, Subiao Bian, Xi Chen

المصدر: Photonics; Volume 9; Issue 9; Pages: 621

مصطلحات موضوعية: spectroscopic ellipsometry (SE), rough surface, equivalent medium approximation (EMA), finite difference time domain (FDTD)

وصف الملف: application/pdf

العلاقة: https://dx.doi.org/10.3390/photonics9090621Test

الإتاحة: https://doi.org/10.3390/photonics9090621Test

المؤلفون: Amira Ben Gouider Trabelsi, Fatemah. H. Alkallas, Aicha Ziouche, Abdelwaheb Boukhachem, Mostefa Ghamnia, Habib Elhouichet

المصدر: Crystals; Volume 12; Issue 5; Pages: 692

مصطلحات موضوعية: NiO sprayed thin film, spectroscopic ellipsometry (SE), intrinsic defects, vibrating sample magnetometer (VSM)

وصف الملف: application/pdf

العلاقة: Inorganic Crystalline Materials; https://dx.doi.org/10.3390/cryst12050692Test

الإتاحة: https://doi.org/10.3390/cryst12050692Test

المؤلفون: Fara, Laurentiu, Chilibon, Irinela, Nordseth, Ørnulf, Craciunescu, Dan, Savastru, Dan, Vasiliu, Cristina, Baschir, Laurentiu, Fara, Silvian, Kumar, Raj, Monakhov, Edouard, Connolly, James, P

المساهمون: Academy of Romanian Scientists Bucharest, University of Bucharest (UniBuc), National Institute of Research and Development for Optoelectronics (INOE), Institute for Energy Technology (IFE), University of Oslo (UiO), Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 1996-1073 ; Energies ; https://hal.sorbonne-universite.fr/hal-02989723Test ; Energies, 2020, 13 (18), pp.4667. ⟨10.3390/en13184667⟩.

مصطلحات موضوعية: silicon tandem heterojunction solar cell, N-doped Cu 2 O absorber layer, Al:ZnO (AZO), numerical electro-optical modeling, scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), spectroscopic ellipsometry (SE), Fourier-transform infrared (FTIR) spectroscopy, degradation degree, failure rate, [PHYS]Physics [physics]

العلاقة: hal-02989723; https://hal.sorbonne-universite.fr/hal-02989723Test; https://hal.sorbonne-universite.fr/hal-02989723/documentTest; https://hal.sorbonne-universite.fr/hal-02989723/file/energies-13-04667-v2.pdfTest

الإتاحة: https://doi.org/10.3390/en13184667Test
https://hal.sorbonne-universite.fr/hal-02989723Test
https://hal.sorbonne-universite.fr/hal-02989723/documentTest
https://hal.sorbonne-universite.fr/hal-02989723/file/energies-13-04667-v2.pdfTest

المؤلفون: Laurentiu Fara, Irinela Chilibon, Ørnulf Nordseth, Dan Craciunescu, Dan Savastru, Cristina Vasiliu, Laurentiu Baschir, Silvian Fara, Raj Kumar, Edouard Monakhov, James P. Connolly

المصدر: Energies; Volume 13; Issue 18; Pages: 4667

مصطلحات موضوعية: silicon tandem heterojunction solar cell, N-doped Cu 2 O absorber layer, Al:ZnO (AZO), numerical electro-optical modeling, scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), spectroscopic ellipsometry (SE), Fourier-transform infrared (FTIR) spectroscopy, degradation degree, failure rate

وصف الملف: application/pdf

العلاقة: A2: Solar Energy and Photovoltaic Systems; https://dx.doi.org/10.3390/en13184667Test

الإتاحة: https://doi.org/10.3390/en13184667Test

المؤلفون: Morris, Benedict

مصطلحات موضوعية: Résonance Plasmon de Surface Localisé (LSPR), Dioxyde de Vanadium (VO2), Ellipsométrie Spectroscopique (SE), Dépôt par ablation LASER Pulsé (PLD), Localised Surface Plasmon Resonance (LSPR), Vanadium dioxide (VO2), Spectroscopic ellipsometry (SE), Pulsed LASER Deposition (PLD)

وصف الملف: application/pdf

العلاقة: https://espace.inrs.ca/id/eprint/13808/1/Morris-B-M-Juillet2023.pdfTest; Morris, Benedict (2023). Synthèse et caractérisation optique de nano-objets couplés à un matériau thermochrome Mémoire. Québec, Université du Québec, Institut national de la recherche scientifique / Université de Toulouse III - Paul Sabatier, Maîtrise en sciences de l'énergie et des matériaux, 162 p.

الإتاحة: https://espace.inrs.ca/id/eprint/13808Test/
https://espace.inrs.ca/id/eprint/13808/1/Morris-B-M-Juillet2023.pdfTest

المؤلفون: Cerqueira, M. F., Losurdo, M., Stepikhova, M., Conde, O., Giangregorio, M. M., Pinto, Pedro, Ferreira, J. A.

المساهمون: Universidade do Minho

مصطلحات موضوعية: Nanocrystalline silicon, Erbium, Raman, X-ray, Ellipsometry, photoluminescence, spectroscopic ellipsometry (SE), Science & Technology

وصف الملف: application/pdf

العلاقة: 3908450640; 1012-0394; http://www.mendeley.com/research/structure-photoluminescence-erbiumdoped-nanocrystalline-silicon-thin-films-produced-reactive-magnetron-sputteringTest/

الإتاحة: http://hdl.handle.net/1822/13965Test

المؤلفون: Max L. Tietze, Martin Obst, Giel Arnauts, Nathalie Wauteraerts, Sabina Rodríguez-Hermida, Rob Ameloot

مصطلحات موضوعية: gas sensing, Technology, total internal reflection ellipsometry (TIRE), Science & Technology, ADSORPTION, DEVICES, Materials Science, metal-organic frameworks (MOFs), spectroscopic ellipsometry (SE), PHOTONIC CRYSTALS, Materials Science, Multidisciplinary, Science & Technology - Other Topics, General Materials Science, Nanoscience & Nanotechnology, DEPOSITION, surface plasmon polariton (SPP)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c44a1002b5848410fb140b4ed5d17c94Test
https://lirias.kuleuven.be/handle/20.500.12942/700368Test

المؤلفون: Raj Kumar, Silvian Fara, Cristina Vasiliu, Laurentiu Baschir, Edouard Monakhov, James P. Connolly, Dan Craciunescu, Laurentiu Fara, Dan Savastru, Ørnulf Nordseth, Irinela Chilibon

المساهمون: Academy of Romanian Scientists [Bucharest], University of Bucharest (UniBuc), National Institute of Research and Development for Optoelectronics (INOE), Institute for Energy Technology (IFE), University of Oslo (UiO), Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)

المصدر: Energies
Energies, MDPI, 2020, 13 (18), pp.4667. ⟨10.3390/en13184667⟩
Energies; Volume 13; Issue 18; Pages: 4667
Energies, Vol 13, Iss 4667, p 4667 (2020)

مصطلحات موضوعية: Control and Optimization, Materials science, Fabrication, Silicon, Scanning electron microscope, Al:ZnO (AZO), N-doped Cu 2 O absorber layer, Energy Engineering and Power Technology, chemistry.chemical_element, 02 engineering and technology, silicon tandem heterojunction solar cell, N-doped Cu2O absorber layer, lcsh:Technology, 01 natural sciences, 7. Clean energy, X-ray diffraction (XRD), law.invention, law, Fourier-transform infrared (FTIR) spectroscopy, 0103 physical sciences, Solar cell, atomic force microscopy (AFM), Electrical and Electronic Engineering, Thin film, Engineering (miscellaneous), 010302 applied physics, [PHYS]Physics [physics], Tandem, lcsh:T, Renewable Energy, Sustainability and the Environment, business.industry, spectroscopic ellipsometry (SE), Heterojunction, Sputter deposition, 021001 nanoscience & nanotechnology, degradation degree, numerical electro-optical modeling, scanning electron microscopy (SEM), failure rate, chemistry, Optoelectronics, 0210 nano-technology, business, Energy (miscellaneous)

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a18d18861ea1b3382cdeea5fd2fe2939Test
https://hal.sorbonne-universite.fr/hal-02989723Test