المؤلفون: Dentan, Martin, Moindjie, Soilihi, Cecchetto, Matteo, Autran, Jean-Luc, Alia, Ruben Garcia, Naish, Richard, Waterhouse, John, Horton, Alan R., Litaudon, Xavier, Munteanu, Daniela, Bucalossi, Jérome, Moreau, Philippe, Malherbe, Victor, Roche, Philippe, Rastelli, Dario, Contributors, Jet

المساهمون: CEA Cadarache, Commissariat à l'énergie atomique et aux énergies alternatives (CEA), CERN Genève, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS), United Kingdom Atomic Energy Authority, Culham Centre for Fusion Energy (CCFE), Culham Science Centre Abingdon -Culham Science Centre Abingdon, STMicroelectronics Crolles (ST-CROLLES), Raylab s.r.l., European Project: 101052200,Implementation of activities described in the Roadmap to Fusion during Horizon Europe through a joint programme of the members of the EUROfusion consortium,EUROfusion

المصدر: NSREC 2024 - 2024 IEEE Nuclear and Space Radiation Effects Conference ; https://hal.science/hal-04613462Test ; NSREC 2024 - 2024 IEEE Nuclear and Space Radiation Effects Conference, Jul 2024, Ottawa, Canada ; https://www.nsrec.comTest/

مصطلحات موضوعية: CMOS, deuterium-tritium (D-T), fusion, neutron, real-time experiment, single event effects (SEE), soft-error rate (SER), single-event upset (SEU), static random-access memory (SRAM), tokamak, JET, WEST, JT-60SA, DTT, STEP, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Ottawa

الوقت: Ottawa, Canada

العلاقة: info:eu-repo/grantAgreement//101052200/EU/EUROfusion/EUROfusion; hal-04613462; https://hal.science/hal-04613462Test; https://hal.science/hal-04613462/documentTest; https://hal.science/hal-04613462/file/NSREC_2024_HAL.pdfTest

الإتاحة: https://hal.science/hal-04613462Test
https://hal.science/hal-04613462/documentTest
https://hal.science/hal-04613462/file/NSREC_2024_HAL.pdfTest

المؤلفون: Munteanu, Daniela, Autran, Jean-Luc

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Advances in Semiconductor Physics and Devices ; https://hal.science/hal-04400965Test ; Advances in Semiconductor Physics and Devices, IntechOpen, 2024, ⟨10.5772/intechopen.1003991⟩

مصطلحات موضوعية: complementary metal-oxide semiconductor (CMOS), critical charge, diffusion-collection, metal-oxide-semiconductor field-effect transistor (MOSFET), radiation effects, semiconductor, single event effects (SEE), soft error rate (SER), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS]Physics [physics]

العلاقة: hal-04400965; https://hal.science/hal-04400965Test; https://hal.science/hal-04400965/documentTest; https://hal.science/hal-04400965/file/Chapter_2024_Munteanu_Autran_HAL.pdfTest

الإتاحة: https://doi.org/10.5772/intechopen.1003991Test
https://hal.science/hal-04400965Test
https://hal.science/hal-04400965/documentTest
https://hal.science/hal-04400965/file/Chapter_2024_Munteanu_Autran_HAL.pdfTest

المؤلفون: Moindjie, Soilihi, Munteanu, Daniela, Autran, Jean-Luc, Dentan, Martin, Moreau, Philippe, Pellissier, Francis-Pierre, Santraine, Benjamin, Bucalossi, Jérôme, Malherbe, Victor, Thery, Thomas, Gasiot, Gilles, Roche, Philippe, Cecchetto, Matteo, Alia, Rubén Garcia

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS), Institut de Recherche sur la Fusion par confinement Magnétique (IRFM), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics Crolles (ST-CROLLES), CERN Genève, European Project: 101052200,Implementation of activities described in the Roadmap to Fusion during Horizon Europe through a joint programme of the members of the EUROfusion consortium,EUROfusion

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: Complementary metal–oxide–semiconductor (CMOS), deuterium–deuterium (D-D), deuterium–tritium (D-T), fusion, International Thermonuclear Experimental Reactor (ITER), neutron, real-time experiment, single-event effects (SEEs), single-event upset (SEU), soft-error rate (SER), static random access memory (SRAM), tokamak, W–tungsten– Environment in Steady-state Tokamak (WEST), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS]Physics [physics]

العلاقة: info:eu-repo/grantAgreement//101052200/EU/EUROfusion/EUROfusion; hal-04390851; https://amu.hal.science/hal-04390851Test; https://amu.hal.science/hal-04390851/documentTest; https://amu.hal.science/hal-04390851/file/TNS_WEST_2024_HAL.pdfTest

الإتاحة: https://doi.org/10.1109/TNS.2023.3347673Test
https://amu.hal.science/hal-04390851Test
https://amu.hal.science/hal-04390851/documentTest
https://amu.hal.science/hal-04390851/file/TNS_WEST_2024_HAL.pdfTest

المؤلفون: Kuo-Yuan Chu, Weng-Sheng Kuo, How-Ming Lee, Yiin-Kuen Fuh

المصدر: Nuclear Engineering and Technology, Vol 55, Iss 5, Pp 1559-1566 (2023)

مصطلحات موضوعية: Soft error rate (SER), Quasi-monoenergetic neutron (QMN), Neutron target station, Cyclotron, Nuclear engineering. Atomic power, TK9001-9401

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S1738573323000621Test; https://doaj.org/toc/1738-5733Test

الوصول الحر: https://doaj.org/article/0d61100a7a4a42d78df05e1a863a4825Test

المؤلفون: Dongmin Lee, Taehyeong Nam, Daeseon Park, Yeju Kim, Jongwhoa Na

المصدر: Applied Sciences, Vol 14, Iss 4, p 1470 (2024)

مصطلحات موضوعية: soft error rate (SER), emulation fault injection, architectural vulnerability factor (AVF), Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/2076-3417/14/4/1470Test; https://doaj.org/toc/2076-3417Test

الوصول الحر: https://doaj.org/article/294ef02107404d92967ea842f4bdc723Test

المؤلفون: Autran, Jean-Luc, Munteanu, Daniela

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: CMOS technologies, collection–diffusion, criti- cal charge, fin field-effect transistor (FinFET), numerical simula- tion, planar transistor, radiation effects, single event effects, soft error rate (SER), static random access memory (SRAM), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

العلاقة: hal-04059844; https://amu.hal.science/hal-04059844Test; https://amu.hal.science/hal-04059844/documentTest; https://amu.hal.science/hal-04059844/file/TNS_Autran_Munteanu_2023_HAL.pdfTest

الإتاحة: https://doi.org/10.1109/TNS.2023.3263106Test
https://amu.hal.science/hal-04059844Test
https://amu.hal.science/hal-04059844/documentTest
https://amu.hal.science/hal-04059844/file/TNS_Autran_Munteanu_2023_HAL.pdfTest

المؤلفون: Noizette, Luc, Miller, Florent, Colladant, Thierry, Helen, Youri, Leveugle, Régis

المساهمون: Architectures and Methods for Resilient Systems (TIMA-AMfoRS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), NUCLETUDES, Direction générale de l'Armement (DGA), DGA Maîtrise de l'information (DGA.MI)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: soft-error-rate (SER), reduced instruction set computer (RISC-V), virtual platform, software profiling, complex digital device, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

العلاقة: hal-04193886; https://hal.science/hal-04193886Test

الإتاحة: https://doi.org/10.1109/TNS.2023.3284899Test
https://hal.science/hal-04193886Test

المؤلفون: Jean-Luc Autran, Daniela Munteanu

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2023, 70 (5), pp.782-791. ⟨10.1109/TNS.2023.3263106⟩

مصطلحات موضوعية: static random access memory (SRAM), Nuclear and High Energy Physics, soft error rate (SER), fin field-effect transistor (FinFET), collection–diffusion, criti- cal charge, single event effects, CMOS technologies, planar transistor, numerical simula- tion, Nuclear Energy and Engineering, radiation effects, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9cbeb2a1c2a2533a82552028a61729e2Test
https://doi.org/10.1109/tns.2023.3263106Test

المؤلفون: Coronetti, Andrea, García Alía, Rubén, Cecchetto, Matteo, Hajdas, Wojtek, Söderström, Daniel, Javanainen, Arto, Saigné, Frédéric

المساهمون: CERN Genève, Paul Scherrer Institute (PSI), University of Jyväskylä (JYU), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0018-9499 ; IEEE Transactions on Nuclear Science ; https://hal.science/hal-02911958Test ; IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1606-1613. ⟨10.1109/TNS.2020.2978228⟩.

مصطلحات موضوعية: Mesons, Large Hadron Collider, Single event upsets, Random access memory, Particle beams, Cross section, Neutrons, FLUKA, Pions, Protons, Radiation hardness assurance (RHA), Single-event effect (SEE), Soft error rate (SER), Hadron, Radiation: damage, Resonance: effect, Accelerator, Nuclear reaction, pi: interaction, n: flux, [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph], [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]

العلاقة: hal-02911958; https://hal.science/hal-02911958Test; https://hal.science/hal-02911958/documentTest; https://hal.science/hal-02911958/file/The_Pion_Single-Event_Effect_Resonance_and_its_Impact_in_an_Accelerator_Environment.pdfTest; INSPIRE: 1808320; WOS: 000550669800050

الإتاحة: https://doi.org/10.1109/TNS.2020.2978228Test
https://hal.science/hal-02911958Test
https://hal.science/hal-02911958/documentTest
https://hal.science/hal-02911958/file/The_Pion_Single-Event_Effect_Resonance_and_its_Impact_in_an_Accelerator_Environment.pdfTest

المؤلفون: Chen, J., Lange, T., Andjelkovic, M., Simevski, A., Krstic, M.

مصطلحات موضوعية: ddc:620, Solar Particle Events (SPEs), Soft Error Rate (SER) measurement, SRAM-based detector

وصف الملف: application/pdf

العلاقة: ESSN:0026-2714; https://oa.tib.eu/renate/handle/123456789/7437Test; https://doi.org/10.34657/6484Test

الإتاحة: https://doi.org/10.34657/648410.1016/j.microrel.2020.113799Test
https://oa.tib.eu/renate/handle/123456789/7437Test