المؤلفون: Yan, Aibin¹ abyan@mail.ustc.edu.cn, Wu, Zhen¹ 2262076636@qq.com, Guo, Jing² guojing861229@163.com, Song, Jie¹ 909944599@qq.com, Wen, Xiaoqing³ wen@cse.kyutech.ac.jp

المصدر: IEEE Transactions on Reliability. Mar2019, Vol. 68 Issue 1, p354-363. 10p.

مصطلحات موضوعية: *SIMULATION methods & models, SINGLE event effects, RADIATION hardening (Electronics), ROBUST control, ENERGY dissipation, METAL oxide semiconductor field-effect transistors

المؤلفون: Peng, Chao¹, Hu, Zhiyuan², En, Yunfei¹, Chen, Yiqiang¹, Lei, Zhifeng¹, Zhang, Zhangang¹, Zhang, Zhengxuan², Li, Bin³

المصدر: IEEE Transactions on Nuclear Science. Mar2018, Vol. 65 Issue 3, p877-883. 7p.

مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, RADIATION hardening (Electronics), IONIZATION (Atomic physics), RADIATION doses, NITRIDATION

المؤلفون: Ochedowski, O.¹, Marinov, K.¹, Wilbs, G.², Keller, G.², Scheuschner, N.³, Severin, D.⁴, Bender, M.⁴, Maultzsch, J.³, Tegude, F. J.², Schleberger, M.¹

المصدر: Journal of Applied Physics. Jun2013, Vol. 113 Issue 21, p214306. 7p. 3 Color Photographs, 3 Graphs.

مصطلحات موضوعية: *RADIATION hardening (Electronics), *FIELD-effect transistors, *TRANSISTORS, *IRRADIATION, *HEAVY ions, *GRAPHENE

المؤلفون: Arumugam Karthigeyan, Sankararajan Radha, Esakkimuthu Manikandan

المصدر: IET Circuits, Devices and Systems, Vol 16, Iss 2, Pp 178-188 (2022)

مصطلحات موضوعية: radiation hardening (electronics), voltage‐controlled oscillators, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/1751-858XTest; https://doaj.org/toc/1751-8598Test

الوصول الحر: https://doaj.org/article/bfe13102725d49c19c5fd63e69f3fb1bTest

المؤلفون: Worsey, Elliott, Tang, Qi, Kulsreshath, Mukesh Kumar, Pamunuwa, I D B

المصدر: Worsey , E , Tang , Q , Kulsreshath , M K & Pamunuwa , I D B 2023 , Fully Microelectromechanical Non-Volatile Memory Cell . in 2023 IEEE 36th International Conference on Micro Electro Mechanical Systems, MEMS 2023 . Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS) , vol. 2023-January , Institute of Electrical and Electronics Engineers (IEEE) , pp. 507-510 , The 36th International Conference on Micro Electro Mechanical Systems , Munich , Bavaria , Germany , 15/01/23 . https://doi.org/10.1109/MEMS49605.2023.10052290Test

مصطلحات موضوعية: /dk/atira/pure/core/keywords/faculty_of_enigneering/photonics_and_quantum, name=Photonics and Quantum, MEMS, Microswitches, Nonvolatile memory, Radiation hardening (electronics), High-temperature

وصف الملف: application/pdf

العلاقة: https://research-information.bris.ac.uk/en/publications/56fffabd-1629-4110-b8a8-d9ec29ad8a8dTest; urn:ISBN:978-1-6654-9309-3

الإتاحة: https://doi.org/10.1109/MEMS49605.2023.10052290Test
https://hdl.handle.net/1983/56fffabd-1629-4110-b8a8-d9ec29ad8a8dTest
https://research-information.bris.ac.uk/en/publications/56fffabd-1629-4110-b8a8-d9ec29ad8a8dTest
https://research-information.bris.ac.uk/ws/files/361949071/MEMS2023_Upload_Cover.pdfTest

المؤلفون: Mazza, Giovanni, Argirò, Stefano, Borca, Cecilia, Cometti, Simona, Cossio, Fabio, Dejardin, Marc, Dellacasa, Giulio, Mignone, Marco, Pastrone, Nadia, Soldi, Dario, Silvestrin, Luca, Tedesco, Silvia, Tessaro, Mario, Varela, Joao, Wheadon, Richard

المساهمون: Mazza, Giovanni, Argirò, Stefano, Borca, Cecilia, Cometti, Simona, Cossio, Fabio, Dejardin, Marc, Dellacasa, Giulio, Mignone, Marco, Pastrone, Nadia, Soldi, Dario, Silvestrin, Luca, Tedesco, Silvia, Tessaro, Mario, Varela, Joao, Wheadon, Richard

مصطلحات موضوعية: Data conversion, Data compression, Radiation hardening electronics

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:001012981300051; volume:70; issue:6; firstpage:1215; lastpage:1222; numberofpages:8; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; https://hdl.handle.net/11583/2978465Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85159813032; https://ieeexplore.ieee.org/document/10122738Test

الإتاحة: https://doi.org/10.1109/TNS.2023.3274930Test
https://hdl.handle.net/11583/2978465Test
https://ieeexplore.ieee.org/document/10122738Test

المؤلفون: Berlea, D. V., Allport, P., de Acedo, L. Flores Sanz, Gabrielli, A., Gazi, M., Gonella, L., Gonzalez, V., Gustavino, G., LeBlanc, M., Oyulmaz, K. Y., Pernegger, H., Piro, F., Tortajada, I. Asensi, Riedler, P., van Rijnbach, M., Sandaker, H., Sharma, A., Snoeys, W., Solans Sanchez, C. A., Suligoj, T., Nunez, M. Vazquez, Weick, J., Worm, S., Bortoletto, D., Zoubir, A. M., Buttar, C., Charbon, E., Dachs, F., Dao, V., Denizili, H., Dobrijevic, D.

المصدر: IEEE transactions on nuclear science 70(10), 2303 - 2309 (2023). doi:10.1109/TNS.2023.3313721

مصطلحات موضوعية: info:eu-repo/classification/ddc/620, radiation: damage, semiconductor detector: pixel, semiconductor detector: design, electronics: readout, electrode, performance, CERN SPS, efficiency, integrated circuit, noise, Sensors, Electrodes, Temperature sensors, Poles and towers, Timing, Sensor phenomena and characterization, Power demand, application specific integrated circuits, CMOS image sensors, image sensors, nuclear electronics, position sensitive particle detectors, radiation hardening (electronics), readout electronics, semiconductor counters, silicon radiation detectors, 15 1 MeV n, 2021 SPS CERN Test Beam, 2022 SPS CERN Test Beam

جغرافية الموضوع: DE

العلاقة: info:eu-repo/semantics/altIdentifier/issn/0018-9499; info:eu-repo/semantics/altIdentifier/issn/1558-1578; https://bib-pubdb1.desy.de/record/600031Test; https://bib-pubdb1.desy.de/search?p=id:%22PUBDB-2023-07693%22Test

الإتاحة: https://doi.org/10.1109/TNS.2023.3313721Test
https://doi.org/10.3204/PUBDB-2023-07693Test
https://bib-pubdb1.desy.de/record/600031Test
https://bib-pubdb1.desy.de/search?p=id:%22PUBDB-2023-07693%22Test

المؤلفون: Goiffon, Vincent¹, Rolando, Sebastien¹, Corbiere, Franck¹, Rizzolo, Serena¹, Chabane, Aziouz¹, Girard, Sylvain², Baer, Jeremy¹, Estribeau, Magali¹, Magnan, Pierre¹, Paillet, Philippe³, Van Uffelen, Marco⁴, Mont Casellas, Laura⁴, Scott, Robin⁵, Gaillardin, Marc³, Marcandella, Claude³, Marcelot, Olivier¹, Allanche, Timothe²

المصدر: IEEE Transactions on Nuclear Science. Jan2017, Vol. 64 Issue 1, part 1, p45-53. 9p.

مصطلحات موضوعية: RADIATION hardening (Electronics), CMOS image sensors, GAMMA rays, PHOTODIODES, COLOR filter arrays, ANALOG-to-digital converters, DARK currents (Electric), IONIZING radiation dosage

المؤلفون: Di Francesca, D.¹, Girard, S.¹, Planes, I.¹, Cebollada, A.², Vecchi, G. Li¹, Alessi, A.¹, Reghioua, I.¹, Cangialosi, C.¹, Ladaci, A.¹, Rizzolo, S.¹, Lecoeuche, V.², Boukenter, A.¹, Champavere, A.², Ouerdane, Y.¹

المصدر: IEEE Transactions on Nuclear Science. Jan2017, Vol. 64 Issue 1, part 1, p54-60. 7p.

مصطلحات موضوعية: RADIATION hardening (Electronics), TEMPERATURE sensors, RAMAN effect, RAMAN lasers, OPTICAL fibers, IRRADIATION

المؤلفون: Wang, H.-B.¹, Chen, L.², Liu, R.², Li, Y.-Q.², Kauppila, J. S.³, Bhuva, B. L.⁴, Lilja, K.⁵, Wen, S.-J.⁶, Wong, R.⁶, Fung, R.⁶, Baeg, S.⁷

المصدر: IEEE Transactions on Nuclear Science. Dec2016, Vol. 63 Issue 6, p3003-3009. 7p.

مصطلحات موضوعية: *MICROELECTRONICS, FLIP-flop circuits, RADIATION hardening (Electronics), SINGLE event effects, SOFT errors