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1دورية أكاديمية
المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-13 (2024)
مصطلحات موضوعية: Swin transformer, Deep learning model, Residual convolutional networks, Hierarchical transformers, Internet of things, Medicine, Science
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2045-2322Test
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2دورية أكاديمية
المؤلفون: Paul Young, Nima Ebadi, Arun Das, Mazal Bethany, Kevin Desai, Peyman Najafirad
المصدر: Sensors; Volume 23; Issue 2; Pages: 929
مصطلحات موضوعية: face geometry, hierarchical transformers, anti-spoofing, facial expression recognition, deepfakes
وصف الملف: application/pdf
العلاقة: Sensing and Imaging; https://dx.doi.org/10.3390/s23020929Test
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المصدر: Scientific Reports. 14(1)
مصطلحات موضوعية: Swin transformer, Deep learning model, Residual convolutional networks, Hierarchical transformers, Internet of things
وصف الملف: print
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4دورية أكاديمية
المؤلفون: Luca Bacco, Andrea Cimino, Felice Dell’Orletta, Mario Merone
المصدر: Electronics; Volume 10; Issue 18; Pages: 2195
مصطلحات موضوعية: sentiment analysis, explainability, hierarchical transformers, extractive summarization
وصف الملف: application/pdf
العلاقة: Computer Science & Engineering; https://dx.doi.org/10.3390/electronics10182195Test
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المؤلفون: Felice Dell'Orletta, Luca Bacco, Andrea Cimino, Mario Merone
المصدر: Electronics, Vol 10, Iss 2195, p 2195 (2021)
Electronics
Volume 10
Issue 18مصطلحات موضوعية: TK7800-8360, Computer Networks and Communications, Computer science, computer.software_genre, Task (project management), explainability, extractive summarization, Electrical and Electronic Engineering, Architecture, hierarchical transformers, Transformer (machine learning model), Hierarchy, business.industry, Suite, Sentiment analysis, Benchmarking, Automatic summarization, Hardware and Architecture, Control and Systems Engineering, sentiment analysis, Signal Processing, Artificial intelligence, Electronics, business, computer, Natural language processing
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::031618c6617846855bcee46d1346cc28Test
https://doi.org/10.3390/electronics10182195Test