المؤلفون: Alexander V. Rumyantsev, Nikolai I. Borgardt, Roman L. Volkov, Yuri A. Chaplygin

المصدر: Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 733-742 (2024)

مصطلحات موضوعية: electron microscopy, focused ion beam, level set simulation, multilayer substrate, silicon, silicon dioxide, sputtering, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/2190-4286Test

الوصول الحر: https://doaj.org/article/1141814ba2a649f9b28e3c3b6938ddb4Test

المؤلفون: Sapezanskaia, Ina

المساهمون: University/Department: Universitat Politècnica de Catalunya. Departament de Ciència dels Materials i Enginyeria Metal·lúrgica

مرشدي الرسالة: Mateo García, Antonio Manuel, Redjaïmia, Abdelkrim

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: Metastable austenitic stainless steels, Phase transformation, Cyclic nanoindentation, Plastic deformation mechanisms, Transmission electron microscopy (TEM), Focused ion beam (FIB), Scanning ion microscopy (SIM), Crystalline anisotropy, Grain size, Plasticity transmission

وصف الملف: application/pdf

الوصول الحر: http://hdl.handle.net/10803/398401Test

المؤلفون: García-Tudela, Matías, Proenza, Joaquín A., Farré-de-Pablo, Júlia, Pujol-Solà, Núria, Aiglsperger, Thomas, Castillo-Oliver, Montgarri, Colás, Vanessa, Arenas, Ricardo, Garcia-Casco, Antonio

المصدر: Ore Geology Reviews. 170

مصطلحات موضوعية: Chromitites, Platinum-group elements (PGE), Platinum-group minerals (PGM), Fore-arc basalts (FAB), Focused-ion beam (FIB), Transmission electron microscopy (TEM), Applied Geochemistry, Tillämpad geokemi

وصف الملف: electronic

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-107431Test
https://doi.org/10.1016/j.oregeorev.2024.106109Test
https://ltu.diva-portal.org/smash/get/diva2:1870472/FULLTEXT01.pdfTest

المؤلفون: Olofsson, Jakob, 1980, Bogdanoff, Toni, Tiryakioğlu, Murat

المصدر: EVIDENT Materials Characterization. 208

مصطلحات موضوعية: Aluminum alloys, Defects, Focused ion beam (FIB), Scanning/transmission electron microscopy (STEM), Image analysis

وصف الملف: print

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:hj:diva-63408Test
https://doi.org/10.1016/j.matchar.2024.113647Test

المؤلفون: Hasan Feyzi Budak, Bülent Alkan, Halil Yılmaz

المصدر: Hittite Journal of Science and Engineering, Vol 11, Iss 1, Pp 41-47 (2024)

مصطلحات موضوعية: focused ion beam, manganese, micropillar compression, mechanical properties, size effect, Engineering (General). Civil engineering (General), TA1-2040

وصف الملف: electronic resource

العلاقة: https://dergipark.org.tr/tr/download/article-file/3431261Test; https://doaj.org/toc/2148-4171Test

الوصول الحر: https://doaj.org/article/d736eee1b3f547ef943f9b6e3db573a5Test

المؤلفون: P. Lagrain, K. Paulussen, E. Grieten, G. Van den Bosch, S. Rachidi, D. Yudistira, L. Wouters, T. Hantschel

المصدر: Micro and Nano Engineering, Vol 23, Iss , Pp 100247- (2024)

مصطلحات موضوعية: Focused ion beam, FIB/SEM, Dual-beam, Electrical SPM, SSRM, C-AFM, Electronics, TK7800-8360, Technology (General), T1-995

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S2590007224000108Test; https://doaj.org/toc/2590-0072Test

الوصول الحر: https://doaj.org/article/d5a4ea81a68e4d849bd039a490c67128Test

المؤلفون: Jesús G. Galaz-Montoya

المصدر: Frontiers in Molecular Biosciences, Vol 11 (2024)

مصطلحات موضوعية: cryogenic electron microscopy (cryoEM), cryogenic electron tomography (cryoET), cryogenic volume electron microscopy (cryoVEM), cryogenic focused ion beam milling scanning electron microscopy (cryoFIB-SEM), cryogenic correlative light and electron microscopy (cryoCLEM), artificial intelligence (AI), Biology (General), QH301-705.5

وصف الملف: electronic resource

العلاقة: https://www.frontiersin.org/articles/10.3389/fmolb.2024.1390858/fullTest; https://doaj.org/toc/2296-889XTest

الوصول الحر: https://doaj.org/article/eec0ec8adc14446eaee49ffc74d3466dTest

المؤلفون: Jutta Luksch, Aloshious Lambai, Gaurav Mohanty, Christoph Pauly, Florian Schaefer, Christian Motz

المصدر: Materials & Design, Vol 241, Iss , Pp 112880- (2024)

مصطلحات موضوعية: Fatigue crack growth, Micro cantilever, In-situ testing, Focused ion beam, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S0264127524002533Test; https://doaj.org/toc/0264-1275Test

الوصول الحر: https://doaj.org/article/2b2a5add56da48f3ac3c779ef22e35b8Test

المؤلفون: Baber, S.

المساهمون: Luxmoore, Isaac, Barnes, William

مصطلحات موضوعية: Single photon source, Qubit ensemble, hexagonal boron nitride, Boron vacancy defect, nanoantenna, Rabi oscillation, Optically detected magnetic resonance, Level anti-crossing, Time resolved photo-luminescence, Zeeman splitting, Ion implantation, Focused ion beam, 2D materials, Confocal microscopy

الوصول الحر: https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.884429Test

المؤلفون: Chongyi Shu, Yiqi Yu, Xiaopan Chen, Jiansheng Guo, Yier Zhou, Dandan Wu, Tianyun Yang, Yuhang Fan, Qiongxiao Huang, Jing Shu

المصدر: Journal of Ovarian Research, Vol 16, Iss 1, Pp 1-11 (2023)

مصطلحات موضوعية: Oocyte cumulus complex, Granulosa cells, Focused ion beam scanning electronmicroscopy, 3D reconstruction, Organelles, Intercellular connections, Gynecology and obstetrics, RG1-991

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/1757-2215Test

الوصول الحر: https://doaj.org/article/540ac97ef6b547388ecbd0ade61ec803Test