المؤلفون: Victor Constantin, Daniel Comeagă, Bogdan Grămescu, Daniel Besnea, Adrian Cartal, Edgar Moraru

المصدر: Applied Sciences, Vol 14, Iss 12, p 5345 (2024)

مصطلحات موضوعية: mechatronic system, characterization, optometry, automatic testing, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/2076-3417/14/12/5345Test; https://doaj.org/toc/2076-3417Test

الوصول الحر: https://doaj.org/article/42288da368824c7697aa4df4e544c569Test

المؤلفون: Moreira, Pedro, Ribeiro, António Nestor, Silva, João Marco Cardoso

المساهمون: Universidade do Minho

مصطلحات موضوعية: API Gateways, Automatic testing, Load testing, Performance assessment

وصف الملف: application/pdf

العلاقة: Moreira, P., Ribeiro, A., & Silva, J. M. (2023, July 9). AGE: Automatic Performance Evaluation of API Gateways. 2023 IEEE Symposium on Computers and Communications (ISCC). IEEE. http://doi.org/10.1109/iscc58397.2023.10218286Test; 9798350300482; 1530-1346; https://ieeexplore.ieee.org/document/10218286Test

الإتاحة: https://hdl.handle.net/1822/90112Test

المؤلفون: Kyeeun Kim, Keo Sik Kim, Hyoung-Jun Park

المصدر: IEEE Access, Vol 11, Pp 114489-114496 (2023)

مصطلحات موضوعية: Deep learning, quality management, welding, automatic testing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/10286042Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/09aa27b37b0445f695159ed8c2910733Test

المؤلفون: Jan Skalka, Martin Drlik

المصدر: IEEE Access, Vol 11, Pp 106772-106792 (2023)

مصطلحات موضوعية: Automatic testing, electronic learning, engineering education, software testing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/10256103Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/40eccb99794643aa957e8514b25d6432Test

المؤلفون: Kamm, Matteo, Rigger, Manuel, Zhang, Chengyu, id_orcid:0 000-0002-7285-289X, Su, Zhendong

المساهمون: Just, René, Fraser, Gordon

المصدر: ISSTA 2023: Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis

مصطلحات موضوعية: Database testing, Graph databases, Test oracle, Automatic testing

وصف الملف: application/application/pdf

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/979-8-4007-0221-1; info:eu-repo/semantics/altIdentifier/wos/001122661400012; http://hdl.handle.net/20.500.11850/627386Test; urn:isbn:979-8-4007-0221-1

الإتاحة: https://doi.org/20.500.11850/627386Test
https://doi.org/10.3929/ethz-b-000627386Test
https://doi.org/10.1145/3597926.3598044Test
https://hdl.handle.net/20.500.11850/627386Test

المؤلفون: WANG Junkang, WU Jishun, WANG Weidong, ZHAO Junyi, WANG Taotao, LUO Wei

المصدر: Zhejiang dianli, Vol 41, Iss 7, Pp 42-48 (2022)

مصطلحات موضوعية: 5g, image recognition, automatic testing system, cloud service, remote monitoring, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://zjdl.cbpt.cnki.net/WKE3/WebPublication/paperDigest.aspx?paperID=8bbf2c3c-5fb3-4ca4-8684-c45c9fa56231Test; https://doaj.org/toc/1007-1881Test

الوصول الحر: https://doaj.org/article/fb9b067c2bfc4c9c9c95295f4f0d64bbTest

المؤلفون: Aamir Mehmood Mirza, Muhammad Naeem Ahmed Khan, Raja Asif Wagan, Muhammad Bux Laghari, Muhammad Ashraf, Muhammad Akram, Muhammad Bilal

المصدر: IEEE Access, Vol 9, Pp 80478-80490 (2021)

مصطلحات موضوعية: Automatic testing, context awareness, end-to-end testing, model based testing, scenario-based testing, software quality, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/9444481Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/df6da721bf9148ac9ef6fe4188aab1e2Test

المؤلفون: Chao Zhi, Zhong-Yuan Gao, Guan-Lin Wang, Meng-Qi Chen, Wei Fan, Ling-Jie Yu

المصدر: IEEE Access, Vol 8, Pp 5160-5171 (2020)

مصطلحات موضوعية: Object segmentation, surface fitting, hairiness extraction, pilling assessment, automatic testing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/8945200Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/f3c769a4b74849f3be43be70fa56c19cTest

المؤلفون: Xiaonan Zhao, Shuai Deng, Yang Li

المصدر: IEEE Access, Vol 8, Pp 119511-119515 (2020)

مصطلحات موضوعية: Integrated circuits, automatic testing, microcomputers, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/9126824Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/38c14da304ff40de9644362c6dc3eef9Test

المؤلفون: Demin Nalic, Hexuan Li, Arno Eichberger, Christoph Wellershaus, Aleksa Pandurevic, Branko Rogic

المصدر: IEEE Access, Vol 8, Pp 224974-224984 (2020)

مصطلحات موضوعية: Automatic testing, autonomous vehicles, scenario generation, ADAS, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/9290063Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/0ef76515ff77452e865b2733ef519387Test