المؤلفون: Surynek, M., Zubac, J., Olejnik, K., Farkas, A., Krizek, F., Nadvornik, L., Kubascik, P., Trojanek, F., Campion, R. P., Novak, V., Jungwirth, T., Nemec, P.

مصطلحات موضوعية: Condensed Matter - Materials Science, Condensed Matter - Disordered Systems and Neural Networks

الوصول الحر: http://arxiv.org/abs/2401.17370Test

المؤلفون: Betancourt, R. D. Gonzalez, Zubáč, J., Gonzalez-Hernandez, R. J., Geishendorf, K., Šobáň, Z., Springholz, G., Olejník, K., Šmejkal, L., Sinova, J., Jungwirth, T., Goennenwein, S. T. B., Thomas, A., Reichlová, H., Železný, J., Kriegner, D.

المصدر: Phys. Rev. Lett. 130, 036702 (2023)

مصطلحات موضوعية: Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/2112.06805Test

المؤلفون: Wang, M., Andrews, C., Reimers, S., Amin, O. J., Wadley, P., Campion, R. P., Poole, S. F., Felton, J., Edmonds, K. W., Gallagher, B. L., Rushforth, A. W., Makarovsky, O., Gas, K., Sawicki, M., Kriegner, D., Zubac, J., Olejnik, K., Novak, V., Jungwirth, T., Shahrokhvand, M., Zeitler, U., Dhesi, S. S., Maccherozzi, F.

المصدر: Phys. Rev. B 101, 094429 (2020)

مصطلحات موضوعية: Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/1911.12381Test

المؤلفون: Gonzalez Betancourt, R. D., Zubáč, J., Gonzalez-Hernandez, R., Geishendorf, K., Šobáň, Z., Springholz, G., Olejník, K., Šmejkal, L., Sinova, J., Jungwirth, T., Goennenwein, S. T. B., Thomas, A., Reichlová, H., Železný, J., Kriegner, D.

العلاقة: https://nottingham-repository.worktribe.com/output/17933979Test; Physical Review Letters; Volume 130; Issue 3

الإتاحة: https://doi.org/10.1103/PhysRevLett.130.036702Test
https://nottingham-repository.worktribe.com/output/17933979Test

المؤلفون: Kašpar, Z., Surýnek, M., Zubáč, J., Krizek, F., Novák, V., Campion, R. P., Wörnle, M. S., Gambardella, P., Marti, X., Němec, P., Edmonds, K. W., Reimers, S., Amin, O. J., Maccherozzi, F., Dhesi, S. S., Wadley, P., Wunderlich, J., Olejník, K., Jungwirth, T.

العلاقة: Kašpar, Z., Surýnek, M., Zubáč, J., Krizek, F., Novák, V., Campion, R. P., Wörnle, M. S., Gambardella, P., Marti, X., Němec, P., Edmonds, K. W., Reimers, S., Amin, O. J., Maccherozzi, F., Dhesi, S. S., Wadley, P., Wunderlich, J., Olejník, K. und Jungwirth, T. (2021) Quenching of an antiferromagnet into high resistivity states using electrical or ultrashort optical pulses. Nature Electronics 4 (1), S. 30-37.

الإتاحة: https://doi.org/10.1038/s41928-020-00506-4Test
https://epub.uni-regensburg.de/50605Test/

المؤلفون: Wang, M., Andrews, C., Reimers, S., Amin, O. J., Wadley, P., Campion, R. P., Poole, S. F., Felton, J., Edmonds, K. W., Gallagher, B. L., Rushforth, A. W., Makarovsky, O., Gas, K., Sawicki, M., Kriegner, D., Zubáč, J., Olejník, K., Novák, V., Jungwirth, T., Shahrokhvand, M., Zeitler, U., Dhesi, S. S., Maccherozzi, F.

العلاقة: https://nottingham-repository.worktribe.com/output/4211748Test; Physical Review B; Volume 101; Issue 9

الإتاحة: https://doi.org/10.1103/PhysRevB.101.094429Test
https://nottingham-repository.worktribe.com/output/4211748Test

المؤلفون: Kašpar, Z., Surýnek, M., Zubáč, J., Krizek, F., Novák, V., Campion, R. P., Wörnle, M. S., Gambardella, P., Marti, X., Němec, P., Edmonds, K. W., Reimers, S., Amin, O. J., Maccherozzi, F., Dhesi, S. S., Wadley, P., Wunderlich, J., Olejník, K., Jungwirth, T.

المصدر: Nature Electronics ; volume 4, issue 1, page 30-37 ; ISSN 2520-1131

مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1038/s41928-020-00506-4Test
https://www.nature.com/articles/s41928-020-00506-4.pdfTest
https://www.nature.com/articles/s41928-020-00506-4Test

المؤلفون: Pajskr, K., Javorský, P., Diviš, M., Zubáč, J., Vlášková, K.

المساهمون: Program of Czech Research Infrastructures, Czech Science Foundation

المصدر: Physica B: Condensed Matter ; volume 483, page 94-98 ; ISSN 0921-4526

مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.physb.2015.12.015
https://api.elsevier.com/content/article/PII:S092145261530346X?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S092145261530346X?httpAccept=text/plainTest