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1
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2مؤتمر
المؤلفون: Oya, Masahiro, Okamoto, Yosuke, Nakazawa, Shinichi, Maruyama, Kotaro, Yamazaki, Yuichiro, Murakami, Shinji, Midoh, Yoshihiro, Miura, Noriyuki
المساهمون: Sendelbach, Matthew J., Schuch, Nivea G.
المصدر: Metrology, Inspection, and Process Control XXXVIII
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3دورية
المؤلفون: Sendelbach, Matthew J., Schuch, Nivea G., Oya, Masahiro, Okamoto, Yosuke, Nakazawa, Shinichi, Maruyama, Kotaro, Yamazaki, Yuichiro, Murakami, Shinji, Midoh, Yoshihiro, Miura, Noriyuki
المصدر: Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129550R-129550R-14, 12825465p
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4مؤتمرAdvanced high-voltage e-beam system combined with an enhanced D2DB for on-device overlay measurement
المؤلفون: Kang, Seul-Ki, Maruyama, Kotaro, Yamazaki, Yuichiro, Beggiato, Matteo, Veloso, Anabela, Lorusso, Gian Francesco
المساهمون: Robinson, John C., Sendelbach, Matthew J.
المصدر: Metrology, Inspection, and Process Control XXXVII
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5مؤتمر
المؤلفون: Bunday, Benjamin D., Klotzkin, Shari, Patriarche, Douglas, Ball, Yvette, Mukhtar, Maseeh, Maruyama, Kotaro, Kang, Seul-Ki, Yamazaki, Yuichiro
المساهمون: Robinson, John C., Sendelbach, Matthew J.
المصدر: Metrology, Inspection, and Process Control XXXVII
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6مؤتمر
المؤلفون: Wei, Chih-I, Ali, Rehab K., Burbine, Andrew, Jiang, Fan, Fenger, Germain, Kang, Seulki, Maruyama, Kotaro, Yamazaki, Yuichiro, Sarkar, Sujan, Beggiato, Matteo, Drissi, Youssef, Gillijns, Werner, Beral, Christophe, Halder, Sandip, Lorusso, Gian, Leray, Philippe
المساهمون: Liang, Ted, Kim, Seong-Sue
المصدر: Photomask Technology 2023
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7دورية أكاديمية
المؤلفون: Wei, Chih-I, Kang, Seulki, Das, Sayantan, Oya, Masahiro, Okamoto, Yosuke, Maruyama, Kotaro, Fenger, Germain, Latypov, Azat, Kusnadi, Ir, Khaira, Gurdaman, Yamazaki, Yuichiro, Gillijns, Werner, Halder, Sandip, Lorusso, Gian
المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology ; volume 22, issue 04 ; ISSN 2708-8340
الإتاحة: https://doi.org/10.1117/1.jmm.22.4.041603Test
https://www.spiedigitallibrary.org/journalArticle/Download?urlId=10.1117%2f1.JMM.22.4.041603Test -
8دورية أكاديمية
المصدر: Journal of Pediatric Urology ; volume 19, issue 3, page 322.e1-322.e7 ; ISSN 1477-5131
مصطلحات موضوعية: Urology, Pediatrics, Perinatology and Child Health
الإتاحة: https://doi.org/10.1016/j.jpurol.2023.02.018Test
https://api.elsevier.com/content/article/PII:S1477513123000682?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S1477513123000682?httpAccept=text/plainTest -
9مؤتمر
المؤلفون: Bunday, Benjamin D., Klotzkin, Shari, Patriarche, Douglas, Mukhtar, Maseeh, Maruyama, Kotaro, Kang, Seul-Ki, Yamazaki, Yuichiro
المساهمون: Robinson, John C., Sendelbach, Matthew J.
المصدر: Metrology, Inspection, and Process Control XXXVI
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10مؤتمر
المؤلفون: Mori, Taihei, Okamoto, Yosuke, Oya, Masahiro, Mizutani, Shinji, Nakazawa, Shinichi, Maruyama, Kotaro, Yamazaki, Yuichiro
المساهمون: Robinson, John C., Sendelbach, Matthew J.
المصدر: Metrology, Inspection, and Process Control XXXVI