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1دورية أكاديمية
المؤلفون: Cleven, A.H.G., Sannaa, G.A. al, Briaire-de Bruijn, I., Ingram, D.R., Rijn, M. van de, Rubin, B.P., Vries, M.W. de, Watson, K.L., Torres, K.E., Wang, W.L., Duinen, S.G. van, Hogendoorn, P.C.W., Lazar, A.J., Bovee, J.V.M.G.
المصدر: Modern Pathology
وصف الملف: application/pdf
العلاقة: lumc-id: 34107256; https://hdl.handle.net/1887/112587Test
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2مؤتمر
المؤلفون: Malave, C.O., Imbrie, P.K., Watson, K.L.
المصدر: FIE'99 Frontiers in Education. 29th Annual Frontiers in Education Conference. Designing the Future of Science and Engineering Education. Conference Proceedings (IEEE Cat. No.99CH37011
الإتاحة: https://doi.org/10.1109/fie.1999.840480Test
http://xplorestaging.ieee.org/ielx5/6763/18097/00840480.pdf?arnumber=840480Test -
3مؤتمر
المؤلفون: Sibai, F.N., Watson, K.L., Lu, M.
المصدر: [Proceedings 1989] IEEE International Workshop on Tools for Artificial Intelligence
الإتاحة: https://doi.org/10.1109/tai.1989.65374Test
http://xplorestaging.ieee.org/ielx2/262/2361/00065374.pdf?arnumber=65374Test -
4مؤتمر
المؤلفون: Gala, M.M.R., Watson, K.L., Ross, D.E.
المصدر: Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium
الإتاحة: https://doi.org/10.1109/vtest.1993.313327Test
http://xplorestaging.ieee.org/ielx2/464/7592/00313327.pdf?arnumber=313327Test -
5مؤتمر
المؤلفون: Vasudevan, B., Ross, D.E., Gala, M., Watson, K.L.
المصدر: Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium
الإتاحة: https://doi.org/10.1109/vtest.1993.313323Test
http://xplorestaging.ieee.org/ielx2/464/7592/00313323.pdf?arnumber=313323Test -
6مؤتمر
المؤلفون: Malave, C.O., Watson, K.L.
المصدر: Technology-Based Re-Engineering Engineering Education Proceedings of Frontiers in Education FIE'96 26th Annual Conference
الإتاحة: https://doi.org/10.1109/fie.1996.568518Test
http://xplorestaging.ieee.org/ielx3/4276/12311/00568518.pdf?arnumber=568518Test -
7مؤتمر
المؤلفون: Adams, S.G., Watson, K.L., Malave, C.O.
المصدر: Technology-Based Re-Engineering Engineering Education Proceedings of Frontiers in Education FIE'96 26th Annual Conference
الإتاحة: https://doi.org/10.1109/fie.1996.567799Test
http://xplorestaging.ieee.org/ielx3/4276/12311/00567799.pdf?arnumber=567799Test -
8مؤتمر
المؤلفون: Kim, S., Watson, K.L.
المصدر: Proceedings of 28th Southeastern Symposium on System Theory
الإتاحة: https://doi.org/10.1109/ssst.1996.493545Test
http://xplorestaging.ieee.org/ielx2/3544/10635/00493545.pdf?arnumber=493545Test -
9مؤتمر
المؤلفون: Gala, M.M.R., Utama, P., Ross, D.E., Watson, K.L.
المصدر: Proceedings of IEEE VLSI Test Symposium
الإتاحة: https://doi.org/10.1109/vtest.1994.292293Test
http://xplorestaging.ieee.org/ielx2/947/7228/00292293.pdf?arnumber=292293Test -
10مؤتمر
المؤلفون: Han, K., Watson, K.L.
المصدر: Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s
الإتاحة: https://doi.org/10.1109/autest.1991.197583Test
http://xplorestaging.ieee.org/ielx2/502/5046/00197583.pdf?arnumber=197583Test
