المؤلفون: Zeng, Yueling Jenny, Wang, Li-C., Ibbetson, Thomas

مصطلحات موضوعية: Computer Science - Computation and Language

الوصول الحر: http://arxiv.org/abs/2405.03170Test

المؤلفون: Zeng, Yueling, Wang, Li-C.

مصطلحات موضوعية: Computer Science - Computation and Language

الوصول الحر: http://arxiv.org/abs/2310.04949Test

المؤلفون: Nero, Matthew, Shan, Chuanhe, Wang, Li-C., Sumikawa, Nik

مصطلحات موضوعية: Computer Science - Machine Learning, Statistics - Machine Learning

الوصول الحر: http://arxiv.org/abs/1807.03920Test

المؤلفون: Hsieh, Kuo-Kai, Wang, Li-C.

مصطلحات موضوعية: Computer Science - Artificial Intelligence

الوصول الحر: http://arxiv.org/abs/1803.08625Test

المؤلفون: Girard, Patrick, Blanton, Shawn, Wang, Li-C.

المساهمون: Test and dEpendability of microelectronic integrated SysTems (LIRMM, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Carnegie Mellon University Pittsburgh (CMU), University of California Santa Barbara (UC Santa Barbara), University of California (UC)

المصدر: https://hal.science/hal-03990006Test ; Springer Nature Switzerland AG, 2023, ISBN 978-3-031-19638-6 ISBN 978-3-031-19639-3 (eBook). ⟨10.1007/978-3-031-19639-3⟩.

مصطلحات موضوعية: Fault diagnosis, System-on-Chips, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

العلاقة: hal-03990006; https://hal.science/hal-03990006Test

الإتاحة: https://doi.org/10.1007/978-3-031-19639-3Test
https://hal.science/hal-03990006Test

المؤلفون: Wang, Li-C., Zeng, Yueling

المصدر: Machine Learning Support for Fault Diagnosis of System-on-Chip ; page 275-312 ; ISBN 9783031196386 9783031196393

الإتاحة: https://doi.org/10.1007/978-3-031-19639-3_9Test

المؤلفون: Dupree, Matthew, Yang, Min Jian, Zeng, Yueling Jenny, Wang, Li-C.

المساهمون: National Science Foundation

المصدر: 2023 IEEE International Test Conference (ITC)

الإتاحة: https://doi.org/10.1109/itc51656.2023.00028Test
http://xplorestaging.ieee.org/ielx7/10350036/10350038/10351060.pdf?arnumber=10351060Test

المؤلفون: Wang, Li-C., Rearick, Jeff

المصدر: 2023 IEEE International Test Conference (ITC)

الإتاحة: https://doi.org/10.1109/itc51656.2023.00005Test
http://xplorestaging.ieee.org/ielx7/10350036/10350038/10351078.pdf?arnumber=10351078Test

المؤلفون: Zeng, Yueling Jenny, Yang, Min Jian, Wang, Li-C.

المساهمون: National Science Foundation

المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia)

الإتاحة: https://doi.org/10.1109/itcasia55616.2022.00016Test
http://xplorestaging.ieee.org/ielx7/9946294/9946242/09946342.pdf?arnumber=9946342Test

المؤلفون: Yang, Min Jian, Zeng, Yueling, Wang, Li-C.

المساهمون: National Science Foundation, Semi-conductor Research Corporation

المصدر: 2022 IEEE International Test Conference (ITC)

الإتاحة: https://doi.org/10.1109/itc50671.2022.00037Test
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983924.pdf?arnumber=9983924Test