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1دورية أكاديمية
المؤلفون: Grabinski, Wladek, Pavanello, Marcelo, De Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Głuszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, François, Vittoz, Eric
مصطلحات موضوعية: 620 Engineering & allied operations
وصف الملف: text
العلاقة: http://repository.londonmet.ac.uk/5412/1/FOSSEkv2p6December2019.pdfTest; Grabinski, Wladek, Pavanello, Marcelo, De Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Głuszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, François and Vittoz, Eric (2019) FOSS EKV2.6 at GitHub. Arbeitskreis Modellierung von Systemen und Parameterextraktion ( Modeling of Systems and Parameter Extraction Working Group).
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2دورية أكاديمية
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3دورية أكاديمية
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4كتاب
المؤلفون: Deniz, Zeynep Toprak, Leblebici, Yusuf, Vittoz, Eric
المصدر: IFIP International Federation for Information Processing ; VLSI-SoC: Research Trends in VLSI and Systems on Chip ; page 217-240 ; ISBN 9780387749082
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5مؤتمر
المؤلفون: Grabinski, Wladek, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Pavanello, Marcelo, Enz, Christian, Krummenacher, Francois, Vittoz, Eric, Souza, Michelly de, Tomaszewski, Daniel, Malesinska, Jola, Gluszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis
المصدر: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)
الإتاحة: https://doi.org/10.1109/essderc.2019.8901822Test
http://xplorestaging.ieee.org/ielx7/8894830/8901681/08901822.pdf?arnumber=8901822Test -
6دورية أكاديمية
المؤلفون: Grabinski, Wladek, Pavanello, Marcelo, de Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Gluszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, Francois, Vittoz, Eric
العلاقة: isi:000520409500048; http://infoscience.epfl.ch/record/276905Test
الإتاحة: https://doi.org/10.1109/ESSDERC.2019.8901822Test
http://infoscience.epfl.ch/record/276905Test -
7دورية أكاديمية
المؤلفون: Vittoz, Eric A.
المصدر: IEEE Solid-State Circuits Newsletter ; volume 13, issue 3, page 7-23 ; ISSN 1098-4232
مصطلحات موضوعية: General Medicine
الإتاحة: https://doi.org/10.1109/n-ssc.2008.4785777Test
http://xplorestaging.ieee.org/ielx5/4563671/4785770/04785777.pdf?arnumber=4785777Test -
8كتاب
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9دورية أكاديمية
المؤلفون: Brinson, Mike, Grabinski, Wladek, Pavanello, Marcelo, De Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Głuszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, François, Vittoz, Eric
مصطلحات موضوعية: 620 Engineering & allied operations
وصف الملف: text
العلاقة: https://repository.londonmet.ac.uk/5347/1/FOSS_EKV26_Draft.pdfTest; Brinson, Mike, Grabinski, Wladek, Pavanello, Marcelo, De Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Głuszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, François and Vittoz, Eric (2019) FOSS EKV2.6 Verilog-A Compact MOSFET Model. Proceedings of ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC). pp. 190-193. ISSN ISBN: 978-1-7281-1539-9
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