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1تقرير
المؤلفون: Dumont, Mathieu, Moellic, Pierre-Alain, Viera, Raphael, Dutertre, Jean-Max, Bernhard, Rémi
مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Artificial Intelligence
الوصول الحر: http://arxiv.org/abs/2105.01403Test
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2دورية أكاديمية
المؤلفون: Ebrahimabadi, Mohammad, Mehjabin, Suhee Sanjana, Viera, Raphael, Guilley, Sylvain, Danger, Jean-Luc, Dutertre, Jean-Max, Karimi, Naghmeh
المساهمون: University of Maryland Baltimore County (UMBC), University of Maryland System, Ecole Nationale Supérieure des Mines de St Etienne (ENSM ST-ETIENNE), Secure-IC S.A.S, Institut Mines-Télécom Paris (IMT), Secure and Safe Hardware (SSH), Laboratoire Traitement et Communication de l'Information (LTCI), Institut Mines-Télécom Paris (IMT)-Télécom Paris-Institut Mines-Télécom Paris (IMT)-Télécom Paris, Département Communications & Electronique (COMELEC), Télécom ParisTech
المصدر: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://telecom-paris.hal.science/hal-04260842Test ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, pp.1-1. ⟨10.1109/TCAD.2023.3322623⟩.
مصطلحات موضوعية: Sensors, Circuit faults, Sensor phenomena and characterization, Transient analysis, Clocks, Logic gates, Voltage, [SPI]Engineering Sciences [physics]
العلاقة: hal-04260842; https://telecom-paris.hal.science/hal-04260842Test; https://telecom-paris.hal.science/hal-04260842/documentTest; https://telecom-paris.hal.science/hal-04260842/file/TCAD_2023_Laser.pdfTest
الإتاحة: https://doi.org/10.1109/TCAD.2023.3322623Test
https://telecom-paris.hal.science/hal-04260842Test
https://telecom-paris.hal.science/hal-04260842/documentTest
https://telecom-paris.hal.science/hal-04260842/file/TCAD_2023_Laser.pdfTest -
3دورية أكاديمية
المؤلفون: Viera, Raphael, Dutertre, Jean-Max, Silva Lima, Rodrigo, Pommies, Matthieu, Bertrand, Anthony
المصدر: Journal of Cryptographic Engineering; Jun2024, Vol. 14 Issue 2, p207-221, 15p
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4مؤتمر
المؤلفون: da Cruz, William Souza, Viera, Raphael, Rigaud, Jean-Baptiste, Hubert, Guillaume, Dutertre, Jean-Max
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT), DPHY, ONERA, Université de Toulouse Toulouse, ONERA-PRES Université de Toulouse, IEEE
المصدر: IOLTS 2022 - IEEE 28th International Symposium on On-Line Testing and Robust System Design ; https://hal.science/hal-04134425Test ; IOLTS 2022 - IEEE 28th International Symposium on On-Line Testing and Robust System Design, IEEE, Sep 2022, Turin, Italy. pp.1-5, ⟨10.1109/IOLTS56730.2022.9897189⟩ ; https://ieeexplore.ieee.org/document/9897189Test
مصطلحات موضوعية: Laser fault injection, Electrical simulation, Electrical model, SRAM, Voltage transient, [SPI]Engineering Sciences [physics], [PHYS]Physics [physics]
العلاقة: hal-04134425; https://hal.science/hal-04134425Test; https://hal.science/hal-04134425/documentTest; https://hal.science/hal-04134425/file/DPHY22153.1687262187_postprint%281%29.pdfTest
الإتاحة: https://doi.org/10.1109/IOLTS56730.2022.9897189Test
https://hal.science/hal-04134425Test
https://hal.science/hal-04134425/documentTest
https://hal.science/hal-04134425/file/DPHY22153.1687262187_postprint%281%29.pdfTest -
5دورية أكاديمية
المؤلفون: Ebrahimabadi, Mohammad, Mehjabin, Suhee Sanjana, Viera, Raphael, Guilley, Sylvain, Danger, Jean-Luc, Dutertre, Jean-Max, Karimi, Naghmeh
المساهمون: French National Research Agency, National Science Foundation CAREER Award, Innovation Programme through ALLEGRO Project
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; volume 43, issue 3, page 774-787 ; ISSN 0278-0070 1937-4151
الإتاحة: https://doi.org/10.1109/tcad.2023.3322623Test
https://ieeexplore.ieee.org/ielam/43/10440374/10273624-aam.pdfTest
http://xplorestaging.ieee.org/ielx7/43/10440374/10273624.pdf?arnumber=10273624Test -
6مؤتمر
المؤلفون: Souza da Cruz, William, Viera, Raphael, Dutertre, Jean-Max, Rigaud, Jean-Baptiste, Hubert, Guillaume
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), DPHY, ONERA, Université de Toulouse Toulouse, ONERA-PRES Université de Toulouse, This research has been supported by a PhD grant from the French region PACA (Emplois Jeunes Doctorants)
المصدر: 2021 IEEE 30th Asian Test Symposium (ATS)
https://hal.science/hal-03695186Test
2021 IEEE 30th Asian Test Symposium (ATS), Nov 2021, Virtual, Japan. ⟨10.1109/ATS52891.2021.00028⟩مصطلحات موضوعية: Laser fault injection, IR-drop, Electrical simulation, [SPI]Engineering Sciences [physics], [PHYS]Physics [physics]
العلاقة: hal-03695186; https://hal.science/hal-03695186Test; https://hal.science/hal-03695186/documentTest; https://hal.science/hal-03695186/file/DPHY22083.1655213270_postprint.pdfTest
الإتاحة: https://doi.org/10.1109/ATS52891.2021.00028Test
https://hal.science/hal-03695186Test
https://hal.science/hal-03695186/documentTest
https://hal.science/hal-03695186/file/DPHY22083.1655213270_postprint.pdfTest -
7مؤتمر
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT), ANR program PICTURE (AAPG2020), ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010), European Project: 876038,H2020-ECSEL-2019-1-IA,InSecTT
المصدر: 2021 IEEE 7th World Forum on Internet of Things (WF-IoT)
https://cea.hal.science/cea-04176725Test
2021 IEEE 7th World Forum on Internet of Things (WF-IoT), Jun 2021, New Orleans, United States. ⟨10.1109/WF-IoT51360.2021.9595075⟩مصطلحات موضوعية: [INFO.INFO-AI]Computer Science [cs]/Artificial Intelligence [cs.AI], [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [STAT.ML]Statistics [stat]/Machine Learning [stat.ML]
جغرافية الموضوع: New Orleans, United States
العلاقة: info:eu-repo/semantics/altIdentifier/arxiv/2105.01403; info:eu-repo/grantAgreement//876038/EU/Intelligent Secure Trustable Things/InSecTT; cea-04176725; https://cea.hal.science/cea-04176725Test; https://cea.hal.science/cea-04176725/documentTest; https://cea.hal.science/cea-04176725/file/An_Overview_of_Laser_Injection_against_Embedded_Neural_Network_Models.pdfTest; ARXIV: 2105.01403
الإتاحة: https://doi.org/10.1109/WF-IoT51360.2021.9595075Test
https://cea.hal.science/cea-04176725Test
https://cea.hal.science/cea-04176725/documentTest
https://cea.hal.science/cea-04176725/file/An_Overview_of_Laser_Injection_against_Embedded_Neural_Network_Models.pdfTest -
8مؤتمر
المساهمون: Ecole Nationale Supérieure des Mines de St Etienne
المصدر: 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS)
https://hal.archives-ouvertes.fr/hal-03360634Test
2021 19th IEEE International New Circuits and Systems Conference (NEWCAS), Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462773⟩مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
العلاقة: hal-03360634; https://hal.archives-ouvertes.fr/hal-03360634Test; https://hal.archives-ouvertes.fr/hal-03360634/documentTest; https://hal.archives-ouvertes.fr/hal-03360634/file/hal_NEWCAS_2021_Permanent_Laser_Fault_Injection_into_the_Flash_Memory_of_a_Microcontroller.pdfTest
الإتاحة: https://doi.org/10.1109/NEWCAS50681.2021.9462773Test
https://hal.archives-ouvertes.fr/hal-03360634Test
https://hal.archives-ouvertes.fr/hal-03360634/documentTest
https://hal.archives-ouvertes.fr/hal-03360634/file/hal_NEWCAS_2021_Permanent_Laser_Fault_Injection_into_the_Flash_Memory_of_a_Microcontroller.pdfTest -
9مؤتمر
المؤلفون: Possamai Bastos, Rodrigo, Dutertre, Jean-Max, Garay Trindade, Matheus, Camponogara-Viera, Raphael Andreoni, Potin, Olivier, Rey, Solenne, Cheymol, B., Baylac, Maud
المساهمون: Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT), Laboratoire de Physique Subatomique et de Cosmologie (LPSC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: Conference on Radiation Effects on Components and Systems (RADECS 2019) ; https://hal.science/hal-02299066Test ; Conference on Radiation Effects on Components and Systems (RADECS 2019), Sep 2019, Montpellier, France
مصطلحات موضوعية: PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
جغرافية الموضوع: Montpellier, France
العلاقة: hal-02299066; https://hal.science/hal-02299066Test
الإتاحة: https://hal.science/hal-02299066Test
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10دورية أكاديميةSimulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection
المؤلفون: Camponogara-Viera, Raphael Andreoni, Maurine, Philippe, Dutertre, Jean-Max, Possamai Bastos, Rodrigo
المساهمون: Laboratoire de Radio-Fréquence et d'Intégration de Circuits (RFIC-Lab ), Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Université Grenoble Alpes (UGA), Smart Integrated Electronic Systems (SmartIES), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT)
المصدر: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal.science/hal-02299068Test ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020, 39 (6), pp.1231-1244. ⟨10.1109/TCAD.2019.2928972⟩.
مصطلحات موضوعية: Methodologies for EDA, Hardware security implementation, Laser fault injection, Electrical simulation, Hardware security, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
العلاقة: hal-02299068; https://hal.science/hal-02299068Test; https://hal.science/hal-02299068/documentTest; https://hal.science/hal-02299068/file/HAL_Simulation_and_Experimental_Demonstration_of_the_Importance_of_IR_Drops_During_Laser_Fault_Injection.pdfTest
الإتاحة: https://doi.org/10.1109/TCAD.2019.2928972Test
https://hal.science/hal-02299068Test
https://hal.science/hal-02299068/documentTest
https://hal.science/hal-02299068/file/HAL_Simulation_and_Experimental_Demonstration_of_the_Importance_of_IR_Drops_During_Laser_Fault_Injection.pdfTest
