المؤلفون: Schurz, Gerhard, author

المصدر: Optimality Justifications : New Foundations for Epistemology, 2024, ill.

الإتاحة: https://doi.org/10.1093/oso/9780198887546.003.0010Test

المؤلفون: Shylashree N, Satish Tunga, Shaik Mahammad Ameer Afridi, Sridhar V

المصدر: e-Prime: Advances in Electrical Engineering, Electronics and Energy, Vol 8, Iss , Pp 100538- (2024)

مصطلحات موضوعية: Design for testability, Clock control, Test data register, Launch on capture, Launch on shift, Dynamic power, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S2772671124001207Test; https://doaj.org/toc/2772-6711Test

الوصول الحر: https://doaj.org/article/3c2410bbe02f4647bc2e9ccdf242a469Test

المؤلفون: Annavarapu Praneeth, Govardhani Immadi, V. S. V. Prabhakar, Venkata Narayana Madhava Reddy

المصدر: Engineering, Technology & Applied Science Research, Vol 14, Iss 3 (2024)

مصطلحات موضوعية: USB, JTAG, scan chains, logic vision, Design-for-Testability (DFT), Logic Built-In Self-Test (LBIST), Engineering (General). Civil engineering (General), TA1-2040, Technology (General), T1-995, Information technology, T58.5-58.64

وصف الملف: electronic resource

العلاقة: https://etasr.com/index.php/ETASR/article/view/7163Test; https://doaj.org/toc/2241-4487Test; https://doaj.org/toc/1792-8036Test

الوصول الحر: https://doaj.org/article/f3fa369be970464586b099605b11ee36Test

المؤلفون: Luca Guglielmo, Leonardo Mariani, Giovanni Denaro

المصدر: IEEE Access, Vol 12, Pp 63904-63916 (2024)

مصطلحات موضوعية: Software testability, software testing, automatic test generation, mutation analysis, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/10518042Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/f1da0e1cd8a14c3aa10922e08ad9561bTest

المؤلفون: Jani Raerinne

المصدر: Ecology and Evolution, Vol 14, Iss 3, Pp n/a-n/a (2024)

مصطلحات موضوعية: ecology, falsification, Popper, strong inference, testability, Ecology, QH540-549.5

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/2045-7758Test

الوصول الحر: https://doaj.org/article/3650e46c72f247bfa02f4a241848f397Test

المؤلفون: Guglielmo, Luca, Mariani, Leonardo, Denaro, Giovanni

المساهمون: Guglielmo, L, Mariani, L, Denaro, G

مصطلحات موضوعية: automatic test generation, mutation analysi, Software testability, software testing, INF/01 - INFORMATICA

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:001221496400001; volume:12; firstpage:63904; lastpage:63916; numberofpages:13; journal:IEEE ACCESS; https://hdl.handle.net/10281/487060Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85192192830

الإتاحة: https://doi.org/10.1109/access.2024.3396625Test
https://hdl.handle.net/10281/487060Test

المؤلفون: Alnatheer, Suleman, Ahmed, Mohammed Altaf

المساهمون: Prince Sattam bin Abdulaziz University, Al-Kharj, Saudi Arabia

المصدر: Indonesian Journal of Electrical Engineering and Computer Science; Vol 35, No 1: July 2024; 90-101 ; 2502-4760 ; 2502-4752 ; 10.11591/ijeecs.v35.i1

مصطلحات موضوعية: Electronics, VLSI, Design for testability, Memory test, BIST, ADKNN, BIST and BISR, Built-in redundancy analysis, Memory under test, NBOA, System-on-chips

وصف الملف: application/pdf

العلاقة: https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435/18393Test; https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435Test

الإتاحة: https://doi.org/10.11591/ijeecs.v35.i1.pp90-101Test
https://doi.org/10.11591/ijeecs.v35.i1Test
https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435Test

المؤلفون: Lupeng Chen, Jian Liu, Zhongmei Pan, Zhihua Zhang

المصدر: Frontiers in Energy Research, Vol 11 (2023)

مصطلحات موضوعية: distribution lines, parameter estimation, testability analysis, measurement data, elitist searching approach, General Works

وصف الملف: electronic resource

العلاقة: https://www.frontiersin.org/articles/10.3389/fenrg.2023.1249782/fullTest; https://doaj.org/toc/2296-598XTest

الوصول الحر: https://doaj.org/article/929706438ca949889bea958ad74c55b2Test

المؤلفون: Hyun-Jae Choi, Heung-Seok Chae

المصدر: IEEE Access, Vol 11, Pp 98469-98485 (2023)

مصطلحات موضوعية: Coverage prediction, metrics, regression, software testability, testing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/10242100Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/d51a67a5e1aa40d7862a2b894db6b92fTest

المؤلفون: Hendrik P. Nel, Fortunato Carlos Dualibe, Tinus Stander

المصدر: IEEE Open Journal of Circuits and Systems, Vol 4, Pp 70-84 (2023)

مصطلحات موضوعية: Built-in self-test, circuit simulation, CMOS, design for testability, LNA, microwave integrated circuits, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/10002329Test/; https://doaj.org/toc/2644-1225Test

الوصول الحر: https://doaj.org/article/fc9c8e8e603c40a692be84e985220816Test