المؤلفون: Arjona, Rosario, Baturone Castillo, María Iluminada

المساهمون: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo

مصطلحات موضوعية: Fingerprint recognition, Physical unclonable functions, PUFs, Electronic systems on chip

العلاقة: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society (2016), pp. 4731-4736.; https://dx.doi.org/10.1109/IECON.2016.7793033Test; IEEE Industrial Electronics Society; https://idus.us.es/handle//11441/153058Test

الإتاحة: https://doi.org/10.1109/IECON.2016.7793033Test
https://idus.us.es/handle//11441/153058Test

المؤلفون: Шкіль, Олександр, Рахліс, Дарія, Філіпенко, Інна, Корнієнко, Валентин, Рожнова, Тетяна

المصدر: INNOVATIVE TECHNOLOGIES AND SCIENTIFIC SOLUTIONS FOR INDUSTRIES; No. 1 (27) (2024): Innovative Technologies and Scientific Solutions for Industries; 192-203 ; Современное состояние научных исследований и технологий в промышленности; № 1 (27) (2024): Сучасний стан наукових досліджень та технологій в промисловості; 192-203 ; СУЧАСНИЙ СТАН НАУКОВИХ ДОСЛІДЖЕНЬ ТА ТЕХНОЛОГІЙ В ПРОМИСЛОВОСТІ; № 1 (27) (2024): Сучасний стан наукових досліджень та технологій в промисловості; 192-203 ; 2524-2296 ; 2522-9818

مصطلحات موضوعية: embedded systems, systems-on-chip, FPGA, C programming language, digital signal processing algorithms, audio signals, digital filters, вбудовані системи, системи на кристалі, мова програмування С, алгоритми цифрового оброблення сигналів, аудіосигнали, цифрові фільтри

وصف الملف: application/pdf

العلاقة: https://journals.uran.ua/itssi/article/view/301058/293269Test; https://journals.uran.ua/itssi/article/view/301058Test

الإتاحة: https://journals.uran.ua/itssi/article/view/301058Test

المؤلفون: Guillermo Gonzalez-Martinez, Remberto Sandoval-Arechiga, Luis Octavio Solis-Sanchez, Laura Garcia-Luciano, Salvador Ibarra-Delgado, Juan Ramon Solis-Escobedo, Jose Ricardo Gomez-Rodriguez, Viktor Ivan Rodriguez-Abdala

المصدر: Micromachines, Vol 15, Iss 5, p 577 (2024)

مصطلحات موضوعية: multi-processor system-on-chip, MPSoC management, self-awareness, self-aware cyber-physical systems-on-chip, software-defined networks-on-chip, survey, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/2072-666X/15/5/577Test; https://doaj.org/toc/2072-666XTest

الوصول الحر: https://doaj.org/article/1a27e340961540f1b31cc80e35401982Test

المؤلفون: Milan, Raphaële, Lagadec, Loïc, Bollengier, Théotime, Bossuet, Lilian, Teodorov, Ciprian

المساهمون: Laboratoire Hubert Curien (LHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), École Nationale Supérieure de Techniques Avancées Bretagne (ENSTA Bretagne), Equipe Hardware ARchitectures and CAD tools (Lab-STICC_ARCAD), Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance (Lab-STICC), École Nationale d'Ingénieurs de Brest (ENIB)-Université de Bretagne Sud (UBS)-Université de Brest (UBO)-École Nationale Supérieure de Techniques Avancées Bretagne (ENSTA Bretagne)-Institut Mines-Télécom Paris (IMT)-Centre National de la Recherche Scientifique (CNRS)-Université Bretagne Loire (UBL)-IMT Atlantique (IMT Atlantique), Institut Mines-Télécom Paris (IMT)-École Nationale d'Ingénieurs de Brest (ENIB)-Université de Bretagne Sud (UBS)-Université de Brest (UBO)-École Nationale Supérieure de Techniques Avancées Bretagne (ENSTA Bretagne)-Institut Mines-Télécom Paris (IMT)-Centre National de la Recherche Scientifique (CNRS)-Université Bretagne Loire (UBL)-IMT Atlantique (IMT Atlantique), Institut Mines-Télécom Paris (IMT), Equipe Processes for Safe and Secure Software and Systems (Lab-STICC_P4S)

المصدر: Rapid System Prototyping ; https://hal.science/hal-04373771Test ; Rapid System Prototyping, Sep 2023, Hambourg, Germany

مصطلحات موضوعية: MBSE - Model-based systems engineering, System on Chip - SOC, Security Architecture, Security CAD Tool Model-Based Engineering Hardware Systems-on-Chip, Security, CAD Tool, Model-Based Engineering, Hardware, Systems-on-Chip, [INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR]

جغرافية الموضوع: Hambourg, Germany

العلاقة: hal-04373771; https://hal.science/hal-04373771Test; https://hal.science/hal-04373771/documentTest; https://hal.science/hal-04373771/file/RSP_2023.pdfTest

الإتاحة: https://hal.science/hal-04373771Test
https://hal.science/hal-04373771/documentTest
https://hal.science/hal-04373771/file/RSP_2023.pdfTest

المؤلفون: Grignani, Wesley, Santos, Douglas, Dilillo, Luigi, Viel, Felipe, Melo, Douglas

المساهمون: Laboratory of Embedded and Distributed Systems UNIVALI (LEDS), Universidade do Vale do Itajaí (UNIVALI), Institut d’Electronique et des Systèmes (IES), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Radiations et composants (RADIAC), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Fiabilité et Systèmes en Environnements Contraints (FSEC), Space Technology Research Laboratory UFSC (SpaceLab), Universidade Federal de Santa Catarina = Federal University of Santa Catarina Florianópolis (UFSC)

المصدر: DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal.science/hal-04266881Test ; DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩ ; http://www.dfts.orgTest/

مصطلحات موضوعية: Systems-on-Chip, Hardware Accelerators, Image Processing, Hyperspectral Images, CCSDS 123.0-B-2, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

جغرافية الموضوع: Juan-les-Pins, France

العلاقة: hal-04266881; https://hal.science/hal-04266881Test; https://hal.science/hal-04266881/documentTest; https://hal.science/hal-04266881/file/2023___DFTS__A_Low_Cost_Hardware_Accelerator_for_CCSDS_123_Lossless_Hyperspectral_Image_Compression___HAL_Version.pdfTest

الإتاحة: https://doi.org/10.1109/DFT59622.2023.10313567Test
https://hal.science/hal-04266881Test
https://hal.science/hal-04266881/documentTest
https://hal.science/hal-04266881/file/2023___DFTS__A_Low_Cost_Hardware_Accelerator_for_CCSDS_123_Lossless_Hyperspectral_Image_Compression___HAL_Version.pdfTest

المؤلفون: Mezger, Benjamin, Santos, Douglas, Dilillo, Luigi, Melo, Douglas

المساهمون: Laboratory of Embedded and Distributed Systems UNIVALI (LEDS), Universidade do Vale do Itajaí (UNIVALI), Institut d’Electronique et des Systèmes (IES), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Radiations et composants (RADIAC), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Fiabilité et Systèmes en Environnements Contraints (FSEC)

المصدر: DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal.science/hal-04266886Test ; DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩ ; http://www.dfts.orgTest/

مصطلحات موضوعية: Systems-on-Chip, Fault Tolerance, Software Reliability, RISC-V, FreeRTOS, [INFO.INFO-OS]Computer Science [cs]/Operating Systems [cs.OS]

جغرافية الموضوع: Juan-Les-Pins, France

العلاقة: hal-04266886; https://hal.science/hal-04266886Test; https://hal.science/hal-04266886/documentTest; https://hal.science/hal-04266886/file/2023___DFTS___RTOS_FT___HAL_Version.pdfTest

الإتاحة: https://doi.org/10.1109/DFT59622.2023.10313566Test
https://hal.science/hal-04266886Test
https://hal.science/hal-04266886/documentTest
https://hal.science/hal-04266886/file/2023___DFTS___RTOS_FT___HAL_Version.pdfTest

المؤلفون: She, Jinhua, Guzmán-Miranda, Hipólito, Huang, Victor, Chen, Allen C., Karnouskos, Stamatis, Dunai, Larisa, Ma, Chengbin, Tisan, Alin, Yokota, Sho

المساهمون: Universidad de Sevilla. Departamento de Ingeniería Electrónica, Universidad de Sevilla. TIC192: Ingeniería Electrónica, Sociedad Japonesa para la Promoción de la Ciencia

مصطلحات موضوعية: Cross-disciplinary technology, Electronic systems on chip, Human factors, Resilience and security for industrial applications, Professional education, Technology ethics, Standards, Sustainable society

العلاقة: IEEE Open Journal of the Industrial Electronics Society, 3, 375-391.; 22H03998; https://ieeexplore.ieee.org/document/9779906Test; https://idus.us.es/handle//11441/147265Test

الإتاحة: https://idus.us.es/handle//11441/147265Test

المؤلفون: Nawaz Gareeb, Charan Chhagan

المصدر: ITM Web of Conferences, Vol 54, p 02010 (2023)

مصطلحات موضوعية: systems-on-chip, soc, regulator, ldo, noise, mixed-signals, power supply rejection, Information technology, T58.5-58.64

العلاقة: https://www.itm-conferences.org/articles/itmconf/pdf/2023/04/itmconf_I3cs2023_02010.pdfTest; https://doaj.org/toc/2271-2097Test; https://doaj.org/article/cfebb57a96be49e88057227581fa599bTest

الإتاحة: https://doi.org/10.1051/itmconf/20235402010Test
https://doaj.org/article/cfebb57a96be49e88057227581fa599bTest

المؤلفون: Jinhua She, Hipolito Guzman-Miranda, Victor Huang, Allen C. Chen, Stamatis Karnouskos, Larisa Dunai, Chengbin Ma, Alin Tisan, Sho Yokota

المصدر: IEEE Open Journal of the Industrial Electronics Society, Vol 3, Pp 375-391 (2022)

مصطلحات موضوعية: Cross-disciplinary technology, electronic systems on chip, human factors, resilience and security for industrial applications, professional education, technology ethics, Electronics, TK7800-8360, Industrial engineering. Management engineering, T55.4-60.8

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/9779906Test/; https://doaj.org/toc/2644-1284Test

الوصول الحر: https://doaj.org/article/cb5247480dde42d88d2055dbc189bdb6Test

المؤلفون: Mere, Maxime, Jouault, Frederic, Pallardy, Loic, Perdriau, Richard

المساهمون: Institut d'Électronique et des Technologies du numéRique (IETR), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)-Nantes Université - pôle Sciences et technologie, Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ), STMicroelectronics, École supérieure d'électronique de l'ouest Angers (ESEO)

المصدر: 22nd IEEE International Conference on Software Quality, Reliability and Security (QRS)
https://hal.science/hal-04115295Test
22nd IEEE International Conference on Software Quality, Reliability and Security (QRS), Dec 2022, Guangzhou, China. ⟨10.1109/QRS-C57518.2022.00020⟩

مصطلحات موضوعية: Blockchain, Trust Relationships, Re-configurable Systems-on-Chip, [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Guangzhou, China

العلاقة: hal-04115295; https://hal.science/hal-04115295Test; https://hal.science/hal-04115295v2/documentTest; https://hal.science/hal-04115295v2/file/BSC%25202022.pdfTest

الإتاحة: https://doi.org/10.1109/QRS-C57518.2022.00020Test
https://hal.science/hal-04115295Test
https://hal.science/hal-04115295v2/documentTest
https://hal.science/hal-04115295v2/file/BSC%25202022.pdfTest