المؤلفون: Nechay, A. N., Chkhalo, N. I., Drozdov, M. N., Garakhin, S. A., Pariev, D. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Vainer, Yu. A., Meltchakov, E., Delmotte, F.

المساهمون: Russian Foundation for Basic Research, Russian Science Foundation

المصدر: AIP Advances ; volume 8, issue 7 ; ISSN 2158-3226

الإتاحة: https://doi.org/10.1063/1.5007008Test

المؤلفون: Chkhalo, N. I., Garakhin, S. A., Kumar, N., Nikolaev, K. V., Polkovnikov, V. N., Rogachev, A., Svechnikov, M. V., Tatarsky, D. A., Yakunin, S. N.

المصدر: Journal of Applied Crystallography; Dec2022, Vol. 55 Issue 6, p1455-1464, 10p

مصطلحات موضوعية: X-ray photoelectron spectroscopy, MULTILAYERS, X-ray reflection, SILICON films, SMALL-angle X-ray scattering

المؤلفون: null Chkhalo N. I., null Chernov V. A., null Sorokoletov D. S., null Svechnikov M. V., null Svetokhin S. S, null Salashchenko N. N., null Rakshun Ya. V., null Polkovnikov V. N., null Pleshkov R. S., null Pestov A. E., null Pershin D. D., null Kriventsov V. V., null Zorina M. V., null Dar'in F. A., null Garakhin S. A., null Akhsakhalyan A. A.

المصدر: Technical Physics. 92:2085

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ad8f77502722116fc2b7fce6f8fc3631Test
https://doi.org/10.21883/tp.2022.13.52227.128-21Test

المؤلفون: Garakhin, S. A., Chkhalo, N. I., Kas’kov, I. A., Lopatin, A. Ya., Malyshev, I. V., Nechay, A. N., Pestov, A. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Tsybin, N. N., Zabrodin, I. G., Zuev, S. Yu.

المساهمون: Russian Foundation for Basic Research, The State Assignment for IPM RAS

المصدر: Review of Scientific Instruments ; volume 91, issue 6 ; ISSN 0034-6748 1089-7623

الإتاحة: https://doi.org/10.1063/1.5144489Test

المؤلفون: Barysheva, M M, Garakhin, S A, Zuev, S Yu, Polkovnikov, V N, Salashchenko, N N, Svechnikov, M V, Chkhalo, N I, Yulin, S

المصدر: Quantum Electronics ; volume 49, issue 4, page 380-385 ; ISSN 1063-7818 1468-4799

الإتاحة: https://doi.org/10.1070/qel16990Test
http://stacks.iop.org/1063-7818/49/i=4/a=380/pdfTest
http://stacks.iop.org/1063-7818/49/i=4/a=380?key=crossref.a77cec5ac6188c42807df75826674350Test

المؤلفون: Goray, L. I., Pirogov, E. V., Svechnikov, M. V., Sobolev, M. S., Polyakov, N. K., Gerchikov, L. G., Nikitina, E. V., Dashkov, A. S., Borisov, M. M., Yakunin, S. N., Bouravleuv, A. D.

المصدر: Technical Physics Letters; Oct2021, Vol. 47 Issue 10, p757-760, 4p

مصطلحات موضوعية: X-ray reflectometry, SUPERLATTICES, AUDITING standards, GALLIUM arsenide, SYNCHROTRONS, EPITAXY

المؤلفون: Goray, L. I., Pirogov, E. V., Sobolev, M. S., Polyakov, N. K., Dashkov, A. S., Svechnikov, M. V., Bouravleuv, A. D.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1822-1827, 6p

مصطلحات موضوعية: X-ray reflectometry, SYNCHROTRON radiation sources, EPITAXY, DOPED semiconductor superlattices, QUANTUM wells, MOLECULAR beam epitaxy, STANDARD deviations

المؤلفون: Polkovnikov, V. N., Garakhin, S. A., Kvashennikov, D. S., Malyshev, I. V., Salashchenko, N. N., Svechnikov, M. V., Smertin, R. M., Chkhalo, N. I.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1809-1813, 5p

مصطلحات موضوعية: REFLECTANCE, MIRRORS, ELECTRIC power, REFLECTIONS

المؤلفون: Garakhin, S. A., Barysheva, M. M., Vishnyakov, E. A., Zuev, S. Yu., Kirichenko, A. S., Kuzin, S. V., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Chkhalo, N. I.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1792-1799, 8p

مصطلحات موضوعية: MIRRORS, OBSERVATORIES, REFLECTIONS, FACILITIES

المؤلفون: Pleshkov, R. S., Zuev, S. Yu., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Chkhalo, N. I., Jonnard, P.

المصدر: Technical Physics; Nov2020, Vol. 65 Issue 11, p1786-1791, 6p

مصطلحات موضوعية: SILICON films, MIRRORS, GRAZING incidence, REFLECTANCE, BUFFER layers