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1دورية أكاديمية
المؤلفون: Thomas J. Ha, Peter G. Y. Zhang, Remi Robert, Joanna Yeung, Douglas J. Swanson, Anthony Mathelier, Wyeth W. Wasserman, Sujin Im, Masayoshi Itoh, Hideya Kawaji, Timo Lassmann, Carsten O. Daub, Erik Arner, The FANTOM Consortium, Piero Carninci, Yoshihide Hayashizaki, Alistair R. R. Forrest, Daniel Goldowitz
المصدر: BMC Genomics, Vol 20, Iss 1, Pp 1-17 (2019)
مصطلحات موضوعية: Cerebellar development, Transcriptome, HeliScopeCAGE, Motif activity, Transfactivity, Transcription factors, Biotechnology, TP248.13-248.65, Genetics, QH426-470
وصف الملف: electronic resource
العلاقة: http://link.springer.com/article/10.1186/s12864-019-6063-9Test; https://doaj.org/toc/1471-2164Test
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2دورية أكاديمية
المؤلفون: Kiron Park, Keonho Park, Sujin Im, SeungEui Hong, Kwonjoo Son, Jongwook Jeon
المصدر: Electronics; Volume 8; Issue 9; Pages: 942
مصطلحات موضوعية: reliability, time-dependent dielectric breakdown (TDDB), degradation, oxide dielectric, dielectric breakdown
وصف الملف: application/pdf
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المؤلفون: Keonho Park, Jongwook Jeon, Sujin Im, SeungEui Hong, Kwonjoo Son, Kiron Park
المصدر: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 20:19-28
مصطلحات موضوعية: Materials science, Dielectric strength, Electrical and Electronic Engineering, Reliability (statistics), Electronic, Optical and Magnetic Materials, Reliability engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::cbd1c873656ae183bbe92448ebd042f6Test
https://doi.org/10.5573/jsts.2020.20.1.019Test -
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المؤلفون: Remi Robert, Dan Goldowitz, Hideya Kawaji, Wyeth W. Wasserman, Peter G. Zhang, Erik Arner, Yoshihide Hayashizaki, Carsten O. Daub, Sujin Im, Timo Lassmann, Thomas J. Ha, Alistair R. R. Forrest, Anthony Mathelier, Joanna Yeung, Masayoshi Itoh, Douglas J. Swanson, Piero Carninci
المصدر: BMC Genomics
BMC Genomics, Vol 20, Iss 1, Pp 1-17 (2019)مصطلحات موضوعية: Cerebellum, lcsh:QH426-470, HeliScopeCAGE, Transcription, Genetic, lcsh:Biotechnology, Gene regulatory network, Motif activity, Regulatory Factor X Transcription Factors, Computational biology, Biology, Transcriptome, 03 medical and health sciences, Mice, 0302 clinical medicine, lcsh:TP248.13-248.65, Genetics, medicine, Transcription factors, Animals, Atf4, Nucleotide Motifs, Promoter Regions, Genetic, Transcription factor, 030304 developmental biology, Rfx3, 0303 health sciences, Gene knockdown, Transfactivity, Gene Expression Profiling, Gene Expression Regulation, Developmental, Promoter, Cerebellar development, Activating Transcription Factor 4, Cap analysis gene expression, Mice, Inbred C57BL, lcsh:Genetics, medicine.anatomical_structure, RNAi, Gene Knockdown Techniques, Scrt2, RFX3, 030217 neurology & neurosurgery, Biotechnology, Research Article
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c21f23bc0f3a633e83b679ca39eb21c0Test
http://europepmc.org/articles/PMC6751898Test -
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المؤلفون: Ha, Thomas, Zhang, Peter, Robert, Remi, Yeung, Joanna, Swanson, Douglas, Mathelier, Anthony, Wyeth Wasserman, Sujin Im, Itoh, Masayoshi, Hideya Kawaji, Lassmann, Timo, Daub, Carsten, Arner, Erik, Carninci, Piero, Hayashizaki, Yoshihide, Forrest, Alistair, Goldowitz, Daniel
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::539794e48919ab2b9049495f1545112eTest
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المؤلفون: Sujin Im, Sherri Hayden, Ging-Yuek Robin Hsiung, Mannie Fan
المصدر: Alzheimer's & Dementia. 14
مصطلحات موضوعية: medicine.medical_specialty, Epidemiology, business.industry, Health Policy, Memory clinic, Psychiatry and Mental health, Cellular and Molecular Neuroscience, Developmental Neuroscience, Physical therapy, medicine, Neurology (clinical), Neuropsychological testing, Geriatrics and Gerontology, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8f0dc8eebb83d0b8d9764ab555bde870Test
https://doi.org/10.1016/j.jalz.2018.06.520Test -
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المؤلفون: Kwonjoo Son, Keonho Park, SeungEui Hong, Sujin Im, Jongwook Jeon, Kiron Park
المصدر: Electronics, Vol 8, Iss 9, p 942 (2019)
Electronics
Volume 8
Issue 9مصطلحات موضوعية: time-dependent dielectric breakdown (TDDB), Materials science, Dependency (UML), Computer Networks and Communications, lcsh:TK7800-8360, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, Reliability (semiconductor), 0103 physical sciences, Electrical and Electronic Engineering, degradation, 010302 applied physics, reliability, dielectric breakdown, Dielectric strength, lcsh:Electronics, Mechanics, 021001 nanoscience & nanotechnology, Anode, oxide dielectric, Hardware and Architecture, Control and Systems Engineering, Percolation, Signal Processing, Degradation (geology), Development (differential geometry), 0210 nano-technology
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06715d44fcf0e33ac3e73faf40d0493eTest
https://doi.org/10.3390/electronics8090942Test