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1
المؤلفون: Swati Dubey, Subhash Chouhan, Soumi Ghosh
المصدر: Radiation Effects and Defects in Solids. 176:517-528
مصطلحات موضوعية: 010302 applied physics, Physics, Nuclear and High Energy Physics, Radiation, 02 engineering and technology, Acoustic wave, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Instability, Parametric instability, Semiconductor plasma, Quantum electrodynamics, 0103 physical sciences, Dispersion (optics), General Materials Science, 0210 nano-technology, Relativistic quantum chemistry
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8805c41ce3e8bb03e56029e8f26cdfe3Test
https://doi.org/10.1080/10420150.2021.1878519Test -
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المؤلفون: Subhash Chouhan, Swati Dubey, S. K. Ghosh
المصدر: EMERGING INTERFACES OF PHYSICAL SCIENCES AND TECHNOLOGY 2019: EIPT2019.
مصطلحات موضوعية: Physics, Nonlinear system, Field (physics), law, Attenuation coefficient, Electron, Atomic physics, Coupled mode theory, Laser, Absorption (electromagnetic radiation), Parametric statistics, law.invention
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ce7d26183558c16c2a69246c8194a603Test
https://doi.org/10.1063/5.0000482Test -
3
المؤلفون: Subhash Chouhan, Swati Dubey, S. K. Ghosh
المصدر: ADVANCES IN BASIC SCIENCE (ICABS 2019).
مصطلحات موضوعية: Physics, Condensed Matter::Materials Science, Semiconductor, Field (physics), business.industry, Doping, Dispersion (optics), Plasma, Electron, Atomic physics, business, Magnetic field, Parametric statistics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::992d6abd1e6e3051c3c1314d34e95791Test
https://doi.org/10.1063/1.5122374Test -
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المؤلفون: Subhash Chouhan, Swati Dubey, Sanjay Ghosh
المصدر: AIP Conference Proceedings.
مصطلحات موضوعية: Physics, Nonlinear system, Semiconductor, business.industry, Mass variation, Electron, Plasma, Atomic physics, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0a07d381017bf48c3f6506bee97a3018Test
https://doi.org/10.1063/1.5098707Test