المؤلفون: Steinhartová, Tereza

مرشدي الرسالة: Hanuš, Jan, Matoušek, Jindřich

مصطلحات موضوعية: magnetron sputtering, magnetronové naprašování, thin films, roughness, plazmová polymerace, tenké vrstvy, nanoparicles, drsnost, plasma polymerization, nanočástice

الإتاحة: http://www.nusl.cz/ntk/nusl-331708Test

المؤلفون: Pilotto, A., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Cautero, M., Colja, M., Driussi, F., Esseni, D., Menk, R. H., Nichetti, C., Rosset, F., Selmi, L., Steinhartova, T., Palestri, P.

المساهمون: Pilotto, A., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Cautero, M., Colja, M., Driussi, F., Esseni, D., Menk, R. H., Nichetti, C., Rosset, F., Selmi, L., Steinhartova, T., Palestri, P.

مصطلحات موضوعية: avalanche photodiodes, X-rays, modeling, Monte Carlo method, noise

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000854954100001; volume:10; firstpage:944206; numberofpages:13; journal:FRONTIERS IN PHYSICS; https://hdl.handle.net/11390/1231124Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85138171161; https://www.frontiersin.org/articles/10.3389/fphy.2022.944206/full?&utm_source=Email_to_authors_&utm_medium=Email&utm_content=T1_11.5e1_author&utm_campaign=Email_publication&field=&journalName=Frontiers_in_Physics&id=944206Test

الإتاحة: https://doi.org/10.3389/fphy.2022.944206Test
https://hdl.handle.net/11390/1231124Test

المؤلفون: Colja, M, Cautero, M, Menk, RH, Palestri, P, Gianoncelli, A, Antonelli, M, Biasiol, G, Zilio, SD, Steinhartova, T, Nichetti, C, Arfelli, F, De Angelis, D, Driussi, F, Bonanni, V, Pilotto, A, Gariani, G, Carrato, S, Cautero, G

المساهمون: Colja, M, Cautero, M, Menk, Rh, Palestri, P, Gianoncelli, A, Antonelli, M, Biasiol, G, Zilio, Sd, Steinhartova, T, Nichetti, C, Arfelli, F, De Angelis, D, Driussi, F, Bonanni, V, Pilotto, A, Gariani, G, Carrato, S, Cautero, G

مصطلحات موضوعية: Solid state detector, X-ray detector, Detector modelling and simulations II (electric fields,charge transport,multiplication and induction,pulse formation,electron emission,etc)

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000933385700003; volume:17; issue:12; firstpage:"-"; lastpage:"-"; numberofpages:8; journal:JOURNAL OF INSTRUMENTATION; https://hdl.handle.net/11368/3053061Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85151064330; https://iopscience.iop.org/article/10.1088/1748-0221/17/12/C12020Test

الإتاحة: https://doi.org/10.1088/1748-0221/17/12/C12020Test
https://hdl.handle.net/11368/3053061Test

المؤلفون: Driussi F., Pilotto A., De Belli D., Antonelli M., Arfelli F., Biasiol G., Cautero G., Menk R. H., Nichetti C., Selmi L., Steinhartova T., Palestri P.

المساهمون: Driussi, F., Pilotto, A., De Belli, D., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Menk, R. H., Nichetti, C., Selmi, L., Steinhartova, T., Palestri, P.

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4008-7; info:eu-repo/semantics/altIdentifier/wos/WOS:000590125600032; ispartofbook:IEEE International Conference on Microelectronic Test Structures; 33rd IEEE International Conference on Microelectronic Test Structures, ICMTS 2020; volume:2020; firstpage:1; lastpage:6; numberofpages:6; http://hdl.handle.net/11390/1188080Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85086452952

الإتاحة: https://doi.org/10.1109/ICMTS48187.2020.9107920Test
http://hdl.handle.net/11390/1188080Test

المؤلفون: Pilotto A., Nichetti C., Palestri P., Selmi L., Antonelli M., Arfelli F., Biasiol G., Cautero G., Driussi F., Esseni D., Menk R. H., Steinhartova T.

المساهمون: Pilotto, A., Nichetti, C., Palestri, P., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Driussi, F., Esseni, D., Menk, R. H., Steinhartova, T.

مصطلحات موضوعية: Modeling, Nonlocal history-dependent impact ionization model, Staircase avalanche photodiode

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000538178100018; volume:168; firstpage:107728; journal:SOLID-STATE ELECTRONICS; http://hdl.handle.net/11390/1173435Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85076624264; http://www.elsevier.com/wps/find/journaldescription.cws_home/103/description#descriptionTest

الإتاحة: https://doi.org/10.1016/j.sse.2019.107728Test
http://hdl.handle.net/11390/1173435Test
http://www.elsevier.com/wps/find/journaldescription.cws_home/103/description#descriptionTest

المؤلفون: Rosset F., Pilotto A., Selmi L., Antonelli M., Arfelli F., Biasiol G., Cautero G., De Angelis D., Driussi F., Menk R. H., Nichetti C., Steinhartova T., Palestri P.

المساهمون: Rosset, F., Pilotto, A., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., De Angelis, D., Driussi, F., Menk, R. H., Nichetti, C., Steinhartova, T., Palestri, P.

مصطلحات موضوعية: Avalanche photodiode, Jitter, Ramo's theorem

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000571579500007; volume:977; firstpage:1; lastpage:10; numberofpages:10; journal:NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT; http://hdl.handle.net/11368/3015015Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85087696322; https://www.sciencedirect.com/science/article/pii/S0168900220307439Test

الإتاحة: https://doi.org/10.1016/j.nima.2020.164346Test
http://hdl.handle.net/11368/3015015Test
https://www.sciencedirect.com/science/article/pii/S0168900220307439Test

المؤلفون: Nichetti C., Steinhartova T., Antonelli M., Biasiol G., Cautero G., De Angelis D., Pilotto A., Driussi F., Palestri P., Selmi L., Arfelli F., Danailov M., Menk R. H.

المساهمون: Nichetti, C., Steinhartova, T., Antonelli, M., Biasiol, G., Cautero, G., De Angelis, D., Pilotto, A., Driussi, F., Palestri, P., Selmi, L., Arfelli, F., Danailov, M., Menk, R. H.

مصطلحات موضوعية: Charge transport and multiplication in solid media, Detector design and construction technologies and material, Solid state detector, Voltage distributions

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000527943500013; volume:15; issue:2; firstpage:"-"; lastpage:"-"; numberofpages:9; journal:JOURNAL OF INSTRUMENTATION; http://hdl.handle.net/11368/2966638Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85081242584; https://iopscience.iop.org/article/10.1088/1748-0221/15/02/C02013Test

الإتاحة: https://doi.org/10.1088/1748-0221/15/02/C02013Test
http://hdl.handle.net/11368/2966638Test

المؤلفون: Pilotto, A., Palestri, P., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Driussi, F., Menk, R. H., Nichetti, C., Steinhartova, T.

المساهمون: Pilotto, A., Palestri, P., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Driussi, F., Menk, R. H., Nichetti, C., Steinhartova, T.

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000461838600030; volume:66; issue:4; firstpage:1810; lastpage:1814; numberofpages:5; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11390/1147093Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85063190860

الإتاحة: https://doi.org/10.1109/TED.2019.2900743Test
http://hdl.handle.net/11390/1147093Test

المؤلفون: NICHETTI, Camilla, Steinhartova, T., Antonelli, M., Cautero, G., Menk, R. H., PILOTTO, ALESSANDRO, Driussi, F., Palestri, P., Selmi, L., Arfelli, F., Biasiol, G.

المساهمون: Nichetti, Camilla, Steinhartova, T., Antonelli, M., Cautero, G., Menk, R. H., Pilotto, Alessandro, Driussi, F., Palestri, P., Selmi, L., Arfelli, F., Biasiol, G.

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000454851900003; volume:14; issue:01; firstpage:C01003; lastpage:C01003; numberofpages:9; journal:JOURNAL OF INSTRUMENTATION; http://hdl.handle.net/11390/1142439Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85062488340

الإتاحة: https://doi.org/10.1088/1748-0221/14/01/C01003Test
http://hdl.handle.net/11390/1142439Test

المؤلفون: Nichetti, C., Pilotto, A., Palestri, P., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Driussi, F., Klein, N. Y., Menk, R. H., Steinhartova, T.

المساهمون: Nichetti, C., Pilotto, A., Palestri, P., Selmi, L., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Driussi, F., Klein, N. Y., Menk, R. H., Steinhartova, T.

مصطلحات موضوعية: Avalanche Photodiodes, Impact Ionization, Simulation

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000430698900025; volume:65; issue:5; firstpage:1823; lastpage:1829; numberofpages:7; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11390/1131113Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85046039386

الإتاحة: https://doi.org/10.1109/TED.2018.2817509Test
http://hdl.handle.net/11390/1131113Test