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1مؤتمر
المؤلفون: Shchegolkov, Dmitry Y.-U., Earley, Lawrence M., Haynes, W. Brian, Renneke, Richard M., Smirnova, Evgenya I., Yampolsky, Nikolai A.
العلاقة: https://zenodo.org/record/1274785Test; https://doi.org/10.1109/ivelec.2010.5503475Test; oai:zenodo.org:1274785
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2
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3دورية أكاديمية
المؤلفون: Smirnova, Evgenya I., Mastovsky, Ivan, Shapiro, Michael A., Temkin, Richard J., Earley, Lawrence M., Edwards, Randall L.
المصدر: Physical Review Special Topics - Accelerators and Beams ; volume 8, issue 9 ; ISSN 1098-4402
مصطلحات موضوعية: Surfaces and Interfaces, Physics and Astronomy (miscellaneous), Nuclear and High Energy Physics
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4
المؤلفون: Chen, Chiping, Shapiro, Michael A., Smirnova, Evgenya I., Temkin, Richard J., Sirigiri, Jagadishwar R.
مصطلحات موضوعية: 97 MATHEMATICS AND COMPUTING
وصف الملف: application/pdf
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5دورية أكاديمية
المؤلفون: Smirnova, Evgenya I., Chen, Chiping
المصدر: Journal of Applied Physics. 5/15/2003, Vol. 93 Issue 10, p5859. 7p. 2 Diagrams, 2 Graphs.
مصطلحات موضوعية: *PHOTONICS, *BARS (Engineering), *ELECTRIC currents, *ELECTROMAGNETIC waves
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6مؤتمر
المصدر: 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves
الإتاحة: https://doi.org/10.1109/icimw.2009.5324739Test
http://xplorestaging.ieee.org/ielx5/5306513/5324588/05324739.pdf?arnumber=5324739Test -
7مؤتمر
المصدر: 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves
الإتاحة: https://doi.org/10.1109/icimw.2009.5324590Test
http://xplorestaging.ieee.org/ielx5/5306513/5324588/05324590.pdf?arnumber=5324590Test -
8مؤتمر
المصدر: 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves
الإتاحة: https://doi.org/10.1109/icimw.2009.5325774Test
http://xplorestaging.ieee.org/ielx5/5306513/5324588/05325774.pdf?arnumber=5325774Test -
9مؤتمر
المصدر: 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves
الإتاحة: https://doi.org/10.1109/icimw.2008.4665609Test
http://xplorestaging.ieee.org/ielx5/4648126/4665395/04665609.pdf?arnumber=4665609Test -
10مؤتمر
المصدر: 2008 IEEE International Vacuum Electronics Conference
الإتاحة: https://doi.org/10.1109/ivelec.2008.4556428Test
http://xplorestaging.ieee.org/ielx5/4547419/4556320/04556428.pdf?arnumber=4556428Test