المؤلفون: Torrens Caldentey, Gabriel

المساهمون: University/Department: Universitat de les Illes Balears. Departament de Física

مرشدي الرسالة: Bota Ferragut, Sebastián Antonio

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: memorias, SRAM, 6T, 8T, CMOS, robustez, radiación, tolerancia, mitigación, soft error, single event upset, SEU, single event effect, SEE, SER, carga crítica, Qcrit, diseño, layout, partículas alfa, estabilidad, SNM, MBU, MCU, memories, SRAM, 6T, 8T, CMOS, robustness, radiation, tolerance, mitigation, soft error, single event upset, SEU, single event effect, SEE, SER, critical charge, Qcrit, design, layout, alpha particles, stability, SNM, MBU, MCU, memòries, SRAM, 6T, 8T, CMOS, robustesa, radiació, tolerància, mitigació, soft error, single event upset, SEU, single event effect, SEE, SER, càrrega crítica, Qcrit, disseny, layout, partícules alfa, estabilitat, SNM, MBU, MCU, Tecnología Electrónica

وصف الملف: application/pdf

الوصول الحر: http://hdl.handle.net/10803/97291Test

المؤلفون: Eunju Jo, Hosang Yoon, Hongjoon Park, Woo-young Choi, Inyong Kwon

المصدر: Nuclear Engineering and Technology, Vol 56, Iss 8, Pp 2916-2922 (2024)

مصطلحات موضوعية: C-SRAM, Radiation-hardened SRAM cell, Radiation tolerance, Single event upset, Soft error, Static noise margin, Nuclear engineering. Atomic power, TK9001-9401

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S1738573324001128Test; https://doaj.org/toc/1738-5733Test

الوصول الحر: https://doaj.org/article/df52b849542f47ba986ec1191bca6be6Test

المؤلفون: XIAO Shuyan1, GUO Gang1, WANG Linfei2, ZHANG Zheng1, CHEN Qiming1, GAO Linchun2, WANG Chunlin2, ZHANG Fuqiang1, ZHAO Shuyong1, LIU Jiancheng

المصدر: Yuanzineng kexue jishu, Vol 58, Iss 2, Pp 506-512 (2024)

مصطلحات موضوعية: total ionizing dose, single event effect, synergistic effect, single event upset, static random access memory, Nuclear engineering. Atomic power, TK9001-9401, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/1000-6931Test

الوصول الحر: https://doaj.org/article/d2a1f1a60d674da9a8a4b30116889eb9Test

المؤلفون: ZHANG Fuqiang1, ZHANG Zheng1, XIAO Shuyan1, GONG Yihao1, HAN Jinhua1, CHEN Qiming1, ZENG Chuanbin2, GUO Gang

المصدر: Yuanzineng kexue jishu, Vol 58, Iss 4, Pp 945-951 (2024)

مصطلحات موضوعية: single event upset induced soft error rate, synergistic effects, uncertainty analysis, mixed beam environment, Nuclear engineering. Atomic power, TK9001-9401, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/1000-6931Test

الوصول الحر: https://doaj.org/article/516846e9d43c4f55b0e228b44fde924fTest

المؤلفون: P Mangayarkarasi, Arunkumar K, Anitha Juliette Albert

المصدر: EAI Endorsed Transactions on Energy Web, Vol 11 (2024)

مصطلحات موضوعية: Single Event Upset, Memory Chip, CMOS, 10T Memory cell, Science, Mathematics, QA1-939, Electronic computers. Computer science, QA75.5-76.95

وصف الملف: electronic resource

العلاقة: https://publications.eai.eu/index.php/ew/article/view/5006Test; https://doaj.org/toc/2032-944XTest

الوصول الحر: https://doaj.org/article/7e9d14d65a624888894792843c180d78Test

المؤلفون: Dentan, Martin, Moindjie, Soilihi, Cecchetto, Matteo, Autran, Jean-Luc, Alia, Ruben Garcia, Naish, Richard, Waterhouse, John, Horton, Alan R., Litaudon, Xavier, Munteanu, Daniela, Bucalossi, Jérome, Moreau, Philippe, Malherbe, Victor, Roche, Philippe, Rastelli, Dario, Contributors, Jet

المساهمون: CEA Cadarache, Commissariat à l'énergie atomique et aux énergies alternatives (CEA), CERN Genève, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS), United Kingdom Atomic Energy Authority, Culham Centre for Fusion Energy (CCFE), Culham Science Centre Abingdon -Culham Science Centre Abingdon, STMicroelectronics Crolles (ST-CROLLES), Raylab s.r.l., European Project: 101052200,Implementation of activities described in the Roadmap to Fusion during Horizon Europe through a joint programme of the members of the EUROfusion consortium,EUROfusion

المصدر: NSREC 2024 - 2024 IEEE Nuclear and Space Radiation Effects Conference ; https://hal.science/hal-04613462Test ; NSREC 2024 - 2024 IEEE Nuclear and Space Radiation Effects Conference, Jul 2024, Ottawa, Canada ; https://www.nsrec.comTest/

مصطلحات موضوعية: CMOS, deuterium-tritium (D-T), fusion, neutron, real-time experiment, single event effects (SEE), soft-error rate (SER), single-event upset (SEU), static random-access memory (SRAM), tokamak, JET, WEST, JT-60SA, DTT, STEP, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Ottawa

الوقت: Ottawa, Canada

العلاقة: info:eu-repo/grantAgreement//101052200/EU/EUROfusion/EUROfusion; hal-04613462; https://hal.science/hal-04613462Test; https://hal.science/hal-04613462/documentTest; https://hal.science/hal-04613462/file/NSREC_2024_HAL.pdfTest

الإتاحة: https://hal.science/hal-04613462Test
https://hal.science/hal-04613462/documentTest
https://hal.science/hal-04613462/file/NSREC_2024_HAL.pdfTest

المؤلفون: Moindjie, Soilihi, Munteanu, Daniela, Autran, Jean-Luc, Dentan, Martin, Moreau, Philippe, Pellissier, Francis-Pierre, Santraine, Benjamin, Bucalossi, Jérôme, Malherbe, Victor, Thery, Thomas, Gasiot, Gilles, Roche, Philippe, Cecchetto, Matteo, Alia, Rubén Garcia

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS), Institut de Recherche sur la Fusion par confinement Magnétique (IRFM), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics Crolles (ST-CROLLES), CERN Genève, European Project: 101052200,Implementation of activities described in the Roadmap to Fusion during Horizon Europe through a joint programme of the members of the EUROfusion consortium,EUROfusion

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: Complementary metal–oxide–semiconductor (CMOS), deuterium–deuterium (D-D), deuterium–tritium (D-T), fusion, International Thermonuclear Experimental Reactor (ITER), neutron, real-time experiment, single-event effects (SEEs), single-event upset (SEU), soft-error rate (SER), static random access memory (SRAM), tokamak, W–tungsten– Environment in Steady-state Tokamak (WEST), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS]Physics [physics]

العلاقة: info:eu-repo/grantAgreement//101052200/EU/EUROfusion/EUROfusion; hal-04390851; https://amu.hal.science/hal-04390851Test; https://amu.hal.science/hal-04390851/documentTest; https://amu.hal.science/hal-04390851/file/TNS_WEST_2024_HAL.pdfTest

الإتاحة: https://doi.org/10.1109/TNS.2023.3347673Test
https://amu.hal.science/hal-04390851Test
https://amu.hal.science/hal-04390851/documentTest
https://amu.hal.science/hal-04390851/file/TNS_WEST_2024_HAL.pdfTest

المؤلفون: Kraemer Sarzi Sartori, Tarso, Fourati, Hassen, Possamai Bastos, Rodrigo

المساهمون: Architectures and Methods for Resilient Systems (TIMA-AMfoRS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Dynamics and Control of Networks (DANCE), Inria Grenoble - Rhône-Alpes, Institut National de Recherche en Informatique et en Automatique (Inria)-Institut National de Recherche en Informatique et en Automatique (Inria)-GIPSA Pôle Automatique et Diagnostic (GIPSA-PAD), Grenoble Images Parole Signal Automatique (GIPSA-lab), Université Grenoble Alpes (UGA)-Grenoble Images Parole Signal Automatique (GIPSA-lab)

المصدر: ISSN: 1530-437X ; IEEE Sensors Journal ; https://hal.science/hal-04320242Test ; IEEE Sensors Journal, 2024, 24 (1), pp.1079 - 1089. ⟨10.1109/JSEN.2023.3336054⟩ ; https://ieeexplore.ieee.org/document/10339260Test.

مصطلحات موضوعية: SEU (single event upset), machine learning (ML), soft errors, neural network, mitigation, attitude estimation, Kalman filter, decision tree, random forest, residuals, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [INFO.INFO-LG]Computer Science [cs]/Machine Learning [cs.LG], [INFO.INFO-SY]Computer Science [cs]/Systems and Control [cs.SY]

العلاقة: hal-04320242; https://hal.science/hal-04320242Test; https://hal.science/hal-04320242/documentTest; https://hal.science/hal-04320242/file/Version%20finale.pdfTest

الإتاحة: https://doi.org/10.1109/JSEN.2023.3336054Test
https://hal.science/hal-04320242Test
https://hal.science/hal-04320242/documentTest
https://hal.science/hal-04320242/file/Version%20finale.pdfTest

المؤلفون: Gholamreza Raisali, Masume Soleimaninia, Amir Moslehi

المصدر: فصلنامه علوم و فناوری فضایی, Vol 16, Iss 2, Pp 43-54 (2023)

مصطلحات موضوعية: sensitive volume, critical charge, nanometer sram, linear energy transfer (let), single event upset (seu), silvaco tcad, Technology, Astronomy, QB1-991

وصف الملف: electronic resource

العلاقة: https://jsst.ias.ir/article_167943_6c10ccc5c0d7432c134e90c4532ed473.pdfTest; https://doaj.org/toc/2008-4560Test; https://doaj.org/toc/2423-4516Test

الوصول الحر: https://doaj.org/article/3bd39fe625014f28a61a4178f8924718Test

المؤلفون: Qi, Chunhua, Ma, Guoliang, Zhang, Yanqing, Wang, Tianqi, Rui, Erming, Jiao, Qiang, Liu, Chaoming, Huo, Mingxue, Zhai, Guofu

المصدر: Microelectronics International, 2023, Vol. 40, Issue 2, pp. 89-95.

الوصول الحر: http://www.emeraldinsight.com/doi/10.1108/MI-06-2022-0110Test