المؤلفون: Yazdani, Hossein, Graff, Andreas, Simon-Najasek, Michél, Altmann, Frank, Brunner, Frank, Ostermay, Ina, Chevtchenko, Serguei, Würfl, Joachim

مصطلحات موضوعية: ddc:530, 2D electrons gas (2DEG), GaN High-electron-mobility transistor, nano-beam electron diffraction (NBED), scanning transmission electron microscopy (STEM), strain engineering

وصف الملف: application/pdf

العلاقة: ESSN:1862-6319; https://oa.tib.eu/renate/handle/123456789/12324Test; http://dx.doi.org/10.34657/11356Test

الإتاحة: https://doi.org/10.34657/1135610.1002/pssa.202200683Test
https://oa.tib.eu/renate/handle/123456789/12324Test

المؤلفون: Manz, Christian, Leone, Stefano, Kirste, Lutz, Ligl, Jana, Frei, Kathrin, Fuchs, Theodor, Prescher, Mario, Waltereit, Patrick, Verheijen, Marcel A., Graff, Andreas, Simon-Najasek, Michél, Altmann, Frank, Fiederle, Michael, Ambacher, Oliver

المصدر: Manz , C , Leone , S , Kirste , L , Ligl , J , Frei , K , Fuchs , T , Prescher , M , Waltereit , P , Verheijen , M A , Graff , A , Simon-Najasek , M , Altmann , F , Fiederle , M & Ambacher , O 2021 , ' Improved AlScN/GaN heterostructures grown by metal-organic chemical vapor deposition ' , Semiconductor Science and Technology , vol. 36 , no. 3 , 034003 . https://doi.org/10.1088/1361-6641/abd924Test

مصطلحات موضوعية: AlScN, Aluminum scandium nitride, Atom diffusion, High electron mobility transistor, MOCVD, ScAlN

العلاقة: https://research.tue.nl/en/publications/7ccf1c09-6fd6-47c8-b1cb-6f64b0c5c171Test

الإتاحة: https://doi.org/10.1088/1361-6641/abd924Test
https://research.tue.nl/en/publications/7ccf1c09-6fd6-47c8-b1cb-6f64b0c5c171Test
http://www.scopus.com/inward/record.url?scp=85100343311&partnerID=8YFLogxKTest

المؤلفون: Graff, Andreas, Simon-Najasek, Michél, Hübner, Susanne, Lejoyeux, Mickael, Altmann, Frank, Zhan Gao, V., Rampazzo, F., Meneghini, M., Zanoni, E., Lambert, B.

مصطلحات موضوعية: GaN HEMT, Gate leakage, Electroluminescence, FIB preparation, Analytical TEM

العلاقة: Microelectronics reliability; #PLACEHOLDER_PARENT_METADATA_VALUE#; https://publica.fraunhofer.de/handle/publica/468832Test

الإتاحة: https://doi.org/10.1016/j.microrel.2023.115096Test
https://publica.fraunhofer.de/handle/publica/468832Test

المؤلفون: Lenz, Christian, Ziesche, Steffen, Reinhardt, Kathrin, Körner, Stefan, Schletz, Andreas, Bach, Hoang Linh, Schmidt, Ingo, Simon-Najasek, Michél

مصطلحات موضوعية: LTCC, SiC-semiconductor, embedding, pre-package, power electronics

العلاقة: Electronics System-Integration Technology Conference 2022; #PLACEHOLDER_PARENT_METADATA_VALUE#; IEEE 9th Electronics System- Integration Technology Conference, ESTC 2022. Conference Proceedings; https://publica.fraunhofer.de/handle/publica/429941Test

الإتاحة: https://doi.org/10.1109/ESTC55720.2022.9939430Test
https://publica.fraunhofer.de/handle/publica/429941Test

المؤلفون: Dammann, Michael, Baeumler, Martina, Kemmer, Tobias, Konstanzer, Helmer, Brueckner, Peter, Krause, Sebastian, Graff, Andreas, Simon-Najasek, Michél

مصطلحات موضوعية: accelerated aging, HEMTs, failure analysis, life testing, microwave circuits

الوقت: 667

العلاقة: International Reliability Physics Symposium (IRPS) 2021; IEEE International Reliability Physics Symposium, IRPS 2021. Proceedings; https://publica.fraunhofer.de/handle/publica/411334Test

الإتاحة: https://doi.org/10.1109/IRPS46558.2021.9405227Test
https://publica.fraunhofer.de/handle/publica/411334Test

المؤلفون: Sana, Prabha, Graff, Andreas, Simon-Najasek, Michel, Hhbner, Susanne, Gao, Veronica Zhan, Rampazzo, Fabiana, De Santi, Carlo, Lambert, Benoit, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo, Altmann, Frank

المساهمون: Ministry of Education

المصدر: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

الإتاحة: https://doi.org/10.1109/wipda49284.2021.9645151Test
http://xplorestaging.ieee.org/ielx7/9645059/9645074/09645151.pdf?arnumber=9645151Test

المؤلفون: Zanoni, Enrico, Meneghini, Matteo, Meneghesso, Gaudenzio, Rampazzo, Fabiana, Marcon, Daniele, Zhan, Veronica Gao, Chiocchetta, Francesca, Graff, Andreas, Altmann, Frank, Simon-Najasek, Michel, Poppitz, David

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS)

الإتاحة: https://doi.org/10.1109/irps45951.2020.9128358Test
http://xplorestaging.ieee.org/ielx7/9125439/9128217/09128358.pdf?arnumber=9128358Test

المؤلفون: Rzin, Mehdi, Meneghini, Matteo, Rampazzo, Fabiana, Zhan, Veronica Gao, Marcon, Daniele, Grunenputt, Jan, Jung, Helmut, Lambert, Benoit, Riepe, Klaus, Blanck, Herve, Graff, Andreas, Altmann, Frank, Simon-Najasek, Michel, Poppitz, David, Meneghesso, Gaudenzio, Zanoni, Enrico

المساهمون: European Space Agency (ESA) and the Italian Space Agency (ASI) through the ESA European Space Research and Technology Centre, Andrew Barnes, Jouni Latti, and the EDA Project EUGANIC “European Gallium Nitride Industry Supply Chain,” coordinated by Klaus Beilenhoff

المصدر: IEEE Transactions on Electron Devices ; volume 67, issue 7, page 2765-2770 ; ISSN 0018-9383 1557-9646

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2020.2996983Test
http://xplorestaging.ieee.org/ielx7/16/9121781/09110722.pdf?arnumber=9110722Test

المؤلفون: Graff, Andreas, Simon-Najasek, Michel, Poppitz, David, Altmann, Frank

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS)

الإتاحة: https://doi.org/10.1109/irps.2018.8353557Test
http://xplorestaging.ieee.org/ielx7/8345372/8353529/08353557.pdf?arnumber=8353557Test

المؤلفون: Gerrer, Thomas, Graff, Andreas, Simon-Najasek, Michel, Czap, Heiko, Maier, Thomas, Benkhelifa, Fouad, Müller, Stefan G., Nebel, Christoph E., Waltereit, Patrick, Quay, Rüdiger, Cimalla, Volker

المصدر: Art. 252103, ISSN: 1077-3118

العلاقة: https://freidok.uni-freiburg.de/data/222840Test

الإتاحة: https://doi.org/10.1063/1.5095816Test
https://freidok.uni-freiburg.de/data/222840Test