يعرض 1 - 10 نتائج من 7,261 نتيجة بحث عن '"Silicon Wafers"', وقت الاستعلام: 1.05s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Continuously tunable uniaxial strain control of van der Waals heterostructure devices.

    المؤلفون: Liu, Zhaoyu1 (AUTHOR) zhyliu@uw.edu, Ma, Xuetao2 (AUTHOR), Cenker, John1 (AUTHOR), Cai, Jiaqi1 (AUTHOR), Fei, Zaiyao1 (AUTHOR), Malinowski, Paul1 (AUTHOR), Mutch, Joshua1 (AUTHOR), Zhao, Yuzhou1,2 (AUTHOR), Hwangbo, Kyle1 (AUTHOR), Lin, Zhong1 (AUTHOR), Manna, Arnab1 (AUTHOR), Yang, Jihui2 (AUTHOR), Cobden, David1 (AUTHOR), Xu, Xiaodong1,2 (AUTHOR), Yankowitz, Matthew1,2 (AUTHOR) myank@uw.edu, Chu, Jiun-Haw1 (AUTHOR) jhchu@uw.edu

    المصدر: Journal of Applied Physics. 5/28/2024, Vol. 135 Issue 20, p1-10. 10p.

    مصطلحات موضوعية: *SILICON wafers, *OPTICAL spectroscopy, *OPTICAL limiting, *SILICA, *HETEROSTRUCTURES


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  2. 2
    دورية أكاديمية
    Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging.

    المؤلفون: Thøgersen, Annett1 (AUTHOR) annett.thogersen@sintef.no, Jensen, Ingvild J. T.1 (AUTHOR), Mehl, Torbjørn2 (AUTHOR), Burud, Ingunn2 (AUTHOR), Olsen, Espen2 (AUTHOR), Gudem Ringdalen, Inga3 (AUTHOR), Zhu, Junjie4 (AUTHOR), Søndenå, Rune4 (AUTHOR)

    المصدر: Journal of Applied Physics. 4/7/2024, Vol. 135 Issue 13, p1-7. 7p.

    مصطلحات موضوعية: *SILICON wafers, *SCANNING transmission electron microscopy, *SILICON solar cells, *FOCUSED ion beams, *PHOTOLUMINESCENCE, *PHOTOLUMINESCENCE measurement


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  3. 3
    دورية أكاديمية
    Reassessing iron–gallium recombination activity in silicon.

    المؤلفون: Le, Tien T.1 (AUTHOR) tien.le@anu.edu.au, Zhou, Zhuangyi2 (AUTHOR), Chen, Alan1 (AUTHOR), Yang, Zhongshu1 (AUTHOR), Rougieux, Fiacre2 (AUTHOR), Macdonald, Daniel1 (AUTHOR), Liu, AnYao1 (AUTHOR)

    المصدر: Journal of Applied Physics. 4/7/2024, Vol. 135 Issue 13, p1-12. 12p.

    مصطلحات موضوعية: *SILICON wafers, *ION implantation, *SILICON, *ELECTRON capture, *IRON


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  4. 4
    دورية أكاديمية
    Improving the Reliability of Through Silicon Vias: Reducing Copper Protrusion by Artificial Defect Manipulation and Annealing.

    المؤلفون: Choi, Won-Jun1 (AUTHOR), Yoo, Myong Jae1 (AUTHOR), Bae, Joonho2 (AUTHOR) baejh2k@gachon.ac.kr, Seo, Ji-Hun3 (AUTHOR) seojh79@korea.ac.kr, Lee, Churl Seung1 (AUTHOR) assong@keti.re.kr

    المصدر: IEEE Transactions on Semiconductor Manufacturing. May2024, Vol. 37 Issue 2, p166-173. 8p.

    مصطلحات موضوعية: *SEMICONDUCTOR manufacturing, COPPER, SILICON wafers, SILICON, HIGH temperatures, ELECTROPLATING


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  5. 5
    دورية أكاديمية
    Thermal characterization of n-type silicon based on an electro-acoustic analogy.

    المؤلفون: Stanojevic, N.1 (AUTHOR), Markushev, D. K.2 (AUTHOR), Aleksić, S. M.1 (AUTHOR) sanja.aleksic@elfak.ni.ac.rs, Pantić, D. S.1 (AUTHOR), Galović, S. P.3 (AUTHOR), Markushev, D. D.2 (AUTHOR), Ordonez-Miranda, J.4 (AUTHOR)

    المصدر: Journal of Applied Physics. 6/28/2023, Vol. 133 Issue 24, p1-12. 12p.

    مصطلحات موضوعية: *SILICON wafers, *ANALOGY, *LIGHT sources, *BLUE light, *SILICON, *SILICON solar cells


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  6. 6
    دورية أكاديمية
    Three-Dimensional Profile Reconstruction and Internal Defect Detection of Silicon Wafers Using Cascaded Fiber Optic Fabry-Pérot Interferometer and Leaky Field Detection Technologies.

    المؤلفون: Fengfeng Zhou1 zhou966@purdue.edu, Xingyu Fu1 fuxingyu@alumni.purdue.edu, Siying Chen1 chen2122@purdue.edu, Changheon Han1 mbgjun@purdue.edu, Jun, Martin B. G.1

    المصدر: Journal of Manufacturing Science & Engineering. Jul2024, Vol. 146 Issue 7, p1-11. 11p.

    مصطلحات موضوعية: *SILICON wafers, *INTERFEROMETERS, *COMPUTED tomography, *OPTICAL fibers, *SURFACE defects, *OPTICAL fiber detectors, *SILICON solar cells


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  7. 7
    دورية أكاديمية
    Ultra-low damage processing of silicon wafer with an innovative and optimized nonwoven grind-polishing wheel.

    المؤلفون: Gao, Shang1 (AUTHOR) gaoshang@dlut.edu.cn, Huang, Jinxing1 (AUTHOR), Zhang, Yu1 (AUTHOR), Guo, Xiaoguang1 (AUTHOR), Kang, Renke1 (AUTHOR)

    المصدر: Precision Engineering. Jun2024, Vol. 88, p884-894. 11p.

    مصطلحات موضوعية: *GRINDING & polishing, *SILICON wafers, *INTEGRATED optics, *DIAMOND wheels, *SILICON surfaces, *GRINDING wheels


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  8. 8
    دورية أكاديمية
    IR-Fourier Spectroscopy of Attenuated Total Internal Reflection of Polyimide Films on Single-Crystal Silicon Wafers.

    المؤلفون: Prosolovich, V. S.1 (AUTHOR) prosolovich@bsu.by, Brinkevich, D. I.1 (AUTHOR), Grinyuk, E. V.1,2 (AUTHOR), Brinkevich, S. D.1,3 (AUTHOR), Kolos, V. V.4 (AUTHOR), Zubova, O. A.4 (AUTHOR), Lastovskii, S. B.5 (AUTHOR)

    المصدر: Journal of Applied Spectroscopy. May2024, Vol. 91 Issue 2, p302-306. 5p.

    مصطلحات موضوعية: *POLYIMIDE films, *SILICON wafers, *ATTENUATED total reflectance, *SILICON films, *METASTABLE states, *ELECTRON accelerators, *POLYIMIDES


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  9. 9
    دورية أكاديمية
    Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms.

    المؤلفون: Chibane, Yougherta1 (AUTHOR) chibaneyougherta@gmail.com, Kouhlane, Yacine2 (AUTHOR), Bouhafs, Djoudi3 (AUTHOR), Achour, Wafa3 (AUTHOR), Mohammed-Krarroubi, Asmaa3 (AUTHOR), Khelfane, Amar3 (AUTHOR)

    المصدر: Applied Physics A: Materials Science & Processing. May2024, Vol. 130 Issue 5, p1-12. 12p.

    مصطلحات موضوعية: *SILICON wafers, *SILICON nitride, *SOLAR cells, *HEAT treatment, *HYDROGEN atom, *IRON, *BORON


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  10. 10
    دورية أكاديمية
    Gettering of iron by aluminum oxide thin films on silicon wafers: Kinetics and mechanisms.

    المؤلفون: Le, Tien Trong, Yang, Zhongshu, Liang, Wensheng, Macdonald, Daniel, Liu, AnYao

    المصدر: Journal of Applied Physics; 2/14/2024, Vol. 135 Issue 6, p1-7, 7p

    مصطلحات موضوعية: ALUMINUM oxide films, SILICON oxide films, SILICON wafers, GETTERING, SILICON solar cells, ATOMIC layer deposition


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