المؤلفون: Li, Chengxiang, Dong, Xiaosheng, Yu, Lina, Yuan, Kai, Yi, Xiangren, Shen, Yuanlong, Niu, Hu

المصدر: Trials ; volume 24, issue 1 ; ISSN 1745-6215

مصطلحات موضوعية: Pharmacology (medical), Medicine (miscellaneous)

الإتاحة: https://doi.org/10.1186/s13063-023-07187-2Test

المؤلفون: Shen, Yuanlong, Yu, Lina, Hua, Zhen, Jia, Ningxin, Zhou, Yanan, Dong, Xiaosheng, Ding, Meng

المساهمون: Exrcises Promote Health Theory and Practice Innovation Team of Shandong Normal University in China

المصدر: Medicine ; volume 100, issue 3, page e23963 ; ISSN 0025-7974 1536-5964

الإتاحة: https://doi.org/10.1097/md.0000000000023963Test

المؤلفون: Xu, Honghai, Li, Xutong, Wu, Zihao, Zhao, Linyan, Shen, Jiapei, Liu, Jiaying, Qin, Jiangfeng, Shen, Yuanlong, Ke, Jing, Wei, Yuanyuan, Li, Jiabin, Gao, Yufeng

المصدر: Frontiers in Molecular Biosciences ; volume 8 ; ISSN 2296-889X

الإتاحة: https://doi.org/10.3389/fmolb.2021.749648Test

المؤلفون: Chen, Wanjin, Wang, Haibo, Shen, Yuanlong, Wang, Shouwen, Liu, Deng, Zhao, Hongchuan, Wang, Guobin, Huang, Fan, Wang, Wei, Wu, Ruolin, Hou, Liujin, Ye, Zhenghui, Zhang, Xinghua, Geng, Xiaoping, Yu, Xiaojun

المساهمون: National Natural Science Foundation of China

المصدر: Functional & Integrative Genomics ; volume 23, issue 1 ; ISSN 1438-793X 1438-7948

مصطلحات موضوعية: Genetics, General Medicine

الإتاحة: https://doi.org/10.1007/s10142-023-00974-9Test

المؤلفون: Liu, Shuisheng, Shen, Yuanlong

المصدر: Journal of Electronics (China) ; volume 24, issue 6, page 748-752 ; ISSN 0217-9822 1993-0615

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1007/s11767-006-0088-3Test

المؤلفون: Shen, Yuanlong

المصدر: Microelectronics Reliability ; volume 36, issue 9, page 1219-1221 ; ISSN 0026-2714

مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/0026-2714Test(95)00185-9
https://api.elsevier.com/content/article/PII:0026271495001859?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:0026271495001859?httpAccept=text/plainTest

المؤلفون: Shen, Yuanlong

المصدر: Microelectronics Reliability ; volume 35, issue 6, page 973-976 ; ISSN 0026-2714

مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/0026-2714Test(94)00121-4
https://api.elsevier.com/content/article/PII:0026271494001214?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:0026271494001214?httpAccept=text/plainTest