المؤلفون: Shen, Rongzong, Qian, Haoji, Zhang, Hongrui, Han, Genquan, Liu, Yan, Gu, Jiani, Xu, Jiacheng, Jin, Chengji, Lin, Gaobo, Yu, Xiao, Ding, Yian, Chen, jiajia

مصطلحات موضوعية: Physical sciences, FOS Physical sciences

الإتاحة: https://doi.org/10.60893/figshare.apl.c.7270318Test
https://aip.figshare.com/collections/Dynamic_Evolution_of_Oxygen_Vacancies_During_Cycling_in_Antiferroelectric_Hf_sub_x_sub_Zr_sub_1-x_sub_O_sub_2_sub_/7270318Test

المؤلفون: Cao, Jifang, Chen, Bing, Wang, Zhijiang, Qu, Junru, Zhao, Jiayi, Shen, Rongzong, Yu, Xiao, Yu, Zhiping, Liu, Fei

المصدر: Applied Physics Letters; 7/1/2024, Vol. 125 Issue 1, p1-6, 6p

مصطلحات موضوعية: NONVOLATILE random-access memory, RANDOM access memory, STRAY currents

المؤلفون: Qian, Haoji^1,2,3 (AUTHOR), Shen, Rongzong³ (AUTHOR), Zhang, Hongrui^1,2,3 (AUTHOR), Xu, Jiacheng³ (AUTHOR), Lin, Gaobo³ (AUTHOR), Ding, Yian^1,2 (AUTHOR), Gu, Jiani³ (AUTHOR), Yu, Xiao^1,2,3 (AUTHOR), Liu, Yan² (AUTHOR), Jin, Chengji^1,2,3 (AUTHOR) cjjin@zhejianglab.edu.cn, Chen, Jiajia^1,2,3 (AUTHOR) jiajia.chen@zhejianglab.edu.cn, Han, Genquan² (AUTHOR)

المصدر: Applied Physics Letters. 6/10/2024, Vol. 124 Issue 24, p1-6. 6p.

مصطلحات موضوعية: *CYCLING, *PHASE transitions, *SWITCHING costs, *OXYGEN, *LEAD alloys

المؤلفون: Qian, Haoji, Shen, Rongzong, Zhang, Hongrui, Xu, Jiacheng, Lin, Gaobo, Ding, Yian, Gu, Jiani, Yu, Xiao, Liu, Yan, Jin, Chengji, Chen, Jiajia, Han, Genquan

المصدر: Applied Physics Letters; 6/10/2024, Vol. 124 Issue 24, p1-6, 6p

مصطلحات موضوعية: CYCLING, PHASE transitions, SWITCHING costs, OXYGEN, LEAD alloys

المؤلفون: Qian, Haoji, Shen, Rongzong, Zhang, Hongrui, Xu, Jiacheng, Lin, Gaobo, Ding, Yian, Gu, Jiani, Yu, Xiao, Liu, Yan, Jin, Chengji, Chen, Jiajia, Han, Genquan

المساهمون: National Natural Science Foundation of China, Zhejiang Provincial Natural Science Foundation

المصدر: Applied Physics Letters ; volume 124, issue 24 ; ISSN 0003-6951 1077-3118

الإتاحة: https://doi.org/10.1063/5.0214584Test

المؤلفون: Ma, Minglei, Lin, Gaobo, Shen, Rongzong, Xu, Jiacheng, Qian, Haoji, Gu, Jiani, Liu, Huan, Zhang, Hongrui, Yu, Xiao, Liu, Yan, Chen, Jiajia, Jin, Chengji, Han, Genquan

المساهمون: National Key Research and Development Program of China, National Natural Science Foundation of China, Zhejiang Provincial Natural Science Foundation, Youth Foundation Project of Zhejiang Laboratory

المصدر: IEEE Transactions on Electron Devices ; page 1-5 ; ISSN 0018-9383 1557-9646

الإتاحة: https://doi.org/10.1109/ted.2024.3390097Test
http://xplorestaging.ieee.org/ielx7/16/4358746/10506910.pdf?arnumber=10506910Test

المؤلفون: Qian, Haoji, Shen, Rongzong, Zhang, Hongrui, Xu, Jiacheng, Lin, Gaobo, Ding, Yian, Gu, Jiani, Yu, Xiao, Liu, Yan, Jin, Chengji, Chen, jiajia, Han, Genquan

مصطلحات موضوعية: Physical sciences, FOS Physical sciences

العلاقة: https://dx.doi.org/10.60893/figshare.apl.25975465Test; https://dx.doi.org/10.1063/5.0214584Test

الإتاحة: https://doi.org/10.60893/figshare.apl.25975465.v110.60893/figshare.apl.2597546510.1063/5.0214584Test
https://aip.figshare.com/articles/figure/Supplemental_Materials_Dynamic_Evolution_of_Oxygen_Vacancies_During_Cycling_in_Antiferroelectric_HfxZr1-xO2/25975465/1Test

المؤلفون: Chen, Jiajia, Qian, Haoji, Zhang, Hongrui, Shen, Rongzong, Lin, Gaobo, Gu, Jiani, Jin, Chengji, Zhang, Miaomiao, Liu, Huan, Liu, Yan, Yu, Xiao, Han, Genquan

المساهمون: National Natural Science Foundation of China, Research and Development

المصدر: 2023 International Electron Devices Meeting (IEDM)

الإتاحة: https://doi.org/10.1109/iedm45741.2023.10413825Test
http://xplorestaging.ieee.org/ielx7/10413659/10413660/10413825.pdf?arnumber=10413825Test

المؤلفون: Zeng, Yiqin, Ding, Zhetao, Li, Xueyang, Ma, Minglei, Peng, Yue, Shen, Rongzong, Lin, Gaobo, Jin, Chengji, Yu, Xiao, Chen, Bing, Cheng, Ran, Han, Genquan

المساهمون: Research and Development, National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

المصدر: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)

الإتاحة: https://doi.org/10.1109/essderc59256.2023.10268548Test
http://xplorestaging.ieee.org/ielx7/10268496/10268469/10268548.pdf?arnumber=10268548Test

المؤلفون: Ma, Minglei, Lin, Gaobo, Shen, Rongzong, Xu, Jiacheng, Qian, Haoji, Gu, Jiani, Liu, Huan, Zhang, Hongrui, Yu, Xiao, Liu, Yan, Chen, Jiajia, Jin, Chengji, Han, Genquan

المصدر: IEEE Transactions on Electron Devices; 2024, Vol. 71 Issue: 6 p3959-3963, 5p