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1تقرير
مصطلحات موضوعية: article, ddc:510, 34B60, 74B10, 78A45, 81V65, Semiconductors -- quantum dots -- TEM images -- electron wave propagation -- strain
العلاقة: https://doi.org/10.20347/WIAS.PREPRINT.2682Test; https://archive.wias-berlin.de/receive/wias_mods_00003841Test; https://archive.wias-berlin.de/servlets/MCRFileNodeServlet/wias_derivate_00003113/wias_preprints_2682.pdfTest; http://www.wias-berlin.de/publications/wias-publ/run.jsp?template=abstract&type=Preprint&year=2020&number=2682Test
الإتاحة: https://doi.org/10.20347/WIAS.PREPRINT.2682Test
https://archive.wias-berlin.de/receive/wias_mods_00003841Test
https://archive.wias-berlin.de/servlets/MCRFileNodeServlet/wias_derivate_00003113/wias_preprints_2682.pdfTest
http://www.wias-berlin.de/publications/wias-publ/run.jsp?template=abstract&type=Preprint&year=2020&number=2682Test -
2دورية أكاديمية
مصطلحات موضوعية: article, ddc:510, Semiconductors -- quantum dots -- TEM images -- electron wave propagation -- strain
العلاقة: Optical and Quantum Electronics -- Opt. Quant. Electron. -- Opt. Quantum Electron. -- Opt. a. Quantum Electron. -- 0306-8919 -- 189950-8 -- 1572-817X -- 2000642-1 -- https://www.springer.com/journal/11082Test; https://doi.org/10.1007/s11082-020-02356-yTest; https://archive.wias-berlin.de/receive/wias_mods_00004809Test
الإتاحة: https://doi.org/10.1007/s11082-020-02356-yTest
https://archive.wias-berlin.de/receive/wias_mods_00004809Test -
3تقرير
مصطلحات موضوعية: article, ddc:510, 34B60, 74B10, 78A45, 81V65, Semiconductors -- quantum dots -- TEM images -- electron wave propagation -- strain
العلاقة: https://doi.org/10.20347/WIAS.PREPRINT.2682Test; https://archive.wias-berlin.de/receive/wias_mods_00003841Test; https://archive.wias-berlin.de/servlets/MCRFileNodeServlet/wias_derivate_00003113/wias_preprints_2682.pdfTest; http://www.wias-berlin.de/publications/wias-publ/run.jsp?template=abstract&type=Preprint&year=2020&number=2682Test
الإتاحة: https://doi.org/10.20347/WIAS.PREPRINT.2682Test
https://archive.wias-berlin.de/receive/wias_mods_00003841Test
https://archive.wias-berlin.de/servlets/MCRFileNodeServlet/wias_derivate_00003113/wias_preprints_2682.pdfTest
http://www.wias-berlin.de/publications/wias-publ/run.jsp?template=abstract&type=Preprint&year=2020&number=2682Test