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1تقرير
المؤلفون: Scherzer, M., Seiler, E., Sexty, D., Stamatescu, I. -O.
المصدر: Phys. Rev. D 101, 014501 (2020)
مصطلحات موضوعية: High Energy Physics - Lattice, High Energy Physics - Theory
الوصول الحر: http://arxiv.org/abs/1910.09427Test
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2دورية أكاديمية
المؤلفون: Turner, Daniel Andrew, Malyshev, O. B., Burt, G., Seiler, E., Ries, R., Medvids, A., Onufrijevs, P., Valizadeh, R., Sublet, A., Pira, C., Chyhyrynets, E., Vogel, M., Leith, S., Junginger, T.
وصف الملف: text
العلاقة: https://eprints.lancs.ac.uk/id/eprint/211580/1Test/; https://eprints.lancs.ac.uk/id/eprint/211580/2Test/; https://eprints.lancs.ac.uk/id/eprint/211580/3Test/; https://eprints.lancs.ac.uk/id/eprint/211580/4Test/; https://eprints.lancs.ac.uk/id/eprint/211580/5Test/; https://eprints.lancs.ac.uk/id/eprint/211580/6Test/; https://eprints.lancs.ac.uk/id/eprint/211580/7/LaserTreatedIEEE_Version4.pdfTest; Turner, Daniel Andrew and Malyshev, O. B. and Burt, G. and Seiler, E. and Ries, R. and Medvids, A. and Onufrijevs, P. and Valizadeh, R. and Sublet, A. and Pira, C. and Chyhyrynets, E. and Vogel, M. and Leith, S. and Junginger, T. (2023) Investigating the Superconducting Properties and Surface Morphology of Sputtered Nb Films on Cu Due to Laser Treatment. IEEE Transactions on Applied Superconductivity, 33 (4): 7500512. pp. 1-12. ISSN 1051-8223
الإتاحة: https://eprints.lancs.ac.uk/id/eprint/211580Test/
https://eprints.lancs.ac.uk/id/eprint/211580/1Test/
https://eprints.lancs.ac.uk/id/eprint/211580/2Test/
https://eprints.lancs.ac.uk/id/eprint/211580/3Test/
https://eprints.lancs.ac.uk/id/eprint/211580/4Test/
https://eprints.lancs.ac.uk/id/eprint/211580/5Test/
https://eprints.lancs.ac.uk/id/eprint/211580/6Test/
https://eprints.lancs.ac.uk/id/eprint/211580/7/LaserTreatedIEEE_Version4.pdfTest -
3دورية أكاديمية
المؤلفون: Mehringer, S., Seiler, E., Droop, F., Mitra, D., Rahn, R., Vingron, M., Reinert, K.
المصدر: Genome Biology : Biology for the Post-Genomic Era
وصف الملف: application/pdf
العلاقة: info:eu-repo/semantics/altIdentifier/pmid/37259161; http://hdl.handle.net/21.11116/0000-000D-C564-4Test; http://hdl.handle.net/21.11116/0000-000D-C566-2Test
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4دورية أكاديمية
المؤلفون: Leith, S., Qiao, J., Vogel, M., Seiler, E., Ries, R., Li, Y., Wiktor, C., Mueller, J., Sakalli, Y., Butz, B., Jiang, X.
المساهمون: European Union, DFG
المصدر: Vacuum ; volume 212, page 112041 ; ISSN 0042-207X
مصطلحات موضوعية: Surfaces, Coatings and Films, Condensed Matter Physics, Instrumentation
الإتاحة: https://doi.org/10.1016/j.vacuum.2023.112041Test
https://api.elsevier.com/content/article/PII:S0042207X23002385?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0042207X23002385?httpAccept=text/plainTest -
5تقرير
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6مؤتمر
المؤلفون: Knaust, M., Seiler, E., Reinert, K., Steinke, T.
المصدر: FPGA '22
وصف الملف: application/pdf
العلاقة: http://hdl.handle.net/21.11116/0000-000E-570D-3Test; http://hdl.handle.net/21.11116/0000-000E-570F-1Test
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7كتاب
المؤلفون: Leith, S., Vogel, M., Seiler, E., Ries, R., Li, Y., Müller, J., Tikhonov, D., Kugeler, O., Keckert, S., Sezgin, A. Ö., Jiang, X., Butz, B., Knobloch, J.
مصطلحات موضوعية: Accelerator research and development
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8كتاب
المؤلفون: Sezgin, A. Ö., Gonzalez Diaz Palacio, I., Jiang, X., Keckert, S., Knobloch, J., Kugeler, O., Ries, R., Seiler, E., Tikhonov, D., Vogel, M., Zierold, R.
مصطلحات موضوعية: Accelerator research and development
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9تقرير
المؤلفون: Aarts, G., Seiler, E., Sexty, D., Stamatescu, I. -O.
مصطلحات موضوعية: High Energy Physics - Lattice, High Energy Physics - Phenomenology, High Energy Physics - Theory
الوصول الحر: http://arxiv.org/abs/1503.08813Test
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10دورية أكاديمية
المؤلفون: Gömöry, F., Solovyov, M., Šouc, J., Frolek, L., Kujovič, T., Seiler, E., Ries, R., Mošať, M., Winkler, T., Sugita, K., Dhallé, M., Krooshoop, H. J. G., Hintze, C., Troshyn, A., Prusseit, W., Nedergaard, Lars, Traberg, L., Christensen, J. J., Jørgensen, N. O., Bahl, C. R. H., Wulff, A. C.
المصدر: IEEE Transactions on Applied Superconductivity ; volume 34, issue 5, page 1-5 ; ISSN 1051-8223 1558-2515 2378-7074
الإتاحة: https://doi.org/10.1109/tasc.2024.3364133Test
http://xplorestaging.ieee.org/ielx7/77/10496569/10430362.pdf?arnumber=10430362Test