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1دورية أكاديمية
المؤلفون: I. Lobato, T. Friedrich, S. Van Aert
المصدر: npj Computational Materials, Vol 10, Iss 1, Pp 1-19 (2024)
مصطلحات موضوعية: Materials of engineering and construction. Mechanics of materials, TA401-492, Computer software, QA76.75-76.765
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2057-3960Test
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2دورية أكاديمية
المؤلفون: D. J. Groenendijk, C. Autieri, T. C. van Thiel, W. Brzezicki, J. R. Hortensius, D. Afanasiev, N. Gauquelin, P. Barone, K. H. W. van den Bos, S. van Aert, J. Verbeeck, A. Filippetti, S. Picozzi, M. Cuoco, A. D. Caviglia
المصدر: Physical Review Research, Vol 2, Iss 2, p 023404 (2020)
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2643-1564Test
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3دورية أكاديمية
المؤلفون: T. C. van Thiel, W. Brzezicki, C. Autieri, J. R. Hortensius, D. Afanasiev, N. Gauquelin, D. Jannis, N. Janssen, D. J. Groenendijk, J. Fatermans, S. Van Aert, J. Verbeeck, M. Cuoco, A. D. Caviglia
العلاقة: info:eu-repo/grantAgreement/EC/H2020/823717/; https://zenodo.org/communities/esteem3Test; https://zenodo.org/record/7967374Test; https://doi.org/10.1103/PhysRevLett.127.127202Test; oai:zenodo.org:7967374
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المؤلفون: D. Van Dyck, Ivan Lobato, H.L. Robert, Knut Müller-Caspary, S. Van Aert, F.J. Lyu, Qing Chen
المصدر: Ultramicroscopy
Ultramicroscopy 233, 113425-(2022). doi:10.1016/j.ultramic.2021.113425مصطلحات موضوعية: 010302 applied physics, Diffraction, Materials science, Optical sectioning, Scattering, Momentum transfer, Second moment of area, 02 engineering and technology, Electron, Mott scattering, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Computational physics, Chemistry, ddc:570, 0103 physical sciences, Scanning transmission electron microscopy, 0210 nano-technology, Instrumentation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e283fa33cbe4263ceb2977d59b71ddf1Test
https://hdl.handle.net/10067/1848330151162165141Test -
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المؤلفون: Jarmo Fatermans, T. C. van Thiel, S. Van Aert, Dirk J. Groenendijk, Nicolas Gauquelin, Daen Jannis, J. R. Hortensius, Mario Cuoco, Carmine Autieri, D. Afanasiev, N. Janssen, Wojciech Brzezicki, Johan Verbeeck, Andrea D. Caviglia
المصدر: Physical review letters, Vol. 127, No 12 (2021) P. 127202
Physical Review Letters, 127(12)
Physical review letters
Physical Review Lettersمصطلحات موضوعية: Condensed Matter - Materials Science, Materials science, Valence (chemistry), Spin states, Strongly Correlated Electrons (cond-mat.str-el), Physics, Point reflection, General Physics and Astronomy, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Charge (physics), Topology, Coupling (probability), 01 natural sciences, 3. Good health, 010305 fluids & plasmas, Condensed Matter::Materials Science, Condensed Matter - Strongly Correlated Electrons, Ferromagnetism, 0103 physical sciences, Condensed Matter::Strongly Correlated Electrons, Berry connection and curvature, ddc:500, 010306 general physics, Electronic band structure
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e4c184fd8037c9fed01cbb9caa1a30f6Test
http://arxiv.org/abs/2107.03359Test -
6دورية أكاديمية
المؤلفون: D Schryvers, S Cao, W Tirry, H Idrissi and S Van Aert
المصدر: Science and Technology of Advanced Materials, Vol 14, Iss 1, p 014206 (2013)
مصطلحات موضوعية: Materials of engineering and construction. Mechanics of materials, TA401-492, Biotechnology, TP248.13-248.65
العلاقة: http://dx.doi.org/10.1088/1468-6996/14/1/014206Test; https://doaj.org/toc/1468-6996Test; https://doaj.org/toc/1878-5514Test; https://doaj.org/article/bed3798333994f03a6d20a47efd17abeTest
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المؤلفون: A.J. den Dekker, Nicolas Gauquelin, Jo Verbeeck, Knut Müller-Caspary, S. Van Aert, Jarmo Fatermans
المصدر: Ultramicroscopy 219, 113046-(2020). doi:10.1016/j.ultramic.2020.113046
Ultramicroscopyمصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Estimation theory, Statistical parameter, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Chemistry, Tilt (optics), Optics, ddc:570, 0103 physical sciences, Atom, Scanning transmission electron microscopy, Parametric model, Maximum a posteriori estimation, 0210 nano-technology, business, Instrumentation, Beam (structure)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::26ef63c112408dcd693a50b0dc983adaTest
https://juser.fz-juelich.de/record/893893Test -
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المؤلفون: M. Alania, S. Van Aert, Ivan Lobato
المصدر: Ultramicroscopy
مصطلحات موضوعية: 010302 applied physics, Diffraction, Chemistry, business.industry, Scattering, Detector, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Upper and lower bounds, Molecular physics, Dark field microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, Transmission electron microscopy, 0103 physical sciences, Scanning transmission electron microscopy, Microscopy, 0210 nano-technology, business, Instrumentation
وصف الملف: pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2c3369c478e2f8b1e82687798d56366aTest
https://doi.org/10.1016/j.ultramic.2017.08.021Test -
9دورية أكاديمية
المؤلفون: A J Den Dekker, S Van Aert, A Van Den Bos, D Van Dyck
المساهمون: The Pennsylvania State University CiteSeerX Archives
وصف الملف: application/pdf
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10دورية أكاديمية
المؤلفون: J. Verbeeck, S. Van Aert
المساهمون: The Pennsylvania State University CiteSeerX Archives
مصطلحات موضوعية: Key words, EELS, fitting, quantification, precision, maximum likelihood, model PACS, 79.20Uv, 82.80Pv, 06.20Dk, 43.50+y, 02.50-z, 07.05FB
وصف الملف: application/pdf