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1دورية أكاديمية
المؤلفون: M. Kopycinska, S. Hirsekorn, U. Rabe, W. Arnold
المصدر: Proceedings of the Asian Pacific Conference on Fracture and Strength and International Conference on Advanced Technology in Experimental Mechanics. 2001, :41
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2
المؤلفون: L. Batista, Ute Rabe, S. Hirsekorn, Gerd Dobmann, Iris Altpeter
المساهمون: Publica
المصدر: Journal of Magnetism and Magnetic Materials. 354:248-256
مصطلحات موضوعية: Materials science, Magnetic domain, Condensed matter physics, Barkhausen noise, Cementite, electron backscatter diffraction (EBSD), non-destructive testing, magnetic domains, Condensed Matter Physics, Magnetic hysteresis, Electronic, Optical and Magnetic Materials, Magnetic field, Magnetization, symbols.namesake, chemistry.chemical_compound, Nuclear magnetic resonance, Domain wall (magnetism), chemistry, symbols, steel, Magnetic force microscope, magnetic force microscopy (MFM), Barkhausen effect
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b753a699c213e6f26ed492d630a0e36Test
https://doi.org/10.1016/j.jmmm.2013.11.019Test -
3كتاب
المؤلفون: DELSANTO, PIER PAOLO, S. HIRSEKORN, M. HIRSEKORN
المساهمون: P.P. DELSANTO, Delsanto, PIER PAOLO, S., Hirsekorn, M., Hirsekorn
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9780387338606; ispartofbook:Universality of Nonclassical Nonlinearity; firstpage:231; lastpage:231; numberofpages:1; http://hdl.handle.net/11583/1866992Test
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4كتاب
المؤلفون: DELSANTO, PIER PAOLO, S. HIRSEKORN
المساهمون: P.P. DELSANTO, Delsanto, PIER PAOLO, S., Hirsekorn
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9780387338606; ispartofbook:Universality of Nonclassical Nonlinearity; firstpage:3; lastpage:3; numberofpages:1; http://hdl.handle.net/11583/1795950Test
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المؤلفون: Ute Rabe, T. B. Helfen, S. Hirsekorn, R. Sridaran Venkat, Christian Boller
المصدر: Applied Composite Materials. 19:913-919
مصطلحات موضوعية: Materials science, business.industry, Nondestructive testing, Ultrasonic testing, Ceramics and Composites, Automotive industry, Context (language use), Structural health monitoring, Composite material, business, Sizing, Beam (structure), Characterization (materials science)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::effd26f81052d8838a8339b78c55b579Test
https://doi.org/10.1007/s10443-012-9250-2Test -
6مؤتمر
المؤلفون: DELSANTO, PIER PAOLO, AGOSTINI, VALENTINA, S. Hirsekorn, R. Loparco, A. Koka
المساهمون: Delsanto, PIER PAOLO, S., Hirsekorn, Agostini, Valentina, R., Loparco, A., Koka
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000176648000105; ispartofbook:Titolo volume non avvalorato; Ultrasonics International 2001; volume:40 (1-8); firstpage:605; lastpage:610; numberofpages:6; journal:ULTRASONICS; http://hdl.handle.net/11583/1789542Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0036565959
الإتاحة: https://doi.org/10.1016/S0041-624XTest(02)00183-X
http://hdl.handle.net/11583/1789542Test -
7
المؤلفون: J Muñoz Saldaña, Gerold A. Schneider, Ute Rabe, Walter Arnold, S. Hirsekorn, M. Kopycinska
المساهمون: Publica
المصدر: Journal of Physics D: Applied Physics. 35:2621-2635
مصطلحات موضوعية: ultrasonic, Materials science, Acoustics and Ultrasonics, high resolution, Ultrasonic testing, Acoustic microscopy, Atomic force acoustic microscopy, Mineralogy, Ultraschall, Condensed Matter Physics, Piezoelectricity, Computer Science::Other, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, chemistry.chemical_compound, Piezoresponse force microscopy, chemistry, scanning force microscopy, Indentation, Microscopy, Barium titanate, piezoelectric, Composite material, piezoelektrische Keramik
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1dd5f458a81ec7548166d8b0db4c14a5Test
https://doi.org/10.1088/0022-3727/35/20/323Test -
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المؤلفون: Ute Rabe, Walter Arnold, Mathias Göken, M. Kempf, S. Amelio, S. Hirsekorn, M. Kopycinska
المصدر: Surface and Interface Analysis. 33:65-70
مصطلحات موضوعية: Kelvin probe force microscope, Cantilever, Materials science, business.industry, Analytical chemistry, Atomic force acoustic microscopy, Acoustic microscopy, Surfaces and Interfaces, General Chemistry, Conductive atomic force microscopy, Condensed Matter Physics, Surfaces, Coatings and Films, Piezoresponse force microscopy, Optics, Physics::Atomic and Molecular Clusters, Materials Chemistry, business, Contact area, Non-contact atomic force microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ea07d844fd9b133542476d8e2d46e9c6Test
https://doi.org/10.1002/sia.1163Test -
9
المؤلفون: L. Batista, S. Hirsekorn, Ute Rabe
المساهمون: Publica
المصدر: Ultramicroscopy. 146
مصطلحات موضوعية: precipitate, Materials science, Magnetic domain, Condensed matter physics, Cementite, electron backscatter diffraction (EBSD), microstructure, magnetic domains, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Crystallography, Magnetization, chemistry.chemical_compound, Electron diffraction, Ferromagnetism, chemistry, Lamellar structure, Magnetic force microscope, Instrumentation, magnetic force microscopy (MFM), magnetic easy axis, Electron backscatter diffraction
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eefdd2179f92141c27aea52c77dae885Test
https://pubmed.ncbi.nlm.nih.gov/24887154Test -
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المؤلفون: Ute Rabe, Walter Arnold, S. Hirsekorn
المساهمون: Publica
المصدر: Applied Physics A. 72:S87-S92
مصطلحات موضوعية: Kelvin probe force microscope, atomic force microscopy, Cantilever, Physics::Instrumentation and Detectors, Chemistry, business.industry, Acoustics, Atomic force acoustic microscopy, General Chemistry, Conductive atomic force microscopy, Scanning capacitance microscopy, dynamic mode, cantilever vibration, Computer Science::Other, Piezoresponse force microscopy, Optics, interaction forces, Physics::Atomic and Molecular Clusters, General Materials Science, ultrasonic radiation, Magnetic force microscope, business, Non-contact atomic force microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d1d06f3eaa4b98ea904ffa3d6d6ac7a7Test
https://doi.org/10.1007/s003390100730Test