المؤلفون: Čibiraitė-Lukenskienė, Dovilė, Ikamas, Kęstutis, Lisauskas, Tautvydas, Rysiavets, Anastasia, Krozer, Viktor, Roskos, Hartmut G., Lisauskas, Alvydas

المصدر: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), November 8-13, 2020, Buffalo, NY, USA . (Virtual conference)., Buffalo, NY : IEEE, 2021, p. 1-2 ; ISSN 2162-2027 ; ISBN 9781728166216 ; eISSN 2162-2035 ; eISBN 9781728166209

مصطلحات موضوعية: Temperature sensors, Sensitivity, Field effect transistors, Imaging, Lighting, Spatial resolution, Signal to noise ratio

العلاقة: http://lka.lvb.lt/LKA:ELABAPDB92442981&prefLang=en_USTest

الإتاحة: https://doi.org/10.1109/IRMMW-THz46771.2020.9370618Test
http://lka.lvb.lt/LKA:ELABAPDB92442981&prefLang=en_USTest

المؤلفون: Čibiraitė-Lukenskienė, Dovilė, Ikamas, Kęstutis, Lisauskas, Tautvydas, Rysiavets, Anastasia, Krozer, Viktor, Roskos, Hartmut G., Lisauskas, Alvydas

المصدر: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), November 8-13, 2020, Buffalo, NY, USA . (Virtual conference)., Buffalo, NY : IEEE, 2021, p. 1-2 ; ISSN 2162-2027 ; ISBN 9781728166216 ; eISSN 2162-2035 ; eISBN 9781728166209

مصطلحات موضوعية: Temperature sensors, Sensitivity, Field effect transistors, Imaging, Lighting, Spatial resolution, Signal to noise ratio

العلاقة: http://lka.lvb.lt/LKA:ELABAPDB92442981&prefLang=en_USTest

الإتاحة: https://doi.org/10.1109/IRMMW-THz46771.2020.9370618Test
http://lka.lvb.lt/LKA:ELABAPDB92442981&prefLang=en_USTest