المؤلفون: Cen, Yinjie, Aqad, Emad, Cui, Li, Coley, Suzanne M., Park, Jong Keun, Naab, Benjamin D., Rena, Rochelle, Paul, Tyler, Eckert, Sylvie, Wu, Chunyi, Finch, Michael, Behnke, Jason, Lee, ChoongBong, Petrillo, Karen E.

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XLI

الإتاحة: https://doi.org/10.1117/12.3010961Test

المؤلفون: Cen, Yinjie, Park, Jong Keun, Coley, Suzanne M., Naab, Benjamin D., Cui, Li, Aqad, Emad, Alexandrescu, Stefan, Rena, Rochelle, Eckert, Sylvie, Behnke, Jason, Lee, ChoongBong, Petrillo, Karen E.

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XLI

الإتاحة: https://doi.org/10.1117/12.3010931Test

المؤلفون: Rafael-Naab, Benjamin D., Park, Jong Keun, Aqad, Emad, Cen, Yinjie, Coley, Suzanne M., Cui, Li, Hoelzel, Conner, Lee, Choong Bong, Behnke, Jason, Rena, Rochelle, Eckert, Sylvie, Alexandrescu, Stefan, Sachinthani, Niradha, Finch, Michael, Petrillo, Karen E., Cheng, Li

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XLI

الإتاحة: https://doi.org/10.1117/12.3010493Test

المؤلفون: Coley, Suzanne, Park, Jong Keun, Aqad, Emad, Cen, Yinjie, Cui, Li, Hoelzel, Conner, Naab, Benjamin D., Melanson, Maria, Tran, Hung, Alexandrescu, Stefan, Rena, Rochelle, Behnke, Jason, Petrillo, Karen E.

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XLI

الإتاحة: https://doi.org/10.1117/12.3010919Test

المؤلفون: Guerrero, Douglas, Amblard, Gilles R., Cen, Yinjie, Park, Jong Keun, Coley, Suzanne M., Naab-Rafael, Benjamin D., Cui, Li, Aqad, Emad, Alexandrescu, Stefan, Rena, Rochelle, Eckert, Sylvie, Behnke, Jason, Lee, ChoongBong, Petrillo, Karen

المصدر: Proceedings of SPIE; April 2024, Vol. 12957 Issue: 1 p129570A-129570A-7, 1166138p

المؤلفون: Guerrero, Douglas, Amblard, Gilles R., Cen, Yinjie, Aqad, Emad, Cui, Li, Coley, Suzanne M., Park, Jong Keun, Naab-Rafael, Benjamin D., Rena, Rochelle, Paul, Tyler, Eckert, Sylvie, Wu, Chunyi, Finch, Mike, Behnke, Jason, Lee, ChoongBong, Petrillo, Karen

المصدر: Proceedings of SPIE; April 2024, Vol. 12957 Issue: 1 p129571Z-129571Z-8, 1166148p

المؤلفون: Guerrero, Douglas, Amblard, Gilles R., Rafael-Naab, Benjamin D., Park, Jong Keun, Aqad, Emad, Cen, Yinjie, Coley, Suzanne M., Cui, Li, Hoelzel, Conner, Lee, Choong Bong, Behnke, Jason, Rena, Rochelle, Eckert, Sylvie, Alexandrescu, Stefan, Sachinthani, K. A. Niradha, Finch, Michael, Petrillo, Karen, Cheng, Li

المصدر: Proceedings of SPIE; April 2024, Vol. 12957 Issue: 1 p129571S-129571S-9, 1166149p

المؤلفون: Hoelzel, Conner, Cui, Li, Naab, Benjamin D., Park, Jong Keun, Kang, Philjae, Hernandez, Kenneth, Coley, Suzanne M., Alexandrescu, Stefan, Rena, Rochelle, Cameron, James F., Aqad, Emad

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XL

الإتاحة: https://doi.org/10.1117/12.2658981Test

المؤلفون: Park, Jong Keun, Aqad, Emad, Cen, Yinjie, Coley, Suzanne, Cui, Li, Hoelzel, Conner, Naab, Benjamin, Lee, Choong Bong, Rena, Rochelle, Kang, Philjae, Shin, You Rim, Limberg, David, Zhang, Lei

المساهمون: Altamirano-Sánchez, Efrain, Mohanty, Nihar

المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XII

الإتاحة: https://doi.org/10.1117/12.2659178Test

المؤلفون: Cen, Yinjie, Lee, ChoongBong, Cui, Li, Coley, Suzanne M., Park, Jong Keun, Naab-Rafael, Benjamin D., Aqad, Emad, Rena, Rochelle, Paul, Tyler, Penniman, Thomas, Behnke, Jason, Early, Julia T., Foltz, Benjamin

المساهمون: Guerrero, Douglas, Amblard, Gilles R.

المصدر: Advances in Patterning Materials and Processes XL

الإتاحة: https://doi.org/10.1117/12.2659101Test