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1دورية أكاديمية
المؤلفون: Knauer, A., Kolbe, T., Hagedorn, S., Hoepfner, J., Guttmann, M., Cho, H.K., Rass, J., Ruschel, J., Einfeldt, S., Kneissl, M., Weyers, M.
مصطلحات موضوعية: ddc:530, Aluminum gallium nitride, Annealing, Gallium alloys, III-V semiconductors, Lattice mismatch, Light emitting diodes, Metallorganic vapor phase epitaxy, Quantum efficiency, Semiconductor alloys, Semiconductor quantum wells
وصف الملف: application/pdf
العلاقة: ESSN:1077-3118; https://oa.tib.eu/renate/handle/123456789/11373Test; http://dx.doi.org/10.34657/10407Test
الإتاحة: https://doi.org/10.34657/1040710.1063/5.0134253Test
https://oa.tib.eu/renate/handle/123456789/11373Test -
2دورية أكاديمية
المؤلفون: Piva F., Grigoletto M., Brescancin R., De Santi C., Buffolo M., Ruschel J., Glaab J., Hauer Vidal D., Guttmann M., Rass J., Einfeldt S., Susilo N., Wernicke T., Kneissl M., Meneghesso G., Zanoni E., Meneghini M.
المساهمون: Piva, F., Grigoletto, M., Brescancin, R., De Santi, C., Buffolo, M., Ruschel, J., Glaab, J., Hauer Vidal, D., Guttmann, M., Rass, J., Einfeldt, S., Susilo, N., Wernicke, T., Kneissl, M., Meneghesso, G., Zanoni, E., Meneghini, M.
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000973333200008; volume:122; issue:15; firstpage:151108; journal:APPLIED PHYSICS LETTERS; https://hdl.handle.net/11577/3477947Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85152953302; https://pubs.aip.org/aip/apl/article/122/15/151108/2878603/Impact-of-Mg-doping-on-the-performance-andTest
الإتاحة: https://doi.org/10.1063/5.0142054Test
https://hdl.handle.net/11577/3477947Test
https://pubs.aip.org/aip/apl/article/122/15/151108/2878603/Impact-of-Mg-doping-on-the-performance-andTest -
3دورية أكاديمية
المؤلفون: Cho, H.K., Kang, J.H., Sulmoni, L., Kunkel, K., Rass, J., Susilo, N., Wernicke, T., Einfeldt, S., Kneissl, M.
مصطلحات موضوعية: ddc:530, high Almole fraction n-AlGaN, light emitting diode, low resistance n-contact, ohmic contact, operating voltage, plasma etch
وصف الملف: application/pdf
العلاقة: ESSN:1361-6641; https://oa.tib.eu/renate/handle/123456789/6506Test; https://doi.org/10.34657/5553Test
الإتاحة: https://doi.org/10.34657/555310.1088/1361-6641/ab9ea7Test
https://oa.tib.eu/renate/handle/123456789/6506Test -
4مؤتمر
المؤلفون: Kneissl, M., Cardinali, G., Enslin, J., Guttmann, M., Kuhn, C., Mehnke, F., Schilling, M., Sulmoni, L., Susilo, N., Wernicke, T., Cho, H.K., Glaab, J., Ruschel, J., Hagedorn, S., Lobo-Ploch, N., Netzel, C., Rass, J., Walde, S., Winterwerber, U., Einfeldt, S., Weyers, M.
المصدر: 2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
الإتاحة: https://doi.org/10.1109/cleo/europe-eqec52157.2021.9541976Test
http://xplorestaging.ieee.org/ielx7/9541543/9541265/09541976.pdf?arnumber=9541976Test -
5دورية أكاديمية
المؤلفون: Ruschel, J., Glaab, J., Brendel, M., Rass, J., Stölmacker, C., Lobo-Ploch, N., Kolbe, T., Wernicke, T., Mehnke, F., Enslin, J., Einfeldt, S., Weyers, M., Kneissl, M.
المصدر: Journal of Applied Physics; 2018, Vol. 124 Issue 8, pN.PAG-N.PAG, 7p, 1 Diagram, 11 Graphs
مصطلحات موضوعية: LIGHT emitting diodes, ELECTRO-optical effects, MAGNETIC control, ELECTROLUMINESCENT devices, ELECTRIC field effects
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6مؤتمر
المؤلفون: Monti, D., Meneghini, M., De Santi, C., DA RUOS, SILVIA, Meneghesso, G., Zanoni, E., Glaab, J., Rass, J., Einfeldt, S., Mehnke, F., Enslin, J., Wernicke, T., Kneissl, M.
المساهمون: Monti, D., Krames, Michael R., Meneghini, M., De Santi, C., DA RUOS, Silvia, Meneghesso, G., Zanoni, E., Glaab, J., Rass, J., Einfeldt, S., Mehnke, F., Enslin, J., Wernicke, T., Kneissl, M.
مصطلحات موضوعية: AlGaN, defect migration, degradation, light-emitting diode, UV-B, Electronic, Optical and Magnetic Material, Condensed Matter Physic, Applied Mathematic, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9781510615939; info:eu-repo/semantics/altIdentifier/wos/WOS:000452797000005; ispartofbook:Proceedings of SPIE - The International Society for Optical Engineering; Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXII 2018; volume:10554; firstpage:35; journal:PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; alleditors:Krames, Michael R.; http://hdl.handle.net/11577/3276913Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85047836736; http://spie.org/x1848.xmlTest
الإتاحة: https://doi.org/10.1117/12.2292202Test
http://hdl.handle.net/11577/3276913Test
http://spie.org/x1848.xmlTest -
7دورية أكاديمية
المؤلفون: Monti D., De Santi C., DA RUOS, SARA, PIVA, FRANCESCO, Glaab J., Rass J., Einfeldt S., Mehnke F., Enslin J., Wernicke T., Kneissl M., Meneghesso G., Zanoni E., Meneghini M.
المساهمون: Monti, D., De Santi, C., DA RUOS, Sara, Piva, Francesco, Glaab, J., Rass, J., Einfeldt, S., Mehnke, F., Enslin, J., Wernicke, T., Kneissl, M., Meneghesso, G., Zanoni, E., Meneghini, M.
مصطلحات موضوعية: AlGaN, degradation, diffusion processe, light-emitting diodes (LEDs), ultraviolet (UV) sources
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000477697400022; volume:66; issue:8; firstpage:3387; lastpage:3392; numberofpages:6; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; http://hdl.handle.net/11577/3309206Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85069899059; https://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=16Test
الإتاحة: https://doi.org/10.1109/TED.2019.2920521Test
http://hdl.handle.net/11577/3309206Test
https://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=16Test -
8دورية أكاديمية
المؤلفون: Glaab, J., Ruschel, J., Kolbe, T., Knauer, A., Rass, J., Cho, H. K., Lobo Ploch, N., Kreutzmann, S., Einfeldt, S., Weyers, M., Kneissl, M.
المساهمون: Bundesministerium für Bildung und Forschung, Deutsche Forschungsgemeinschaft
المصدر: IEEE Photonics Technology Letters ; volume 31, issue 7, page 529-532 ; ISSN 1041-1135 1941-0174
الإتاحة: https://doi.org/10.1109/lpt.2019.2900156Test
http://xplorestaging.ieee.org/ielx7/68/8672146/08643839.pdf?arnumber=8643839Test -
9دورية أكاديمية
المؤلفون: Stolmacker, C., Knigge, S., Einfeldt, S., Ploch, N. Lobo, Thies, A., Hochheim, S., Rass, J., Schnieder, F., Mogilatenko, A., Ruschel, J., Kolbe, T.
المساهمون: Bundesministerium für Bildung und Forschung
المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology ; volume 9, issue 12, page 2326-2331 ; ISSN 2156-3950 2156-3985
مصطلحات موضوعية: Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1109/tcpmt.2019.2949089Test
http://xplorestaging.ieee.org/ielx7/5503870/8915864/08880622.pdf?arnumber=8880622Test -
10دورية أكاديمية
المؤلفون: Cho, H K, Krüger, O, Külberg, A, Rass, J, Zeimer, U, Kolbe, T, Knauer, A, Einfeldt, S, Weyers, M, Kneissl, M
المصدر: Semiconductor Science and Technology ; volume 32, issue 12, page 12LT01 ; ISSN 0268-1242 1361-6641
الإتاحة: https://doi.org/10.1088/1361-6641/aa9402Test
http://stacks.iop.org/0268-1242/32/i=12/a=12LT01?key=crossref.8ec8c21973456849df63f4c8da88ecc9Test
http://stacks.iop.org/0268-1242/32/i=12/a=12LT01/pdfTest
